Communication network data manager system
    61.
    发明授权
    Communication network data manager system 失效
    通信网络数据管理系统

    公开(公告)号:US5146561A

    公开(公告)日:1992-09-08

    申请号:US203874

    申请日:1988-06-02

    IPC分类号: H04L29/00 H04L29/06

    摘要: The communication network data manager system according to the invention provides remotely located host processors with the capability of moving sequential datasets, partitioned datasets, or members of partitioned datasets between them. Data is read directly from the source dataset, which may be on a tape or disk, and is written directly to the target dataset which also may be on a tape or disk. No intermediate storage is required for queuing or spooling the data being transferred. A data transfer request may be entered by the user through a user console operating under a menu driven display format. Alternatively, the data set transfer request may be generated by continuously running job applications through a batch interface.

    摘要翻译: 根据本发明的通信网络数据管理系统为远程位置的主机处理器提供移动顺序数据集,分区数据集或它们之间的分区数据集成员的能力。 数据直接从源数据集中读取,数据集可能位于磁带或磁盘上,并直接写入目标数据集,也可能在磁带或磁盘上。 不需要中间存储来排队或假脱机正在传输的数据。 数据传输请求可以由用户通过在菜单驱动显示格式下操作的用户控制台输入。 或者,数据集传送请求可以通过批处理接口连续运行作业应用来生成。

    Integrated circuit chips, apparatuses for obtaining backscatter data from samples, methods of backscatter analysis, and methods of forming alpha particle emission and detection systems
    62.
    发明授权
    Integrated circuit chips, apparatuses for obtaining backscatter data from samples, methods of backscatter analysis, and methods of forming alpha particle emission and detection systems 失效
    集成电路芯片,用于从样本获得反向散射数据的装置,反向散射分析的方法和形成α粒子发射和检测系统的方法

    公开(公告)号:US07557345B2

    公开(公告)日:2009-07-07

    申请号:US11787852

    申请日:2007-04-18

    IPC分类号: G01N23/00

    CPC分类号: H01L31/115

    摘要: Some embodiments include methods for fabricating an alpha particle emitter and detector associated with an integrated circuit chip. Some embodiments include an integrated circuit chip comprising an alpha particle emitter and detector supported by a semiconductor substrate. Some embodiments include an apparatus for obtaining backscatter data from a sample utilizing an alpha particle emission and detection system supported by a semiconductor substrate. Some embodiments include methods of backscatter analysis utilizing a semiconductor substrate containing an alpha particle emitter and an alpha particle sensor.

    摘要翻译: 一些实施例包括用于制造与集成电路芯片相关联的α粒子发射器和检测器的方法。 一些实施例包括集成电路芯片,其包括由半导体衬底支撑的α粒子发射器和检测器。 一些实施例包括用于利用由半导体衬底支持的α粒子发射和检测系统从样本获得反向散射数据的装置。 一些实施例包括使用含有α粒子发射器和α粒子传感器的半导体衬底的后向散射分析的方法。

    MDA-9 and uses thereof
    63.
    发明授权
    MDA-9 and uses thereof 失效
    MDA-9及其用途

    公开(公告)号:US06866993B1

    公开(公告)日:2005-03-15

    申请号:US09531369

    申请日:2000-03-21

    申请人: Mark Williamson

    发明人: Mark Williamson

    摘要: Increased expression of MDA-9 is associated with drug resistance of certain cells (e.g., cancer cells). The invention provides methods for identifying drug resistant cells by measuring the expression or activity of MDA-9, methods for identifying modulators of drug resistance, and methods for modulating drug resistance by modulating the expression or activity of MDA-9.

    摘要翻译: MDA-9的增加的表达与某些细胞(例如癌细胞)的耐药性相关。 本发明提供了通过测量MD​​A-9的表达或活性,鉴定药物抗性调节剂的方法和通过调节MDA-9的表达或活性来调节药物抗性的方法来鉴定耐药性细胞的方法。

    Chk1 and uses thereof
    65.
    发明授权
    Chk1 and uses thereof 失效
    Chk1及其用途

    公开(公告)号:US06723498B1

    公开(公告)日:2004-04-20

    申请号:US09340264

    申请日:1999-06-30

    IPC分类号: C12Q100

    摘要: Increased expression of Chk1 is associated with drug resistance of certain cells (e.g., cancer cells). The invention provides methods for identifying drug resistant cells by measuring the expression or activity of Chk1, methods for identifying modulators of drug resistance, and methods for modulating drug resistance by modulating the expression or activity of Chk1.

    摘要翻译: Chk1的增加的表达与某些细胞(例如癌细胞)的耐药性相关。 本发明提供了通过测量Chk1的表达或活性,鉴定药物抗性调节剂的方法和通过调节Chk1的表达或活性来调节药物抗性的方法来鉴定耐药性细胞的方法。

    Flange assembly
    66.
    发明授权
    Flange assembly 有权
    法兰组装

    公开(公告)号:US09366369B2

    公开(公告)日:2016-06-14

    申请号:US13683728

    申请日:2012-11-21

    申请人: Mark Williamson

    发明人: Mark Williamson

    IPC分类号: F16L23/18 F16L23/16

    摘要: A flange assembly (10 comprising a flange (12) in the form of a disk shaped rim formed on a pipe section (14) for connection to a hose or pipe. The pipe section (14) defines a hollow bore (16) through which flowable material may flow and the flange (12) defines a contact face (18) for engagement, in use, with an opposing flange. The flange (12) defines a gasket seat (20) about an opening of the bore (16) to receive a gasket (22) and the flange assembly (10) further includes a gasket clamp (24a,24b) to releasably retain the gasket (22) in position on the gasket seat (20).

    摘要翻译: 一种凸缘组件(10),其包括形成在管段(14)上的盘形边缘形式的凸缘(12),用于连接到软管或管道。管段(14)限定一个中空孔(16) 可流动的材料可以流动并且凸缘(12)限定接触面(18),用于在使用中与相对的凸缘接合。凸缘(12)围绕孔(16)的开口限定密封垫座(20) 接收垫圈(22)并且所述凸缘组件(10)还包括垫圈夹具(24a,24b),以将垫圈(22)可释放地保持在垫圈座(20)上的适当位置。

    Integrated circuit chips, apparatuses for obtaining backscatter data from samples, methods of backscatter analysis, and methods of forming alpha particle emission and detection systems
    70.
    发明申请
    Integrated circuit chips, apparatuses for obtaining backscatter data from samples, methods of backscatter analysis, and methods of forming alpha particle emission and detection systems 失效
    集成电路芯片,用于从样本获得反向散射数据的装置,反向散射分析的方法和形成α粒子发射和检测系统的方法

    公开(公告)号:US20080258057A1

    公开(公告)日:2008-10-23

    申请号:US11787852

    申请日:2007-04-18

    IPC分类号: G01T1/24 H01L21/00 H01L31/115

    CPC分类号: H01L31/115

    摘要: Some embodiments include methods for fabricating an alpha particle emitter and detector associated with an integrated circuit chip. Some embodiments include an integrated circuit chip comprising an alpha particle emitter and detector supported by a semiconductor substrate. Some embodiments include an apparatus for obtaining backscatter data from a sample utilizing an alpha particle emission and detection system supported by a semiconductor substrate. Some embodiments include methods of backscatter analysis utilizing a semiconductor substrate containing an alpha particle emitter and an alpha particle sensor.

    摘要翻译: 一些实施例包括用于制造与集成电路芯片相关联的α粒子发射器和检测器的方法。 一些实施例包括集成电路芯片,其包括由半导体衬底支撑的α粒子发射器和检测器。 一些实施例包括用于利用由半导体衬底支持的α粒子发射和检测系统从样本获得反向散射数据的装置。 一些实施例包括使用含有α粒子发射器和α粒子传感器的半导体衬底的后向散射分析的方法。