Reflecting type liquid crystal display device
    1.
    发明授权
    Reflecting type liquid crystal display device 失效
    反射型液晶显示装置

    公开(公告)号:US06429920B1

    公开(公告)日:2002-08-06

    申请号:US09585924

    申请日:2000-06-02

    申请人: Atsushi Dohi

    发明人: Atsushi Dohi

    IPC分类号: G02F11335

    摘要: An object of the invention is to obtain achromatic display with high contrast and high lightness. A reflection type liquid crystal display device of NB mode comprises a liquid crystal cell having an STN type liquid crystal layer; a first phase difference plate; a second phase difference plate; a polarizing plate, the first and second phase difference plates and polarizing plate being disposed on one surface of the liquid crystal cell in this order; and a reflecting layer disposed in the liquid crystal cell, the reflecting layer forming the other surface of the liquid crystal cell. The liquid crystal layer retardation &Dgr;nLC.dLC, the first phase difference plate retardation &Dgr;n1.d1 and the second phase difference plate retardation &Dgr;n2.d2 are selected from the ranges of 660 nm to 830 nm, 120 nm to 240 nm and 300 nm to 430 nm, respectively. A twist angle &khgr; is selected from the range of 220° to 260°. Predetermined angles &thgr;, &phgr; and &phgr; are selected from the ranges of −130° to −75 , −20° to −60° and −15° to −45°, respectively.

    摘要翻译: 本发明的目的是获得具有高对比度和高亮度的消色差显示。 NB模式的反射型液晶显示装置包括具有STN型液晶层的液晶单元; 第一相差板; 第二相差板; 偏光板,第一和第二相位差板和偏振板依次设置在液晶单元的一个表面上; 以及设置在所述液晶单元中的反射层,所述反射层形成所述液晶单元的另一表面。 液晶层延迟DELTAnLC.dLC,第一相差板延迟DELTAn1.d1和第二相位差板延迟DELTAn2.d2选自660nm至830nm,120nm至240nm和300nm至430nm的范围 nm。 扭角&khgr 选自220°至260°的范围。 预定角度θ,phi和phi分别选自-130°至-75°,-20°至-60°和-15°至-45°的范围。

    Method and device for measuring thickness of liquid crystal layer
    2.
    发明授权
    Method and device for measuring thickness of liquid crystal layer 有权
    测量液晶层厚度的方法和装置

    公开(公告)号:US06757062B2

    公开(公告)日:2004-06-29

    申请号:US09772325

    申请日:2001-01-29

    申请人: Atsushi Dohi

    发明人: Atsushi Dohi

    IPC分类号: G01J400

    CPC分类号: G01B11/0641

    摘要: According to a method of measuring a thickness, to measure a thickness d of a liquid crystal layer 11, a property of reflected light is utilized, in that the light returns maintaining the same polarizing plane as that of an entrance when a polarizing plane-maintaining condition is satisfied in which a difference in optical path lengths between an ordinary ray and an extraordinary ray of the reflected light is a sum of an integer multiple of the wavelength and a half-wavelength or an integer multiple, to find a wavelength at which the polarizing plane-maintaining condition is satisfied. A reasonable &Dgr;n·d is thereby found. This is performed for a plurality of wavelengths to find a relational expression of a wavelength and &Dgr;n·d. A known combination of a wavelength &lgr; and &Dgr;n is assigned to the relational expression to find d.

    摘要翻译: 根据测量厚度的方法,为了测量液晶层11的厚度d,利用反射光的性质,因为当维持偏振平面时,光返回维持与入口相同的偏振平面 满足条件,其中普通光线和反射光的非常光线之间的光程长度的差是波长的整数倍和半波长或整数倍的和,以找到波长 极化平面保持条件得到满足。 因此找到合理的Deltan.d。 这是针对多个波长执行的,以找到波长的关系表达式和Deltan.d。 将波长λ和Deltan的已知组合分配给关系表达式以找到d。