Multi-Tier Memory Architecture
    72.
    发明申请

    公开(公告)号:US20220343970A1

    公开(公告)日:2022-10-27

    申请号:US17238683

    申请日:2021-04-23

    Applicant: Arm Limited

    Abstract: Various implementations described herein are directed to a device having a multi-tiered memory structure with a first tier and a second tier arranged vertically in a stacked configuration. The device may have multiple transistors disposed in the multi-tiered memory structure with first transistors disposed in the first tier and second transistors disposed in the second tier. The device may have a single interconnect that vertically couples the first transistors in the first tier to the second transistors in the second tier.

    MEMORY EMBEDDED FULL SCAN FOR LATENT DEFECTS

    公开(公告)号:US20220074988A1

    公开(公告)日:2022-03-10

    申请号:US17013628

    申请日:2020-09-06

    Applicant: Arm Limited

    Abstract: A memory circuit includes input multiplexers passing one of a pair of input bits. A first input multiplexer receives a first data bit and a serial input bit. Additional input multiplexers receive either a respective pair of data (D) bits, or a write-enable (WEN) bit and a single D bit. Scan latches receive one of the input bits and provide a scan output bit. OR gates arranged receive the scan output bit from a different scan latch, and perform a logical OR operation thereon to generate an OR output bit. Downstream output multiplexers pass a corresponding bit from a bit array or the OR output bit from a corresponding OR gate, and sense latches receive the corresponding bit from one of the output multiplexers and provide a sense output bit. Each sense output bit feeds into one or more input multiplexers when a bit-write-mask function is disabled.

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