Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same
    1.
    发明授权
    Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same 有权
    具有基于差分相位询问的SPR传感器的光学感测装置和使用它的测量方法

    公开(公告)号:US07365855B2

    公开(公告)日:2008-04-29

    申请号:US11178077

    申请日:2005-07-08

    IPC分类号: G01B9/02

    CPC分类号: G01N21/553 G01N21/45

    摘要: Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.

    摘要翻译: 公开了一种光学感测装置,其包括发光的光源; 分束器; SPR传感器单元,包括感测表面; 和检测机构; 以及转换单元,将第一光束和第二光束从光学装置转换为二维干涉条纹图案。 根据上述结构,可以得到SPR相位测定中的检测光束的额外的相移。 微分测量方法已经表明,实现了比基于SPR传感器的测量领域中现有技术可以获得的最佳结果明显更好的灵敏度图。

    Method for detecting analytes using surface plasmon resonance
    2.
    发明授权
    Method for detecting analytes using surface plasmon resonance 失效
    使用表面等离子体共振检测分析物的方法

    公开(公告)号:US08004676B1

    公开(公告)日:2011-08-23

    申请号:US12069700

    申请日:2008-02-11

    IPC分类号: G01J4/00

    CPC分类号: G01N21/553 G01N2021/212

    摘要: A method is provided for detection of analytes using the Surface Plasmon Resonance effect. The method comprises providing a metal film on a transparent substrate. The free surface of the metal film is exposed to a test sample. An anlyte in the sample can interact directly with the metal film or via analyte binding molecules (ABMs) complexed to the film. Light is directed incident to the surface of film in contact with the substrate. Light is reflected from the surface of the film under SPR conditions. The reflected light is collected and the second and/or third harmonics of the resulting electrical signal, which are indicative of the phase and polarization state of the reflected light, are determined. The second and third harmonics are correlated to the presence and/or concentration of the analyte.

    摘要翻译: 提供了一种使用表面等离子体共振效应检测分析物的方法。 该方法包括在透明基底上提供金属膜。 将金属膜的自由表面暴露于测试样品。 样品中的非离子液体可以直接与金属膜或通过与膜复合的分析物结合分子(ABM)相互作用。 光引导入射到与基板接触的膜的表面。 在SPR条件下,光从膜的表面反射。 收集反射光,并且确定表示反射光的相位和极化状态的所得电信号的第二和/或第三谐波。 第二和第三谐波与分析物的存在和/或浓度相关。

    Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same
    3.
    发明授权
    Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same 有权
    具有基于差分相位询问的SPR传感器的光学感测装置和使用它的测量方法

    公开(公告)号:US07623246B2

    公开(公告)日:2009-11-24

    申请号:US12046359

    申请日:2008-03-11

    IPC分类号: G01B11/02 G01N21/00

    CPC分类号: G01N21/553 G01N21/45

    摘要: Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.

    摘要翻译: 公开了一种光学感测装置,其包括发光的光源; 分束器; SPR传感器单元,包括感测表面; 和检测机构; 以及转换单元,将第一光束和第二光束从光学装置转换为二维干涉条纹图案。 根据上述结构,可以得到SPR相位测定中的检测光束的额外的相移。 微分测量方法已经表明,实现了比基于SPR传感器的测量领域中现有技术可以获得的最佳结果明显更好的灵敏度图。

    OPTICAL SENSING DEVICES WITH SPR SENSORS BASED ON DIFFERENTIAL PHASE INTERROGATION AND MEASURING METHOD USING THE SAME
    4.
    发明申请
    OPTICAL SENSING DEVICES WITH SPR SENSORS BASED ON DIFFERENTIAL PHASE INTERROGATION AND MEASURING METHOD USING THE SAME 有权
    基于差分相位差的SPR传感器的光学传感器和使用该传感器的测量方法

    公开(公告)号:US20080304072A1

    公开(公告)日:2008-12-11

    申请号:US12046359

    申请日:2008-03-11

    IPC分类号: G01B9/02 G01N21/55

    CPC分类号: G01N21/553 G01N21/45

    摘要: Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.

    摘要翻译: 公开了一种光学感测装置,其包括发光的光源; 分束器; SPR传感器单元,包括感测表面; 和检测机构; 以及转换单元,将第一光束和第二光束从光学装置转换为二维干涉条纹图案。 根据上述结构,可以得到SPR相位测定中的检测光束的额外的相移。 微分测量方法已经表明,实现了比基于SPR传感器的测量领域中现有技术可以获得的最佳结果明显更好的灵敏度图。