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    Electron microscopy
    3.
    发明授权
    Electron microscopy 失效
    电子显微镜

    公开(公告)号：US3657593A

    公开(公告)日：1972-04-18

    申请号：US3657593D

    申请日：1969-04-03

    申请人： JOHN ROBERT GARROOD ,  WILLIAM CHARLES NIXON

    发明人： GARROOD JOHN ROBERT ,  NIXON WILLIAM CHARLES

    IPC分类号： H01J37/28 ,  H01J37/29 ,  H01J29/80

    CPC分类号： H01J37/292 ,  H01J37/28

    摘要： In scanning electron beam apparatus such as a scanning electron microscope or micro-analyser the scanning is done in at least three successive stages so that the angle of incidence of the beam on the specimen surface is constant during the scanning cycle. It can be varied at will and by rapid switching between two alternative angles and corresponding switching of the imageforming means, stereoscopic effects are obtainable.

    摘要翻译： 在诸如扫描电子显微镜或微量分析仪的扫描电子束装置中，至少在三个连续的阶段进行扫描，使得在扫描周期中，试样表面上的光束的入射角是恒定的。 它可以随意变化，并且通过两个替代角度之间的快速切换和图像形成装置的相应切换，可以获得立体效果。

    Scanning electron beam apparatus for viewing potential distribution on specimen surfaces
    4.
    发明授权
    Scanning electron beam apparatus for viewing potential distribution on specimen surfaces 失效
    扫描电子束装置用于观察样品表面的潜在分布

    公开(公告)号：US3646344A

    公开(公告)日：1972-02-29

    申请号：US3646344D

    申请日：1969-12-31

    申请人： GRAHAM PLOWS ,  WILLIAM CHARLES NIXON

    发明人： PLOWS GRAHAM ,  NIXON WILLIAM CHARLES

    IPC分类号： H01J37/244 ,  H01J37/26 ,  H01J37/28

    CPC分类号： H01J37/268 ,  H01J37/244 ,  H01J2237/2443 ,  H01J2237/2445 ,  H01J2237/2448 ,  H01J2237/2449 ,  H01J2237/24507

    摘要： In electron beam apparatus, in which a finely focused probe is caused to impinge on the surface of a specimen and the resulting secondary electrons are collected and used to show potential distribution on the specimen surface the detector includes, between the collector and the specimen, a positive grid and a further grid, this further grid being of variable low or negative potential to form effectively a potential barrier of adjustable height to discriminate between electrons coming from regions of different potential.

    摘要翻译： 在电子束装置中，其中使精细聚焦的探针撞击在样品的表面上，并且所得到的二次电子被收集并用于显示样品表面上的电势分布，检测器在收集器和样品之间包括一个 正栅格和另一个栅格，该另外的栅格具有可变的低电位或负电位，以有效地形成可调高度的势垒，以区分来自不同电位区域的电子。

    Electron microscopy
    8.
    发明授权
    Electron microscopy 失效
    电子显微镜

    公开(公告)号：US3671743A

    公开(公告)日：1972-06-20

    申请号：US3671743D

    申请日：1969-04-03

    申请人： WILLIAM CHARLES NIXON

    发明人： NIXON WILLIAM CHARLES

    IPC分类号： H01J37/26 ,  H01J37/29 ,  G01N23/00

    CPC分类号： H01J37/266 ,  H01J37/29

    摘要： Mirror electron microscope techniques are used indirectly to examine the electric or magnetic field in a specimen, such as a biological cell, situated outside the evacuated microscope chamber by examining the field on a layer or surface immediately inside a wall of the chamber adjacent the outside of which the specimen is placed.

    摘要翻译： 间接地使用镜子电子显微镜技术来检查位于真空显微镜室外部的样品（例如生物细胞）中的电场或磁场，通过检查邻近室外的腔室内的层或表面上的场 标本被放置。