公开(公告)号：US07733101B2

公开(公告)日：2010-06-08

申请号：US11450977

申请日：2006-06-09

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/32

CPC classification number: G01R1/07357 ,  G01R1/06716 ,  G01R1/06733

Abstract: Improved probing is provided using a knee probe where the knee curves away from the probe axis and then curves back to connect to the probe tip, crossing the probe axis on the way to the tip. The resulting lateral offset between the probe tip and the probe axis is a key geometrical parameter for predetermining the scrub motion provided by the probe in response to a predetermined contact force. The scrub motion preferably includes both a sliding motion and a rocking motion, where the sliding motion acts to clean the contact pad and the rocking motion acts to bring a clean part of the probe tip into contact with the freshly cleaned part of the contact pad. In preferred embodiments, the probe tip can include one or more relatively narrow “skates” for making contact to the contact pad. A dual skate configuration is especially appropriate when small dimples are at the centers of the contact pads.

Abstract translation: 使用膝关节探针提供改进的探测，其中膝盖弯曲远离探针轴线，然后弯曲回来连接到探针尖端，在穿过尖端的路上穿过探针轴。 在探针尖端和探针轴线之间产生的横向偏移是用于预测由探针响应于预定接触力提供的擦洗运动的关键几何参数。 擦洗运动优选地包括滑动运动和摇摆运动，其中滑动运动用于清洁接触垫，并且摇摆运动用于使探针尖端的清洁部分与接触垫的新鲜清洁的部分接触。 在优选实施例中，探针尖端可以包括用于与接触垫接触的一个或多个相对较窄的“溜冰鞋”。 当小凹坑位于接触垫的中心时，双滑冰配置是特别合适的。

公开(公告)号：US20100109691A1

公开(公告)日：2010-05-06

申请号：US12684272

申请日：2010-01-08

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/06

CPC classification number: G01R1/06733

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract translation: 提供垂直折叠的探针，其可以在探针高度受限的情况下提供改善的擦洗性能。 更具体地，这种探针包括基部和尖端，以及从基部到尖端作为单个连续部件延伸的臂。 探针臂垂直折叠，使得其包括三个或更多个垂直臂部分。 垂直臂部具有相当大的垂直重叠，并且彼此横向移位。 当这种探针垂直向下放置在被测设备上时，探头变形。 在探针变形期间，至少两个垂直臂部彼此接触。 臂部之间的这种接触可以有利地增加探针尖端处的横向擦洗运动，并且还可以有利地减小探针电感。

公开(公告)号：US07671610B2

公开(公告)日：2010-03-02

申请号：US11975743

申请日：2007-10-19

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07314 ,  G01R1/0675 ,  G01R1/06755 ,  G01R1/07357

Abstract: Improved probing of closely spaced contact pads is provided by an array of guided vertical probes that has a sideways scrub relative to the line of contact pads. With this orientation of scrub motion, the probes can be relatively thin along the contact line, and relatively thick perpendicular to the contact line. The thin dimension of the probes allows for probing closely spaced contact pads, while the thick dimension of the probes provides mechanical robustness and current carrying capacity. The probes have a predetermined curvature in a plane including the contact line, to help determine the amount of scrub motion during contact. In a preferred embodiment, an array of probes is provided for probing two closely spaced and parallel rows of contact pads, offset from each other by half the contact pad pitch.

Abstract translation: 紧密间隔的接触垫的改进的探测由相对于接触焊盘的侧面擦洗的引导垂直探针阵列提供。 随着洗涤运动的这种取向，探针可以沿着接触线相对较薄，并且垂直于接触线相对较厚。 探头的薄尺寸允许探测紧密间隔的接触垫，而探头的厚度尺寸提供机械坚固性和载流能力。 探针在包括接触线的平面中具有预定曲率，以帮助确定接触期间擦洗运动的量。 在优选实施例中，提供探针阵列用于探测两个紧密间隔并平行的接触垫排，彼此偏移接触垫间距的一半。

公开(公告)号：US07649367B2

公开(公告)日：2010-01-19

申请号：US11635809

申请日：2006-12-06

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/06

CPC classification number: G01R1/06733

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract translation: 提供垂直折叠的探针，其可以在探针高度受限的情况下提供改善的擦洗性能。 更具体地，这种探针包括基部和尖端，以及从基部到尖端作为单个连续部件延伸的臂。 探针臂垂直折叠，使得其包括三个或更多个垂直臂部分。 垂直臂部具有相当大的垂直重叠，并且彼此横向移位。 当这种探针垂直向下放置在被测设备上时，探头变形。 在探针变形期间，至少两个垂直臂部彼此接触。 臂部之间的这种接触可以有利地增加探针尖端处的横向擦洗运动，并且还可以有利地减小探针电感。

公开(公告)号：US20090102495A1

公开(公告)日：2009-04-23

申请号：US11975743

申请日：2007-10-19

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/073

CPC classification number: G01R1/07314 ,  G01R1/0675 ,  G01R1/06755 ,  G01R1/07357

Abstract: Improved probing of closely spaced contact pads is provided by an array of guided vertical probes that has a sideways scrub relative to the line of contact pads. With this orientation of scrub motion, the probes can be relatively thin along the contact line, and relatively thick perpendicular to the contact line. The thin dimension of the probes allows for probing closely spaced contact pads, while the thick dimension of the probes provides mechanical robustness and current carrying capacity. The probes have a predetermined curvature in a plane including the contact line, to help determine the amount of scrub motion during contact. In a preferred embodiment, an array of probes is provided for probing two closely spaced and parallel rows of contact pads, offset from each other by half the contact pad pitch.

Abstract translation: 紧密间隔的接触垫的改进的探测由相对于接触焊盘的侧面擦洗的引导垂直探针阵列提供。 随着洗涤运动的这种取向，探针可以沿着接触线相对较薄，并且垂直于接触线相对较厚。 探头的薄尺寸允许探测紧密间隔的接触垫，而探头的厚度尺寸提供机械坚固性和载流能力。 探针在包括接触线的平面中具有预定曲率，以帮助确定接触期间擦洗运动的量。 在优选实施例中，提供探针阵列用于探测两个紧密间隔并平行的接触垫排，彼此偏移接触垫间距的一半。

公开(公告)号：US20080088327A1

公开(公告)日：2008-04-17

申请号：US11580204

申请日：2006-10-11

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07314 ,  G01R1/07357 ,  G01R1/07371

Abstract: Method and apparatus using a retention arrangement for probes used for electrical testing of a device under test (DUT). The apparatus has a number of probes each of which has a connect end for applying a test signal, a retaining portion, at least one arm portion and a contact tip for making an electrical contact with the DUT. A retention arrangement has a tip holder for holding each of the probes by its contacting tip and a plate with openings for holding each of the probes below the retaining portion. The retaining portion of each of the probes is potted in a potting region defined above the plate with the aid of a potting agent. The apparatus can be used with space transformers, a variety of probes of different geometries and scrub motion characteristics and is well-suited for use in probe card apparatus under tight pitch and small tolerance requirements.

Abstract translation: 使用用于被测设备（DUT）的电气测试的探针的保持装置的方法和装置。 该装置具有多个探针，每个探针具有用于施加测试信号的连接端，保持部分，至少一个臂部分和用于与DUT电接触的接触末端。 保持装置具有用于通过其接触尖端保持每个探针的尖端保持器和具有用于将每个探针保持在保持部分下方的开口的板。 每个探针的保持部分都借助于灌封剂封装在位于板上方的灌封区域中。 该装置可以与空间变压器，各种不同几何形状的探针和擦洗运动特性一起使用，并且非常适用于在紧密间距和小公差要求下的探针卡装置。

公开(公告)号：US20080001613A1

公开(公告)日：2008-01-03

申请号：US11701236

申请日：2007-01-31

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R3/00 ,  G01R1/06733

Abstract: A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the probe retention portion, a probe arm below the retention portion, a probe contact tip below the arm, and a generally planar self-cleaning skate disposed perpendicular below the contact tip. The self-cleaning skate has a square front, a round back and a flat middle section. The conductive pad is of generally convex shape having a granular non-conductive surface of debris and moves to engage the skate, whereby an overdrive motion is applied to the pad causing the skate to move across and scrub non-conductive debris from the pad displacing the debris along the skate and around the skate round back end to a position on the skate that is away from the pad.

Abstract translation: 提供用于接合导电焊盘的探针。 探头包括用于接收测试电流的探针接触端，接触端下方的探针保持部分，用于保持探针保持部分的块，在保持部分下方的探针臂，臂下方的探针接触尖端，以及通常 平面自清洁溜冰板垂直设置在接触尖端下方。 自洁滑冰鞋有一个正方形的前面，一个圆形的背部和一个平的中间部分。 导电垫具有大致凸形的形状，具有颗粒状非导电表面的碎屑并且移动以接合滑冰板，由此将过载驱动运动施加到垫上，从而使滑冰板移动并且擦去来自垫的非导电碎片， 沿着溜冰鞋和溜冰鞋周围的碎屑回到位于远离垫子的溜冰鞋上的位置。

公开(公告)号：US20080001612A1

公开(公告)日：2008-01-03

申请号：US11480302

申请日：2006-06-29

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/06733 ,  G01R1/06738 ,  G01R3/00

Abstract: A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is aligned along a scrub direction and also has a certain curvature along the scrub direction such that it may undergo both a scrub motion and a self-cleaning rotation upon application of a contact force between the skate and the conductive pad. While the scrub motion clears oxide from the pad to establish electrical contact, the rotation removes debris from the skate and thus preserves a low contact resistance between the skate and the pad. The use of probes with one or more blunt skates and methods of using such self-cleaning probes are especially advantageous when testing DUTs with low-K conductive pads or other mechanically fragile pads that tend to be damaged by large contact force concentration.

Abstract translation: 一种探针，其具有导电体和接触尖端，所述接触尖端由一个或多个钝头溜冰鞋端接，用于接合待测器件（DUT）的导电焊盘，用于进行电气测试。 接触尖端具有一定的宽度，并且钝溜冰鞋比尖端宽度窄。 溜冰鞋沿着洗涤方向对准，并且沿擦洗方向也具有一定的曲率，使得它可以在施加滑板和导电垫之间的接触力的同时进行擦洗运动和自清洁旋转。 当擦洗动作从衬垫中清除氧化物以建立电接触时，旋转从溜冰鞋去除碎屑，从而保持溜冰鞋和衬垫之间的低接触电阻。 使用具有一个或多个钝头溜冰鞋的探头以及使用这种自清洁探针的方法在使用低K导电垫或其他易受大接触力浓度损伤的机械脆性垫进行测试时尤为有利。

公开(公告)号：US20070216432A1

公开(公告)日：2007-09-20

申请号：US11385289

申请日：2006-03-20

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07378 ,  G01R1/07357

Abstract: Method and apparatus for electrical testing of a device under test (DUT) that employs a connection board with signal contacts for applying test signals and a space transformer that has low pitch contacts arranged on one or more circumferential shelves that define an enclosure in the space transformer. The apparatus has a substrate with fine pitch contacts positioned such that these are within the enclosure. A set of wire bonds is used for pitch reduction by interconnecting the fine pitch contacts with the low pitch contacts arranged on the shelves. The probes are connected to the fine pitch contacts and are used to apply the test signals to a DUT by contacting its pads. In some embodiments, the fine pitch contacts may be embodied by plugs or by blind metal vias.

公开(公告)号：US07173441B2

公开(公告)日：2007-02-06

申请号：US10964316

申请日：2004-10-12

Applicant: January Kister ,  David Beatson ,  Edward Laurent

Inventor： January Kister ,  David Beatson ,  Edward Laurent

IPC: H01R43/00 ,  G01R31/02

CPC classification number: G01R1/07357 ,  Y10T29/49117

Abstract: A interconnect assembly features a prefabricated interconnect structure metallurgically bonded to a terminal of a larger structure. Fabrication of the interconnect structure's independently and separate from the larger structure enables the use of economic mass fabrication techniques that are well-known for miniature scale sheet metal parts. During fabrication, positioning and attachment, each interconnect structure is combined with and/or held in a carrier structure from which it is separated after attachment to the terminal. The interconnect structure is configured such that an attachment tool may be brought into close proximity to the attachment interface between the interconnect structure and the terminal for a short and direct transmission of bonding energy onto the attachment interface. The attachment interface provides for an electrically conductive and a bending stress opposing mechanical connection between the interconnect structure and the terminal. The interconnect assembly is preferably part of a probe apparatus.

Abstract translation: 互连组件具有冶金结合到更大结构的端子的预制互连结构。 互连结构的独立结构和较大结构的制造使得能够使用为微型钣金零件而众所周知的经济大规模制造技术。 在制造，定位和附接期间，每个互连结构与载体结构组合和/或保持在载体结构中，在附接到终端之后，载体结构被分离。 互连结构被配置成使得附接工具可以靠近互连结构和端子之间的连接接口，以便将粘结能量短时间地直接传输到附接界面上。 连接接口提供了导电和弯曲应力，该互连结构与端子之间的机械连接相反。 互连组件优选地是探针装置的一部分。