PATTERN FORTIFICATION FOR HDD BIT PATTERNED MEDIA PATTERN TRANSFER
    2.
    发明申请
    PATTERN FORTIFICATION FOR HDD BIT PATTERNED MEDIA PATTERN TRANSFER 审中-公开
    用于硬盘位图形图形图形传输的图案化

    公开(公告)号:US20140131308A1

    公开(公告)日:2014-05-15

    申请号:US13800362

    申请日:2013-03-13

    Abstract: A method and apparatus for forming a magnetic layer having a pattern of magnetic properties on a substrate is described. The method includes using a metal nitride hardmask layer to pattern the magnetic layer by plasma exposure. The metal nitride layer is patterned using a nanoimprint patterning process with a silicon oxide pattern negative material. The pattern is developed in the metal nitride using a halogen and oxygen containing remote plasma, and is removed after plasma exposure using a caustic wet strip process. All processing is done at low temperatures to avoid thermal damage to magnetic materials.

    Abstract translation: 描述了在基板上形成具有磁特性图案的磁性层的方法和装置。 该方法包括使用金属氮化物硬掩模层通过等离子体曝光对磁性层进行图案化。 使用具有氧化硅图案负材料的纳米压印图案化工艺对金属氮化物层进行构图。 在使用含卤素和含氧远距离等离子体的金属氮化物中形成图案,并且在使用苛性湿法剥离法等离子体暴露后除去。 所有加工都是在低温下进行,以避免热损坏磁性材料。

    USJ techniques with helium-treated substrates
    3.
    发明授权
    USJ techniques with helium-treated substrates 有权
    USJ技术与氦处理的基板

    公开(公告)号:US08372735B2

    公开(公告)日:2013-02-12

    申请号:US12339295

    申请日:2008-12-19

    Abstract: A method of using helium to create ultra shallow junctions is disclosed. A pre-implantation amorphization using helium has significant advantages. For example, it has been shown that dopants will penetrate the substrate only to the amorphous-crystalline interface, and no further. Therefore, by properly determining the implant energy of helium, it is possible to exactly determine the junction depth. Increased doses of dopant simply reduce the substrate resistance with no effect on junction depth. Furthermore, the lateral straggle of helium is related to the implant energy and the dose rate of the helium PAI, therefore lateral diffusion can also be determined based on the implant energy and dose rate of the helium PAI. Thus, dopant may be precisely implanted beneath a sidewall spacer, or other obstruction.

    Abstract translation: 公开了一种使用氦来形成超浅结的方法。 使用氦的植入前非晶化具有显着的优点。 例如,已经表明,掺杂剂将仅渗透到非晶态界面的衬底,而不再进一步。 因此,通过适当地确定氦的注入能量,可以准确地确定结深度。 增加剂量的掺杂剂简单地降低了衬底电阻,对结深度没有影响。 此外,氦的横向is is与植入能量和氦PAI的剂量率有关,因此横向扩散也可以基于氦PAI的注入能量和剂量率来确定。 因此,可以将掺杂剂精确地注入到侧壁间隔物或其它障碍物的下方。

    USJ TECHNIQUES WITH HELIUM-TREATED SUBSTRATES
    4.
    发明申请
    USJ TECHNIQUES WITH HELIUM-TREATED SUBSTRATES 有权
    USJ技术与经过处理的基板

    公开(公告)号:US20100041218A1

    公开(公告)日:2010-02-18

    申请号:US12339295

    申请日:2008-12-19

    Abstract: A method of using helium to create ultra shallow junctions is disclosed. A pre-implantation amorphization using helium has significant advantages. For example, it has been shown that dopants will penetrate the substrate only to the amorphous-crystalline interface, and no further. Therefore, by properly determining the implant energy of helium, it is possible to exactly determine the junction depth. Increased doses of dopant simply reduce the substrate resistance with no effect on junction depth. Furthermore, the lateral straggle of helium is related to the implant energy and the dose rate of the helium PAI, therefore lateral diffusion can also be determined based on the implant energy and dose rate of the helium PAI. Thus, dopant may be precisely implanted beneath a sidewall spacer, or other obstruction.

    Abstract translation: 公开了一种使用氦来形成超浅结的方法。 使用氦的植入前非晶化具有显着的优点。 例如,已经表明,掺杂剂将仅渗透到非晶态界面的衬底,而不再进一步。 因此,通过适当地确定氦的注入能量,可以准确地确定结深度。 增加剂量的掺杂剂简单地降低了衬底电阻,对结深度没有影响。 此外,氦的横向is is与植入能量和氦PAI的剂量率有关,因此横向扩散也可以基于氦PAI的注入能量和剂量率来确定。 因此,可以将掺杂剂精确地注入到侧壁间隔物或其它障碍物的下方。

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