NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
    61.
    发明申请
    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME 失效
    非易失性半导体存储器件及其制造方法

    公开(公告)号:US20100200906A1

    公开(公告)日:2010-08-12

    申请号:US12696544

    申请日:2010-01-29

    IPC分类号: H01L27/112 H01L21/8246

    摘要: A nonvolatile semiconductor memory device includes: a semiconductor substrate; a multilayer structure; a semiconductor pillar; a third insulating film; and a fourth insulating film layer. The a multilayer structure is provided on the semiconductor substrate and including a plurality of constituent multilayer bodies stacked in a first direction perpendicular to a major surface of the semiconductor substrate. Each of the plurality of constituent multilayer bodies includes an electrode film provided parallel to the major surface, a first insulating film, a charge storage layer provided between the electrode film and the first insulating film, and a second insulating film provided between the charge storage layer and the electrode film. The semiconductor pillar penetrates through the multilayer structure in the first direction. The third insulating film is provided between the semiconductor pillar and the electrode film. The fourth insulating film is provided between the semiconductor pillar and the charge storage layer.

    摘要翻译: 非易失性半导体存储器件包括:半导体衬底; 多层结构; 半导体柱; 第三绝缘膜; 和第四绝缘膜层。 多层结构设置在半导体衬底上,并且包括沿垂直于半导体衬底的主表面的第一方向堆叠的多个构成层叠体。 多个构成多层体中的每一个包括平行于主表面设置的电极膜,第一绝缘膜,设置在电极膜和第一绝缘膜之间的电荷存储层,以及设置在电荷存储层 电极膜。 半导体柱沿第一方向穿透多层结构。 第三绝缘膜设置在半导体柱和电极膜之间。 第四绝缘膜设置在半导体柱和电荷存储层之间。

    Nonvolatile semiconductor memory device and method of manufacturing the same
    64.
    发明授权
    Nonvolatile semiconductor memory device and method of manufacturing the same 有权
    非易失性半导体存储器件及其制造方法

    公开(公告)号:US08334561B2

    公开(公告)日:2012-12-18

    申请号:US12709702

    申请日:2010-02-22

    IPC分类号: H01L29/72

    摘要: A memory string comprises: a first semiconductor layer having a plurality of columnar portions extending in a perpendicular direction with respect to a substrate, and joining portions joining lower ends of the plurality of columnar portions; a charge storage layer surrounding a side surface of the first semiconductor layer; and a first conductive layer surrounding a side surface of the charge storage layer and functioning as a control electrode of memory cells. A select transistor comprises: a second semiconductor layer extending upwardly from an upper surface of the columnar portions; an insulating layer surrounding a side surface of the second semiconductor layer; a second conductive layer surrounding a side surface of the insulating layer and functioning as a control electrode of the select transistors; and a third semiconductor layer formed on an upper surface of the second semiconductor layer and including silicon germanium.

    摘要翻译: 存储器串包括:第一半导体层,具有相对于衬底在垂直方向上延伸的多个柱状部分,以及连接多个柱状部分的下端的接合部分; 围绕所述第一半导体层的侧表面的电荷存储层; 以及围绕电荷存储层的侧表面并用作存储单元的控制电极的第一导电层。 选择晶体管包括:从柱状部分的上表面向上延伸的第二半导体层; 围绕所述第二半导体层的侧表面的绝缘层; 围绕所述绝缘层的侧表面并用作所述选择晶体管的控制电极的第二导电层; 以及形成在所述第二半导体层的上表面上并且包括硅锗的第三半导体层。

    Nonvolatile semiconductor memory device and method for manufacturing the same
    65.
    发明授权
    Nonvolatile semiconductor memory device and method for manufacturing the same 有权
    非易失性半导体存储器件及其制造方法

    公开(公告)号:US08274108B2

    公开(公告)日:2012-09-25

    申请号:US12705231

    申请日:2010-02-12

    IPC分类号: H01L29/788 H01L21/336

    摘要: A nonvolatile semiconductor memory device, includes: a stacked body including a plurality of insulating films alternately stacked with a plurality of electrode films, the electrode films being divided to form a plurality of control gate electrodes aligned in a first direction; a plurality of semiconductor pillars aligned in a stacking direction of the stacked body, the semiconductor pillars being arranged in a matrix configuration along the first direction and a second direction intersecting the first direction to pierce the control gate electrodes; and a connection member connecting a lower end portion of one of the semiconductor pillars to a lower end portion of one other of the semiconductor pillars, an upper end portion of the one of the semiconductor pillars being connected to a source line, an upper end portion of the one other of the semiconductor pillars being connected to a bit line. At least some of the control gate electrodes are pierced by two of the semiconductor pillars adjacent to each other in the second direction. Two of the semiconductor pillars being connected to each other by the connection member pierce mutually different control gate electrodes.

    摘要翻译: 一种非易失性半导体存储器件,包括:堆叠体,包括交替层叠有多个电极膜的多个绝缘膜,所述电极膜被分割以形成沿第一方向排列的多个控制栅电极; 多个半导体柱沿堆叠体的堆叠方向排列,半导体柱沿着第一方向以矩阵构造排列,第二方向与第一方向相交以刺穿控制栅电极; 以及将所述半导体柱之一的下端部连接到所述半导体柱的另一个的下端部的连接部件,所述一个半导体柱的上端部与源极线连接,上端部 另一个半导体柱被连接到位线。 至少一些控制栅极电极在第二方向上被彼此相邻的两个半导体柱刺穿。 通过连接构件彼此连接的两个半导体柱穿透彼此不同的控制栅电极。

    Nonvolatile semiconductor memory device and method for manufacturing same
    68.
    发明授权
    Nonvolatile semiconductor memory device and method for manufacturing same 有权
    非易失性半导体存储器件及其制造方法

    公开(公告)号:US07982261B2

    公开(公告)日:2011-07-19

    申请号:US12563832

    申请日:2009-09-21

    IPC分类号: H01L29/792

    摘要: A nonvolatile semiconductor memory device includes a first stacked body on a silicon substrate, and a second stacked body is provided thereon. The first stacked body includes a plurality of insulating films alternately stacked with a plurality of electrode films, and a first portion of a through-hole extending in a stacking direction is formed. The second stacked body includes a plurality of insulating films alternately stacked with a plurality of electrode films, and a second portion of the through-hole is formed. A memory film is formed on an inner face of the through-hole, and a silicon pillar is buried in an interior of the through-hole. A central axis of the second portion of the through-hole is shifted from a central axis of the first portion, and a lower end of the second portion is positioned lower than an upper portion of the first portion.

    摘要翻译: 非易失性半导体存储器件包括在硅衬底上的第一层叠体,并且在其上设置第二层叠体。 第一堆叠体包括交替层叠有多个电极膜的多个绝缘膜,并且形成沿堆叠方向延伸的通孔的第一部分。 第二堆叠体包括交替层叠有多个电极膜的多个绝缘膜,并且形成通孔的第二部分。 在通孔的内表面上形成记忆膜,并且将硅柱埋在通孔的内部。 通孔的第二部分的中心轴线从第一部分的中心轴线偏移,并且第二部分的下端位于比第一部分的上部更低的位置。

    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
    70.
    发明申请
    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME 有权
    非易失性半导体存储器件及其制造方法

    公开(公告)号:US20100207190A1

    公开(公告)日:2010-08-19

    申请号:US12705231

    申请日:2010-02-12

    IPC分类号: H01L29/788 H01L21/336

    摘要: A nonvolatile semiconductor memory device, includes: a stacked body including a plurality of insulating films alternately stacked with a plurality of electrode films, the electrode films being divided to form a plurality of control gate electrodes aligned in a first direction; a plurality of semiconductor pillars aligned in a stacking direction of the stacked body, the semiconductor pillars being arranged in a matrix configuration along the first direction and a second direction intersecting the first direction to pierce the control gate electrodes; and a connection member connecting a lower end portion of one of the semiconductor pillars to a lower end portion of one other of the semiconductor pillars, an upper end portion of the one of the semiconductor pillars being connected to a source line, an upper end portion of the one other of the semiconductor pillars being connected to a bit line. At least some of the control gate electrodes are pierced by two of the semiconductor pillars adjacent to each other in the second direction. Two of the semiconductor pillars being connected to each other by the connection member pierce mutually different control gate electrodes.

    摘要翻译: 一种非易失性半导体存储器件,包括:堆叠体,包括交替层叠有多个电极膜的多个绝缘膜,所述电极膜被分割以形成沿第一方向排列的多个控制栅电极; 多个半导体柱沿层叠体的堆叠方向排列,半导体柱沿着第一方向排列成矩阵构造,第二方向与第一方向相交以刺穿控制栅电极; 以及将所述半导体柱之一的下端部连接到所述半导体柱的另一个的下端部的连接部件,所述一个半导体柱的上端部与源极线连接,上端部 另一个半导体柱被连接到位线。 至少一些控制栅极电极在第二方向上被彼此相邻的两个半导体柱刺穿。 通过连接构件彼此连接的两个半导体柱穿透相互不同的控制栅电极。