MICROBOLOMETER DETECTORS WITH OPTICAL ABSORBER STRUCTURES FOR DETECTION OF TERAHERTZ RADIATION

    公开(公告)号:US20240288310A1

    公开(公告)日:2024-08-29

    申请号:US18689981

    申请日:2021-09-14

    Abstract: A microbolometer pixel unit for detection of terahertz radiation includes a substrate, a thermistor structure, and an optical absorber structure. The thermistor structure includes a plurality of microbolometer pixels disposed on the substrate. Each pixel includes a thermistor platform suspended above the substrate, a thermistor support member holding the thermistor platform, and a thermistor disposed on the thermistor platform and having an electrical resistance that varies in accordance with a temperature of the thermistor. The optical absorber structure includes an absorber platform suspended above the thermistor structure, an absorber support member holding the absorber platform and including a plurality of support elements, each support element providing a thermal conduction path from the absorber platform to the thermistor platform of a respective one of the microbolometer pixels, and an optical absorber disposed on the absorber platform to absorb incoming terahertz radiation to generate heat to change the temperature of the thermistors.

    TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND ELECTRIC APPARATUS

    公开(公告)号:US20240280410A1

    公开(公告)日:2024-08-22

    申请号:US18570085

    申请日:2021-06-23

    CPC classification number: G01J5/0859 G01J2005/0077

    Abstract: A thermal image sensor to acquire a relative temperature and a temperature sensor to acquire an absolute temperature are provided in a space; a reference point is set at a position different from a temperature sensor installation position; and an absolute temperature of the reference point is estimated from a measurement value of the temperature sensor, a vertical component of a distance from the temperature sensor installation position to the reference point, a vertical component of a distance from the upper surface to the lower surface of the space, and a temperature coefficient of the space. A correction value is determined from the absolute temperature and relative temperature of the reference point, and an absolute temperature distribution is generated from the relative temperature distribution and the correction value. This allows a non-contact measurement of the absolute temperature of a measurement target with a simple configuration and without installation location restriction.

    Temperature detecting element and imaging apparatus

    公开(公告)号:US12061121B2

    公开(公告)日:2024-08-13

    申请号:US17278185

    申请日:2019-08-16

    CPC classification number: G01J5/48 H04N5/33 G01J2005/0077

    Abstract: There is provided a temperature detecting element that includes a light-collecting portion and a sensor portion. The light collecting portion is constituted by a first light-collecting portion to which infrared light is incident and a second light-collecting portion to which infrared light having been exited from the first light-collecting portion is incident. The sensor portion is a portion to which infrared light having been exited from the second light-collecting portion is incident. At least one of the first light-collecting portion and the second light-collecting portion is provided on a base that covers the temperature detecting element.

Patent Agency Ranking