Abstract:
Methods and apparatus for increasing the quality of digital images produced by systems using uncorrected lenses where in-focus elements in the image space of the lens are detected and recorded as directed by data in a lookup table that specifies where light from addresses in the lens specimen plane come to focus in the lens image space.
Abstract:
On a charged-particle optical system for achieving optimum aberration correction and obtaining a minimum probe diameter, the optical system focuses a beam of charged particles onto a surface of a specimen, and has four stages of multipole elements arranged along the optical axis of the beam, power supplies capable of supplying five or more independent octopole electric or magnetic potentials, and a control portion for correcting third-order aperture aberrations by adjusting the five or more independent octopole electric or magnetic potentials independently. The power supplies apply normal octopole electric or magnetic potentials to at least three of the four stages of multipole elements independently and apply skew octopole electric or magnetic potentials to at least two of the multipole elements independently.
Abstract:
The invention is based on a handheld device, in particular a locating device, having a housing (10), which is movable with a handle unit (12) over a surface of an item being examined and which has a sensor unit (16) for picking up a first motion parameter. It is proposed that at least one second motion parameter can be detected with the sensor unit (16).
Abstract:
An image analysis device 1 is equipped with the photoreceptive means 11 that optically acquires diffraction pattern A that appears on the fluorescent screen 24 in order to obtain the diffraction pattern resulting from reflection high-energy electron diffraction, and the halation-prevention filter 12 provided so as to transmit the visible light emitted from the diffraction pattern A of the fluorescent screen 24, along the light path connecting the photoreceptive means 11 and the fluorescent screen 24. Also, the filter 12 is varied so that the transmittance of the visible light transmitted through the filter 12 is minimum at the filter center and increases with the distance from the center.
Abstract:
A confocal probe emits a scanning beam to a target and receives light returned therefrom to obtain an image thereof. The confocal probe has a chamber accommodating an optical system. The optical system includes an optical fiber through which a light beam is introduced to the optical system, a converging lens that converges the light beam introduced by the optical fiber, an optical element having a light incident surface, a first surface and a light emerging surface which statically define an optical path of the light beam, and a deflecting device mounted on the first surface of the optical element. The light beam enters the optical element through the light incident surface, enters the deflecting device through the first surface, and is dynamically deflected by the deflecting device. The deflected beam is output through the light emerging surface, as the scanning beam, toward the target.
Abstract:
An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source 116; reflection means 140; light detection means 124; press means 128, 130 pressing a probe tip against said reflection means; storage means 142; calculation means 144 figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means 126 controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.
Abstract:
An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source 116; reflection means 140; light detection means 124; press means 128, 130 pressing a probe tip against said reflection means; storage means 142; calculation means 144 figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means 126 controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.
Abstract:
A flexible shaft driven to rotate is inserted through a transparent sheath having pliability. By a fiber inserted through the inside thereof, low-coherence light is guided and is made to exit to a living-body tissue side which is an observation target through a lens and a prism forming an exit and entrance portion at the tip portion. Subsequently, the light reflected on the living-body tissue side is guided in order to produce an image. In that case, a positioning member for keeping the exit and entrance portion and the living-body tissue at a proper distance is formed at the tip portion of the sheath or the tip portion of an endoscope through which an optical probe is inserted and, therefore, a stable tomogram image can be produced.
Abstract:
A scanning probe microscope uses two different scanners (also called nullscanning stagesnull) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called nullx-y scannernull) scans a sample in a plane (also called nullx-y planenull), while the other scanner (called nullz scannernull) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called nullz directionnull) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.
Abstract:
The present invention discloses a light source (10) for the illumination of microscopic specimens. The invention also discloses a scanning microscope system that possesses a light source (10). The light source (10) emits a combined light beam that is emitted by a first laser (4) and a second laser (6). In the combined light beam, the light of the first laser (4) is synchronized with the light of the second laser (6).