公开(公告)号：US09772391B2

公开(公告)日：2017-09-26

申请号：US14164016

申请日：2014-01-24

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  William A. Hagerup ,  William Q. Law

IPC: G01R27/26 ,  G01R35/00 ,  G01R1/067 ,  G01R13/02

CPC classification number: G01R35/00 ,  G01R1/067 ,  G01R13/029 ,  G01R35/005

Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.

公开(公告)号：US20170168092A1

公开(公告)日：2017-06-15

申请号：US15143429

申请日：2016-04-29

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R13/02 ,  G01R23/175

CPC classification number: G01R13/029 ,  G01R13/0218 ,  G01R19/2509 ,  G01R23/175 ,  G01R31/31709

Abstract: Embodiments of the present invention provide techniques and methods for improving signal-to-noise ratio (SNR) when averaging two or more data signals by finding a group delay between the signals and using it to calculate an averaged result. In one embodiment, a direct average of the signals is computed and phases are found for the direct average and each of the data signals. Phase differences are found between each signal and the direct average. The phase differences are then used to compensate the signals. Averaging the compensated signals provides a more accurate result than conventional averaging techniques. The disclosed techniques can be used for improving instrument accuracy while minimizing effects such as higher-frequency attenuation. For example, in one embodiment, the disclosed techniques may enable a real-time oscilloscope to take more accurate S parameter measurements.

公开(公告)号：US20170089954A1

公开(公告)日：2017-03-30

申请号：US14870357

申请日：2015-09-30

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G01R13/02

CPC classification number: G01R13/0218 ,  G01R13/0272 ,  G01R13/029 ,  H03M1/188

Abstract: A test and measurement instrument, including a splitter configured to split an input signal into two split input signals and output each split input signal onto a separate path and a combiner configured to receive and combine an output of each path to reconstruct the input signal. Each path includes an amplifier configured to receive the split input signal and to compress the split input signal with a sigmoid function, a digitizer configured to digitize an output of the amplifier; and at least one processor configured to apply an inverse sigmoid function on the output of the digitizer.

公开(公告)号：US20160018450A1

公开(公告)日：2016-01-21

申请号：US14673747

申请日：2015-03-30

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R27/06

CPC classification number: G01R27/28 ,  G01R27/06 ,  G01R27/16 ,  G01R31/2839 ,  G01R31/2841

Abstract: A method for determining scattering parameters of a device under test using a real-time oscilloscope. The method includes calculating a reflection coefficient of each port of a device under test with N ports, wherein N is greater than one, based on a first voltage measured by the real-time oscilloscope when a signal is generated from a signal generator. The method also includes determining an insertion loss coefficient of each port of the device under test, including calculating the insertion loss coefficient of the port of the device under test to be measured based on a second voltage measured by the real-time oscilloscope when a signal is generated from a signal generator.

Abstract translation: 使用实时示波器确定被测器件的散射参数的方法。 该方法包括基于当从信号发生器产生信号时由实时示波器测量的第一电压，用N个端口计算被测设备的每个端口的反射系数，其中N大于1。 该方法还包括确定被测设备的每个端口的插入损耗系数，包括基于由实时示波器测量的第二电压计算待测量的被测器件的端口的插入损耗系数，当信号 从信号发生器产生。

公开(公告)号：US20150084656A1

公开(公告)日：2015-03-26

申请号：US14267697

申请日：2014-05-01

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Daniel G. Knierim

IPC: G01R31/319

CPC classification number: G01R31/31924 ,  G01R27/28 ,  G01R35/005

Abstract: A test and measurement system including a device under test, two de-embed probes connected to the device under test, and a test and measurement instrument connected to the two de-embed probes. The test and measurement instrument includes a processor configured to determine the S-parameter set of the device under test based on measurements from the device under test taken by the two de-embed probes.

Abstract translation: 包括被测器件的测试和测量系统，连接到被测器件的两个解嵌探测器以及连接到两个解嵌探测器的测试和测量仪器。 测试和测量仪器包括处理器，其被配置为基于由两个解嵌入探针所采取的被测器件的测量值确定被测器件的S参数组。