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1.发明授权Method and system for testing an electronic circuit to identify multiple defects 失效用于测试电子电路以识别多个缺陷的方法和系统公开(公告)号：US07895490B2
公开(公告)日：2011-02-22
申请号：US12123547
申请日：2008-05-20
IPC分类号： G01R31/28
CPC分类号： G06F11/27 , G01R31/318307 , G01R31/3187
摘要： A method for testing an electronic circuit comprises selecting a plurality of test patterns arranged in an order. The method tests an electronic circuit by applying to the electronic circuit a first subset range of the plurality of test patterns sequentially in the order, from a first test pattern to a first log interval after the first test pattern, thereby generating a first associated output. The method compares the first associated output with a first known output of the plurality of known outputs. In the event the first associated output does not match the first known output, the method stores indicia of the first mismatch; causes the electronic circuit to appear to assume the first known output state; and proceeds with additional test procedures.
摘要翻译： 一种用于测试电子电路的方法包括选择按顺序布置的多个测试图案。 该方法通过将电子电路中的多个测试图案的第一子集范围按顺序从第一测试图形顺序应用到第一测试图案之后的第一对数间隔，从而生成第一相关输出来测试电子电路。 该方法将第一相关输出与多个已知输出的第一已知输出进行比较。 在第一个相关联的输出与第一已知输出不匹配的情况下，该方法存储第一个不匹配的标记; 使电子电路看起来呈现第一已知输出状态; 并进行额外的测试程序。
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2.发明申请Method and System for Testing an Electronic Circuit to Identify Multiple Defects 失效用于测试电子电路以识别多个缺陷的方法和系统公开(公告)号：US20090292964A1
公开(公告)日：2009-11-26
申请号：US12123547
申请日：2008-05-20
IPC分类号： G06F11/25 , G06F11/263
CPC分类号： G06F11/27 , G01R31/318307 , G01R31/3187
摘要： A method for testing an electronic circuit comprises selecting a plurality of test patterns arranged in an order. The method tests an electronic circuit by applying to the electronic circuit a first subset range of the plurality of test patterns sequentially in the order, from a first test pattern to a first log interval after the first test pattern, thereby generating a first associated output. The method compares the first associated output with a first known output of the plurality of known outputs. In the event the first associated output does not match the first known output, the method stores indicia of the first mismatch; causes the electronic circuit to appear to assume the first known output state; and proceeds with additional test procedures.
摘要翻译： 一种用于测试电子电路的方法包括选择按顺序布置的多个测试图案。 该方法通过将电子电路中的多个测试图案的第一子集范围按顺序从第一测试图形顺序应用到第一测试图案之后的第一对数间隔，从而生成第一相关输出来测试电子电路。 该方法将第一相关输出与多个已知输出的第一已知输出进行比较。 在第一个相关联的输出与第一已知输出不匹配的情况下，该方法存储第一个不匹配的标记; 使电子电路看起来呈现第一已知输出状态; 并进行额外的测试程序。
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公开(公告)号：US08086925B2
公开(公告)日：2011-12-27
申请号：US12123540
申请日：2008-05-20
IPC分类号： G01R31/28
CPC分类号： G06F11/27 , G01R31/318307 , G01R31/3187
摘要： A method for testing an electronic circuit comprises selecting a first log interval, a first log start pattern, a first log end pattern, and a first subset range of LBIST patterns from a plurality of LBIST patterns arranged in an order, wherein each LBIST pattern of the subset range of LBIST patterns causes an associated output of an electronic circuit. The method tests an electronic circuit in a first test by applying to the electronic circuit the first subset range of LBIST patterns sequentially in the order, thereby generating a first plurality of associated outputs. The method stores a first subset of associated outputs based on the first log interval, the first log start pattern, and the first log end pattern. The method compares the subset of associated outputs with known outputs to identify a first output mismatch.
摘要翻译： 一种用于测试电子电路的方法包括从按顺序布置的多个LBIST图案中选择第一对数间隔，第一对数起始图案，第一日志结束图案和LBIST图案的第一子范围，其中每个LBIST图案 LBIST模式的子集范围导致电子电路的相关输出。 该方法在第一次测试中通过以顺序向电子电路应用LBIST图案的第一子范围，从而产生第一多个相关联的输出，来测试电子电路。 该方法基于第一日志间隔，第一日志开始模式和第一日志结束模式来存储关联输出的第一子集。 该方法将相关输出的子集与已知输出进行比较，以识别第一输出失配。
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4.发明申请System and method for thermal monitoring of IC using sampling periods of invariant duration 失效使用不变持续时间的采样周期对IC进行热监测的系统和方法公开(公告)号：US20060173645A1
公开(公告)日：2006-08-03
申请号：US11050324
申请日：2005-02-03
IPC分类号： G01K1/00
CPC分类号： G01K7/425 , G01K7/32 , H01L23/34 , H01L2924/0002 , Y10S323/907 , H01L2924/00
摘要： A system and method are provided for monitoring temperature within a specified integrated circuit. Usefully, the system comprises at least one oscillator device proximate to the integrated circuit for generating signal pulses at a frequency that varies as a function of the temperature adjacent to the oscillator device. The system further comprises a control unit for establishing sample acquisition periods of invariant time duration based on an time invariant reference clock. A sampling component is coupled to count the number of pulses generated by the oscillator device during each of a succession of the time invariant sample acquisition periods, and a threshold component responsive to the respective count values for the succession of sample acquisition periods provides notice when at least some of the count values have a value associated with a prespecified excessive temperature level.
摘要翻译： 提供了一种用于监测指定集成电路内的温度的系统和方法。 有用地，系统包括靠近集成电路的至少一个振荡器装置，用于以与振荡器装置相邻的温度变化的频率产生信号脉冲。 该系统还包括控制单元，用于基于时不变参考时钟建立不变时间持续时间的采样周期。 一个采样分量被耦合以对在时间不变样本采集周期中的每一个期间由振荡器装置产生的脉冲数进行计数，并且对于连续的采样采集周期响应于各个计数值的阈值分量提供了当在 至少一些计数值具有与预先指定的过高温度水平相关联的值。
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5.发明授权System and method for thermal monitoring of IC using sampling periods of invariant duration 失效使用不变持续时间的采样周期对IC进行热监测的系统和方法公开(公告)号：US07197419B2
公开(公告)日：2007-03-27
申请号：US11050324
申请日：2005-02-03
IPC分类号： G06F17/40
CPC分类号： G01K7/425 , G01K7/32 , H01L23/34 , H01L2924/0002 , Y10S323/907 , H01L2924/00
摘要： A system and method are provided for monitoring temperature within a specified integrated circuit. Usefully, the system comprises at least one oscillator device proximate to the integrated circuit for generating signal pulses at a frequency that varies as a function of the temperature adjacent to the oscillator device. The system further comprises a control unit for establishing sample acquisition periods of invariant time duration based on an time invariant reference clock. A sampling component is coupled to count the number of pulses generated by the oscillator device during each of a succession of the time invariant sample acquisition periods, and a threshold component responsive to the respective count values for the succession of sample acquisition periods provides notice when at least some of the count values have a value associated with a prespecified excessive temperature level.
摘要翻译： 提供了一种用于监测指定集成电路内的温度的系统和方法。 有用地，系统包括靠近集成电路的至少一个振荡器装置，用于以与振荡器装置相邻的温度变化的频率产生信号脉冲。 该系统还包括控制单元，用于基于时不变参考时钟建立不变时间持续时间的采样周期。 一个采样分量被耦合以对在时间不变样本采集周期中的每一个期间由振荡器装置产生的脉冲数进行计数，并且对于连续的采样采集周期响应于各个计数值的阈值分量提供了当在 至少一些计数值具有与预先指定的过高温度水平相关联的值。
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公开(公告)号：US20090292963A1
公开(公告)日：2009-11-26
申请号：US12123540
申请日：2008-05-20
CPC分类号： G06F11/27 , G01R31/318307 , G01R31/3187
摘要： A method for testing an electronic circuit comprises selecting a first log interval, a first log start pattern, a first log end pattern, and a first subset range of LBIST patterns from a plurality of LBIST patterns arranged in an order, wherein each LBIST pattern of the subset range of LBIST patterns causes an associated output of an electronic circuit. The method tests an electronic circuit in a first test by applying to the electronic circuit the first subset range of LBIST patterns sequentially in the order, thereby generating a first plurality of associated outputs. The method stores a first subset of associated outputs based on the first log interval, the first log start pattern, and the first log end pattern. The method compares the subset of associated outputs with known outputs to identify a first output mismatch.
摘要翻译： 一种用于测试电子电路的方法包括从按顺序布置的多个LBIST图案中选择第一对数间隔，第一对数起始图案，第一日志结束图案和LBIST图案的第一子范围，其中每个LBIST图案 LBIST模式的子集范围导致电子电路的相关输出。 该方法在第一次测试中通过以顺序向电子电路应用LBIST图案的第一子范围，从而产生第一多个相关联的输出，来测试电子电路。 该方法基于第一日志间隔，第一日志开始模式和第一日志结束模式来存储关联输出的第一子集。 该方法将相关输出的子集与已知输出进行比较，以识别第一输出失配。
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