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1.发明申请OPTICAL SENSING DEVICES WITH SPR SENSORS BASED ON DIFFERENTIAL PHASE INTERROGATION AND MEASURING METHOD USING THE SAME 有权基于差分相位差的SPR传感器的光学传感器和使用该传感器的测量方法公开(公告)号：US20080304072A1
公开(公告)日：2008-12-11
申请号：US12046359
申请日：2008-03-11
申请人： Ho Pui Ho , Chi Lok Wong , Shu Yuen Wu , Wing Cheung Law , Chinlon Lin , Sui Kai Kong
发明人： Ho Pui Ho , Chi Lok Wong , Shu Yuen Wu , Wing Cheung Law , Chinlon Lin , Sui Kai Kong
CPC分类号： G01N21/553 , G01N21/45
摘要： Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.
摘要翻译： 公开了一种光学感测装置，其包括发光的光源; 分束器; SPR传感器单元，包括感测表面; 和检测机构; 以及转换单元，将第一光束和第二光束从光学装置转换为二维干涉条纹图案。 根据上述结构，可以得到SPR相位测定中的检测光束的额外的相移。 微分测量方法已经表明，实现了比基于SPR传感器的测量领域中现有技术可以获得的最佳结果明显更好的灵敏度图。
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2.发明授权Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same 有权具有基于差分相位询问的SPR传感器的光学感测装置和使用它的测量方法公开(公告)号：US07623246B2
公开(公告)日：2009-11-24
申请号：US12046359
申请日：2008-03-11
申请人： Ho Pui Ho , Chi Lok Wong , Shu Yuen Wu , Wing Cheung Law , Chinlon Lin , Siu Kai Kong
发明人： Ho Pui Ho , Chi Lok Wong , Shu Yuen Wu , Wing Cheung Law , Chinlon Lin , Siu Kai Kong
CPC分类号： G01N21/553 , G01N21/45
摘要： Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.
摘要翻译： 公开了一种光学感测装置，其包括发光的光源; 分束器; SPR传感器单元，包括感测表面; 和检测机构; 以及转换单元，将第一光束和第二光束从光学装置转换为二维干涉条纹图案。 根据上述结构，可以得到SPR相位测定中的检测光束的额外的相移。 微分测量方法已经表明，实现了比基于SPR传感器的测量领域中现有技术可以获得的最佳结果明显更好的灵敏度图。
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3.发明授权Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same 有权具有基于差分相位询问的SPR传感器的光学感测装置和使用它的测量方法公开(公告)号：US07365855B2
公开(公告)日：2008-04-29
申请号：US11178077
申请日：2005-07-08
申请人： Ho Pui Ho , Chi Lok Wong , Shu Yuen Wu , Wing Cheung Law , Chinlon Lin , Siu Kai Kong
发明人： Ho Pui Ho , Chi Lok Wong , Shu Yuen Wu , Wing Cheung Law , Chinlon Lin , Siu Kai Kong
IPC分类号： G01B9/02
CPC分类号： G01N21/553 , G01N21/45
摘要： Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.
摘要翻译： 公开了一种光学感测装置，其包括发光的光源; 分束器; SPR传感器单元，包括感测表面; 和检测机构; 以及转换单元，将第一光束和第二光束从光学装置转换为二维干涉条纹图案。 根据上述结构，可以得到SPR相位测定中的检测光束的额外的相移。 微分测量方法已经表明，实现了比基于SPR传感器的测量领域中现有技术可以获得的最佳结果明显更好的灵敏度图。
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