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公开(公告)号：US20100027228A1
公开(公告)日：2010-02-04
申请号：US12510028
申请日：2009-07-27
Applicant: Kiyotaka TSUKADA , Toshihiro NOMURA , Daisuke MINOURA
Inventor： Kiyotaka TSUKADA , Toshihiro NOMURA , Daisuke MINOURA
CPC classification number: H05K1/145 , H01L24/01 , H01L24/25 , H01L2224/2518 , H01L2924/01322 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/14 , H01L2924/15787 , H01L2924/181 , H01L2924/351 , H05K1/0204 , H05K3/284 , H05K3/306 , H05K2201/096 , H05K2201/10166 , H05K2201/10303 , H05K2201/10424 , H05K2201/10643 , H05K2201/10871 , H05K2201/10946 , Y10T29/4913 , Y10T29/49153 , H01L2924/00
Abstract: A semiconductor device includes wiring boards each having an insulating board, conductor circuits and through-holes, the insulating board having top and bottom surfaces, the conductor circuits formed on the top and bottom surfaces, the through holes penetrating the insulating board and electrically connecting the conductor circuits of the top and bottom surfaces; conductor posts each having flange, head and leg portions, the flange portion having first and second surfaces and having an external diameter larger than that of the through-hole, the head portion protruding from the first surface, the leg portion protruding from the second surface; and electronic components each having an electrode formed on one or more surfaces and connected to the leg portion. The head portion is inserted until the first surface of the flange portion comes into contact with the bottom surface of the wiring board and electrically connected at an inner wall of the through-hole.
Abstract translation: 半导体器件包括各自具有绝缘板，导体电路和通孔的布线板，所述绝缘板具有顶表面和底表面，所述导体电路形成在顶表面和底表面上，所述通孔穿过绝缘板并电连接 顶表面和底表面的导体电路; 导体柱各自具有凸缘，头部和腿部，凸缘部分具有第一和第二表面，并且具有比通孔大的外径，头部从第一表面突出，腿部从第二表面突出 ; 以及各自具有形成在一个或多个表面上并连接到所述腿部的电极的电子部件。 插入头部直到凸缘部分的第一表面与布线板的底表面接触并且在通孔的内壁处电连接。
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公开(公告)号：US08378231B2
公开(公告)日：2013-02-19
申请号：US12510028
申请日：2009-07-27
Applicant: Kiyotaka Tsukada , Toshihiro Nomura , Daisuke Minoura
Inventor： Kiyotaka Tsukada , Toshihiro Nomura , Daisuke Minoura
IPC: H05K1/11
CPC classification number: H05K1/145 , H01L24/01 , H01L24/25 , H01L2224/2518 , H01L2924/01322 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/14 , H01L2924/15787 , H01L2924/181 , H01L2924/351 , H05K1/0204 , H05K3/284 , H05K3/306 , H05K2201/096 , H05K2201/10166 , H05K2201/10303 , H05K2201/10424 , H05K2201/10643 , H05K2201/10871 , H05K2201/10946 , Y10T29/4913 , Y10T29/49153 , H01L2924/00
Abstract: A semiconductor device includes wiring boards each having an insulating board, conductor circuits and through-holes, the insulating board having top and bottom surfaces, the conductor circuits formed on the top and bottom surfaces, the through holes penetrating the insulating board and electrically connecting the conductor circuits of the top and bottom surfaces; conductor posts each having flange, head and leg portions, the flange portion having first and second surfaces and having an external diameter larger than that of the through-hole, the head portion protruding from the first surface, the leg portion protruding from the second surface; and electronic components each having an electrode formed on one or more surfaces and connected to the leg portion. The head portion is inserted until the first surface of the flange portion comes into contact with the bottom surface of the wiring board and electrically connected at an inner wall of the through-hole.
Abstract translation: 半导体器件包括各自具有绝缘板，导体电路和通孔的布线板，所述绝缘板具有顶表面和底表面，所述导体电路形成在顶表面和底表面上，所述通孔穿过绝缘板并电连接 顶表面和底表面的导体电路; 导体柱各自具有凸缘，头部和腿部，凸缘部分具有第一和第二表面，并且具有比通孔大的外径，头部从第一表面突出，腿部从第二表面突出 ; 以及各自具有形成在一个或多个表面上并连接到所述腿部的电极的电子部件。 插入头部直到凸缘部分的第一表面与布线板的底表面接触并且在通孔的内壁处电连接。
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公开(公告)号：US20140090460A1
公开(公告)日：2014-04-03
申请号：US14122678
申请日：2012-03-07
Applicant: Takashi Yamakawa , Yasuhiro Ishii , Daisuke Minoura
Inventor： Takashi Yamakawa , Yasuhiro Ishii , Daisuke Minoura
CPC classification number: F01N9/002 , F01N9/007 , F01N11/002 , G01M15/106 , Y02T10/47
Abstract: A particulate collection filter state detection device according to the present invention includes first pressure detection means for detecting a first pressure produced at an upstream side of the filter on an exhaust gas flow path, second pressure detection means for detecting a second pressure produced at a downstream side of the filter on the exhaust gas flow path, first Fourier transformation means for applying Fourier transformation to a value of the first pressure detected by the first pressure detection means, second Fourier transformation means for applying Fourier transformation to a value of the second pressure detected by the second pressure detection means, comparison means for comparing a spectral intensity and/or a phase at a zero frequency and a spectral intensity and/or a phase at a predetermined frequency obtained by the first Fourier transformation means and a spectral intensity and/or a phase at a zero frequency and a spectral intensity and/or a phase at a predetermined frequency obtained by the second Fourier transformation means, and filter state determination means for determining a state of the filter based on a comparison result provided by the comparison means, so as to conduct determination of a state of a filter for collecting particulates in an exhaust gas at a good precision.
Abstract translation: 根据本发明的颗粒物收集过滤器状态检测装置包括：第一压力检测装置，用于检测在排气流路上的过滤器的上游侧产生的第一压力;第二压力检测装置，用于检测在下游产生的第二压力 在第一压力检测装置检测到的第一压力的值上进行傅立叶变换的第一傅里叶变换装置，用于将傅里叶变换应用于检测到的第二压力的值的第二傅里叶变换装置， 通过第二压力检测装置，比较装置，用于将零频率处的光谱强度和/或相位与由第一傅立叶变换装置获得的预定频率的光谱强度和/或相位和/或频谱强度和/或频谱强度和/或 在零频率处的相位和光谱强度和/或预成型条件下的相位 通过第二傅里叶变换装置得到的频率的滤波器状态，以及基于由比较装置提供的比较结果来确定滤波器的状态的滤波器状态确定装置，以便进行用于收集排气中的微粒的过滤器的状态的确定 天然气精度良好。
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公开(公告)号：US09322315B2
公开(公告)日：2016-04-26
申请号：US14122678
申请日：2012-03-07
Applicant: Takashi Yamakawa , Yasuhiro Ishii , Daisuke Minoura
Inventor： Takashi Yamakawa , Yasuhiro Ishii , Daisuke Minoura
CPC classification number: F01N9/002 , F01N9/007 , F01N11/002 , G01M15/106 , Y02T10/47
Abstract: A filter state detection device includes a first pressure detection part, a second pressure detection part, and a filter state determination part. The filter state determination part is configured to include an operation part and a storage part. The operation part is configured to apply Fourier transformation to each of values of first and second pressures to obtain first and second spectral intensities and/or phases at a zero frequency and first and second spectral intensities and/or phases at a predetermined frequency and configured to compare the first spectral intensity and/or phase at a zero frequency and the first spectral intensity and/or phase at the predetermined frequency as a first group against the second spectral intensity and/or phase at a zero frequency and the second spectral intensity and/or phase at the predetermined frequency as a second group to determine a state of a filter.
Abstract translation: 过滤状态检测装置包括第一压力检测部，第二压力检测部以及过滤状态判定部。 过滤状态确定部被配置为包括操作部和存储部。 操作部分被配置为对第一和第二压力的每个值应用傅里叶变换，以在零频率和/或在预定频率处的第一和第二频谱强度和/或相位获得第一和第二频谱强度和/或相位，并且被配置为 将零频率处的第一光谱强度和/或相位和在预定频率处的第一光谱强度和/或相位作为第一组抵抗零频率处的第二光谱强度和/或相位，并且将第二光谱强度和/ 或以预定频率的相位作为第二组，以确定滤波器的状态。
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