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1.发明授权Identification of integrated circuits using pixel or memory cell characteristics 失效使用像素或存储单元特性识别集成电路公开(公告)号：US07787034B2
公开(公告)日：2010-08-31
申请号：US11412433
申请日：2006-04-27
IPC分类号： H04N9/64
CPC分类号： H04N5/3696
摘要： Disclosed are various embodiments of methods and corresponding devices for effecting such methods that permit integrated circuits, sensors, chips or dies to be identified. Imperfections or irregularities in pixels or memory cells are used to generate identification codes for integrated circuits, sensors, chips or dies. Addresses or data locations of selected defective pixels or memory cells may be used to generate such identification codes.
摘要翻译： 公开了用于实现允许识别集成电路，传感器，芯片或管芯的这种方法的方法和相应装置的各种实施例。 使用像素或存储单元中的缺陷或不规则来生成用于集成电路，传感器，芯片或裸片的识别码。 可以使用所选择的缺陷像素或存储单元的地址或数据位置来产生这样的识别码。
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2.发明授权Method for detecting and correcting defective pixels in a digital image sensor 有权用于检测和校正数字图像传感器中的有缺陷的像素的方法公开(公告)号：US07283164B2
公开(公告)日：2007-10-16
申请号：US10246124
申请日：2002-09-18
CPC分类号： H04N5/367 , H04N2209/045
摘要： A bad pixel correction (BPC) algorithm that can be implemented on the image sensor chip is provided for detecting and correcting defective pixels in a digital color image sensor. Gradients of neighboring pixels in at least one other color plane than the color plane of a current pixel and a range of sensor values from neighboring pixels in the same color plane as the current pixel are determined. If the sensor value of the current pixel is outside of the range by a threshold amount that is calculated using one or more of the gradients, the current pixel is determined to be a defective pixel, and replaced using the sensor values of the neighboring pixels in the same color plane.
摘要翻译： 可以在图像传感器芯片上实现的坏像素校正（BPC）算法被提供用于检测和校正数字彩色图像传感器中的有缺陷的像素。 确定与当前像素的颜色平面相比至少一个其它颜色平面中的相邻像素的渐变和来自与当前像素相同颜色平面中的相邻像素的传感器值的范围。 如果当前像素的传感器值超出了使用一个或多个梯度计算的阈值的范围，则将当前像素确定为缺陷像素，并使用相邻像素的传感器值进行替换 相同的颜色飞机。
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公开(公告)号：US07960767B2
公开(公告)日：2011-06-14
申请号：US11250323
申请日：2005-10-15
IPC分类号： H01L23/52
CPC分类号： H01L27/14634
摘要： The present invention provides providing a substrate, forming a sensor array on the substrate, forming a structured array of uncommitted logic surrounding the sensor array on the substrate, and providing electrical interconnects to the structured array of uncommitted logic, wherein the structured array of uncommitted logic forms functions that support the operation of the sensor array.
摘要翻译： 本发明提供了提供一种衬底，在衬底上形成传感器阵列，形成围绕衬底上的传感器阵列的未提供的逻辑的结构化阵列，以及提供与未提交逻辑的结构化阵列的电互连，其中未提交逻辑的结构化阵列 形成支持传感器阵列操作的功能。
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4.发明授权System and method for detecting and correcting defective pixels in a digital image sensor 有权用于检测和校正数字图像传感器中的有缺陷的像素的系统和方法公开(公告)号：US07460688B2
公开(公告)日：2008-12-02
申请号：US11007979
申请日：2004-12-09
IPC分类号： G06K9/00
CPC分类号： H04N5/367
摘要： A digital image sensor comprising an array of pixels and a processor is provided. The array of pixels comprises a current pixel in a first color plane that is configured to produce a current sensor value, a first plurality of pixels in the first color plane that is configured to produce a first plurality of sensor values, and a second plurality of pixels in the second color plane that is configured to produce a second plurality of sensor values. The processor is configured to generate a plurality of estimate values using the first plurality of sensor values and a plurality of intensity ratios associated with the second plurality of sensor values, and the processor is configured to determine whether the current pixel is defective using the plurality of estimate values and the current sensor value.
摘要翻译： 提供了包括像素阵列和处理器的数字图像传感器。 像素阵列包括被配置为产生电流传感器值的第一颜色平面中的当前像素，被配置为产生第一多个传感器值的第一颜色平面中的第一多个像素，以及第二多个 被配置为产生第二多个传感器值的第二颜色平面中的像素。 处理器被配置为使用第一多个传感器值和与第二多个传感器值相关联的多个强度比来生成多个估计值，并且处理器被配置为使用多个传感器值来确定当前像素是否有缺陷 估计值和当前传感器值。
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