摘要:
A method of manufacturing a polarization-modulating optical element is provided. The element causes, for light passing through the element and due to stress-induced birefringence, a distribution of retardation between orthogonal states of polarization. The method includes joining a first component and a second component. A non-plane surface of the first component is provided with a defined height profile is joined with a plane surface of the second component. A mechanical stress causing the stress-induced birefringence is produced in the such formed polarization-modulating optical element.
摘要:
Disclosed is a sealing device for sealing at least one first volume of an arrangement for the treatment of at least one medical fluid against at least one second volume, wherein the first volume is provided for receiving at least one external functional device. The sealing device includes at least one first connection device whereby the sealing device may be connected to the arrangement. In addition an arrangement and a method are disclosed.
摘要:
An installation switching device having at least one pole current path comprises two stationary contact pieces; a moving contact bridge including two moving contact pieces forming a double-break pole with the two stationary contact pieces; a contact pressure spring exerting a pressure on the moving contact bridge in a closing direction of the moving contact bridge; a pusher configured to act on the moving contact bridge counter to the pressure of the contact pressure spring in an opening direction, the pusher including a slide and a striking pin disposed moveably relative to the moving contact bridge and to one another in a movement direction of the moving contact bridge; a switch latch having a latching point; an operating lever configured to act on the pusher; and an electromagnetic release having an impact armature.
摘要:
Catadioptric projection objective (1) for microlithography for imaging an object field (3) in an object plane (5) onto an image field (7) in an image plane (9), including a first partial objective (11) imaging the object field onto a first real intermediate image (13), a second partial objective (15) imaging the first intermediate image onto a second real intermediate image (17) and a third partial objective (19) imaging the second intermediate image onto the image field (7). The second partial objective (15) has exactly one concave mirror (21) and at least one lens (23). The minimum distance between an optically utilized region of the concave mirror (21) and an optically utilized region of a surface (25)—facing the concave mirror—of a lens (23) adjacent to the concave mirror is greater than 10 mm.
摘要:
A measuring arrangement and measurement method determine the play of a cartridge pivot unit of an inkjet printing system that has at least one stop for the cartridge pivot unit. The cartridge pivot unit is driven by a first motor via a gear train and is equipped with a first movement sensor to establish a movement of the cartridge pivot unit upon leaving the stop. The cartridge pivot unit moves only when the play of the gear train is overcome. The stop for the cartridge pivot unit is formed by a mobile cleaning and sealing station. A counter is provided to count pulses, the count being representative of the play of the gear train of the cartridge pivot unit counting begins with leaving the mobile stop and continues until the movement of the cartridge pivot unit upon leaving the stop again ensues in conformity with the actuation by the first motor.
摘要:
An illumination system of a microlithographic projection exposure apparatus includes a beam deflection array including a number beam deflection elements, for example mirrors. Each beam deflection element is adapted to deflect an impinging light beam by a deflection angle that is variable in response to control signals. The light beams reflected from the beam deflection elements produce spots in a system pupil surface. The number of spots illuminated in the system pupil surface during an exposure process, during which a mask is imaged on a light sensitive surface, is greater than the number of beam deflection elements. This may be accomplished with the help of a beam multiplier unit that multiplies the light beams reflected from the beam deflection elements. In another embodiment the beam deflecting elements are controlled such that the irradiance distribution produced in the system pupil surface changes between two consecutive light pulses of an exposure process.
摘要:
An illumination system of a microlithographic projection exposure apparatus includes a beam deflection array including a number beam deflection elements, for example mirrors. Each beam deflection element is adapted to deflect an impinging light beam by a deflection angle that is variable in response to control signals. The light beams reflected from the beam deflection elements produce spots in a system pupil surface. The number of spots illuminated in the system pupil surface during an exposure process, during which a mask is imaged on a light sensitive surface, is greater than the number of beam deflection elements. This may be accomplished with the help of a beam multiplier unit that multiplies the light beams reflected from the beam deflection elements. In another embodiment the beam deflecting elements are controlled such that the irradiance distribution produced in the system pupil surface changes between two consecutive light pulses of an exposure process.
摘要:
A fuel cell apparatus includes at least one busbar for discharging high electrical currents from a high-voltage side of a fuel cell unit and a current sensor that comprises an evaluation electronics unit. A resistance element of the current sensor is integrated in the outgoing electrical conductor.
摘要:
The invention relates to a system and to a method for retroactive, dynamic determination and/or monitoring of low layout heights of technical systems (201, 211, 221). Measuring data can be aggregated and analysed and operation-specific system means (14) can be activated. A parameter (30), which is based on the detected operation-specific data, can be dynamically determined by means of a filter unit (12) for various types of operations. Operational-specific measuring data (31) is analysed and aggregated by means of a static analysis module (10) and, after a request and/or a time interval which can be determined, the corresponding low layout heights (32) are dynamically adapted by means of the control unit (14) and/or operation-specific system means (201, 212, 222) are activated when a definable deviation value is exceeded in relation to the already stored measuring data.