摘要:
A kit, apparatus and method are presented for use in measuring an optical property of a sample. The kit comprises at least one reference unit, having a reference surface of a directional emissivity of a certain value; and main and auxiliary chambers, each defining an optical window allowing passage of electromagnetic radiation therethrough. The main chamber is configured to define a region thereof for accommodating the reference unit and the sample, and is configured to screen this region from external radiation.