METHOD AND SYSTEM FOR DETECTING INFESTATION IN AGRICULTURAL PRODUCTS

    公开(公告)号:US20220222798A1

    公开(公告)日:2022-07-14

    申请号:US17186252

    申请日:2021-02-26

    申请人: Wipro Limited

    摘要: System and method of detecting infestation in agricultural products is disclosed. In one embodiment, an infestation detection system captures hyperspectral imaging data and depth imaging data for a plurality of points on an agricultural product upon directing a light source at the agricultural product. The system analyses the captured imaging data to derive morphological details as well as spectral signatures for complete 360° view of the plurality of points on the agricultural product. In an embodiment, the spectral signatures may be corrected for one or more pixels associated with the plurality of points in the agricultural product by integrating the hyperspectral imaging data with the depth imaging data. The system further classifies one or more regions of the agricultural product based on matching of spectral signatures for the one or more pixels with pre-defined spectral signatures stored for a plurality of agricultural products, and accordingly detect infestation.

    Pulse chain-driven infrared imaging assembly

    公开(公告)号:US11350022B2

    公开(公告)日:2022-05-31

    申请号:US16999401

    申请日:2020-08-21

    申请人: Lumileds LLC

    摘要: The invention describes an infrared imaging assembly (1) for capturing an infrared image (M0, M1) of a scene (S), comprising an infrared-sensitive image sensor (14); an irradiator (10) comprising an array of individually addressable infrared-emitting LEDs, wherein each infrared-emitting LED is arranged to illuminate a scene region (S1, . . . , S9); a driver (11) configured to actuate the infrared irradiator (10) by applying a switching pulse train (T1, . . . , T9) to each infrared-emitting LED; an image analysis module (13) configured to analyse a preliminary infrared image (M0) to determine the required exposure levels (130) for each of a plurality of image regions (R1, . . . , R9); and a pulse train adjusting unit (12) configured to adjust the duration (L1, . . . , L9) of a switching pulse train (T1, . . . , T9) according to the required exposure levels (130). The invention also described a method of generating a depth map (D) for a scene (S); a depth map generator comprising an embodiment of the inventive infrared imaging assembly (1); and a camera comprising such a depth map generator (2).

    DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING PICOSECOND ULTRASONICS

    公开(公告)号:US20220113129A1

    公开(公告)日:2022-04-14

    申请号:US17068693

    申请日:2020-10-12

    发明人: Ori GOLANI Ido ALMOG

    IPC分类号: G01B11/22 G01B11/06

    摘要: Disclosed herein is a method for depth-profiling of samples including a target region including a lateral structural feature. The method includes obtaining measured signals of the sample and analyzing thereof to obtain a depth-dependence of at least one parameter characterizing the lateral structural feature. The measured signals are obtained by repeatedly: projecting a pump pulse on the sample, thereby producing an acoustic pulse propagating within the target region; Brillouin-scattering a probe pulse off the acoustic pulse within the target region; and detecting a scattered component of the probe pulse to obtain a measured signal. In each repetition the respective probe pulse is scattered off the acoustic pulse at a respective depth within the target region, thereby probing the target region at a plurality of depths. A wavelength of the pump pulse is at least about two times greater than a lateral extent of the lateral structural feature