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公开(公告)号：US20140239995A1
公开(公告)日：2014-08-28
申请号：US13976448
申请日：2011-12-31
IPC分类号： G01R1/067
CPC分类号： G01R1/06711 , G01R1/07357 , G01R3/00
摘要： The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.
摘要翻译： 描述了测试探针结构的形成。 一个测试探针结构包括尖端部分和与尖端部分间隔开距离的手柄部分。 测试探针结构还包括位于尖端部分和手柄部分之间的身体弯曲部分，以及位于身体弯曲部分和手柄部分之间的中间部分。 身体弯曲部分可以包括从中间部分延伸到尖端部分的弯曲形状。 尖端部分可以形成为从由中间部分限定的纵向轴线偏移。 测试探针结构限定长度并且包括在沿着长度的多个位置处不同的横截面面积。 描述和要求保护其他实施例。
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公开(公告)号：US20150008950A1
公开(公告)日：2015-01-08
申请号：US13977665
申请日：2011-12-31
摘要： Embodiments relate to the formation of test probes. One method includes providing a bulk sheet of an electrically conductive material. A laser is used to cut through the bulk sheet in a predetermined pattern to form a test probe. Other embodiments are described and claimed.
摘要翻译： 实施例涉及测试探针的形成。 一种方法包括提供导电材料的散装片材。 使用激光以预定图案切割散片，以形成测试探针。 描述和要求保护其他实施例。
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3.发明授权Test probe structures and methods including positioning test probe structures in a test head 有权测试探头结构和方法，包括在测试头中定位测试探头结构公开(公告)号：US09279830B2
公开(公告)日：2016-03-08
申请号：US13976448
申请日：2011-12-31
CPC分类号： G01R1/06711 , G01R1/07357 , G01R3/00
摘要： The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.
摘要翻译： 描述了测试探针结构的形成。 一个测试探针结构包括尖端部分和与尖端部分间隔开距离的手柄部分。 测试探针结构还包括位于尖端部分和手柄部分之间的身体弯曲部分，以及位于身体弯曲部分和手柄部分之间的中间部分。 身体弯曲部分可以包括从中间部分延伸到尖端部分的弯曲形状。 尖端部分可以形成为从由中间部分限定的纵向轴线偏移。 测试探针结构限定长度并且包括在沿着长度的多个位置处不同的横截面面积。 描述和要求保护其他实施例。
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