公开(公告)号：US07416900B2

公开(公告)日：2008-08-26

申请号：US10285445

申请日：2002-11-01

Applicant: Andrew Eaton ,  Andrew Entwistle ,  Howard Read ,  Fadi Abou-Shakra

Inventor： Andrew Eaton ,  Andrew Entwistle ,  Howard Read ,  Fadi Abou-Shakra

IPC: G01N24/00

CPC classification number: G01N35/1097 ,  G01N1/14 ,  G01N1/38 ,  G01N2001/2893 ,  H01J49/04 ,  Y10T436/11 ,  Y10T436/24 ,  Y10T436/2575

Abstract: A sample introduction system includes at least two, and preferably three, syringe pumps. The flow rates of two of the syringe pumps are varied, while keeping the overall flow rate constant. The sample introduction system is preferably utilised in an analytical instrument, such as to determine the concentration of an analyte in a sample.

Abstract translation: 样品引入系统包括至少两个，优选三个注射泵。 两个注射泵的流速是不同的，同时保持总体流量恒定。 样品引入系统优选用于分析仪器中，例如确定样品中分析物的浓度。

公开(公告)号：US07434197B1

公开(公告)日：2008-10-07

申请号：US11262148

申请日：2005-10-28

Applicant: Christoph Dolainsky ,  Jonathan O. Burrows ,  Dennis Ciplickas ,  Joseph C. Davis ,  Rakesh Vallishayee ,  Howard Read ,  Larg. H. Weiland ,  Christopher Hess

Inventor： Christoph Dolainsky ,  Jonathan O. Burrows ,  Dennis Ciplickas ,  Joseph C. Davis ,  Rakesh Vallishayee ,  Howard Read ,  Larg. H. Weiland ,  Christopher Hess

IPC: G06F17/50

CPC classification number: G03F7/705

Abstract: A hot spot is identified within a mask layout design. The hot spot represents a local region of the mask layout design having one or more feature geometries susceptible to producing one or more fabrication deficiencies. A test structure is generated for the identified hot spot. The test structure is defined to emulate the one or more feature geometries susceptible to producing the one or more fabrication deficiencies. The test structure is fabricated on a test wafer using specified fabrication processes. The as-fabricated test structure is examined to identify one or more adjustments to either the feature geometries of the hot spot of the mask layout design or the specified fabrication processes, wherein the identified adjustments are capable of reducing the fabrication deficiencies.

Abstract translation: 在面罩布局设计中识别出热点。 热点表示具有容易产生一个或多个制造缺陷的一个或多个特征几何形状的面罩布局设计的局部区域。 为识别的热点产生测试结构。 测试结构被定义为模拟易于产生一个或多个制造缺陷的一个或多个特征几何形状。 使用特定的制造工艺在测试晶片上制造测试结构。 检查制造的测试结构以识别对于掩模布局设计或指定制造工艺的热点的特征几何形状的一个或多个调整，其中所识别的调整能够减少制造缺陷。

公开(公告)号：US07384604B2

公开(公告)日：2008-06-10

申请号：US10285509

申请日：2002-11-01

Applicant: Andrew Eaton ,  Andrew Entwistle ,  Howard Read ,  Fadi Abou-Shakra

Inventor： Andrew Eaton ,  Andrew Entwistle ,  Howard Read ,  Fadi Abou-Shakra

IPC: B01L3/02

CPC classification number: G01N35/1097 ,  G01N1/14 ,  G01N1/38 ,  G01N2001/2893 ,  H01J49/04 ,  Y10T436/11 ,  Y10T436/24 ,  Y10T436/2575

Abstract: A sample introduction system includes at least two, and preferably three, syringe pumps. The flow rates of two of the syringe pumps are varied, while keeping the overall flow rate constant. The sample introduction system is preferably utilized in an analytical instrument, such as to determine the concentration of an analyte in a sample.

Abstract translation: 样品引入系统包括至少两个，优选三个注射泵。 两个注射泵的流速是不同的，同时保持总体流量恒定。 样品引入系统优选用于分析仪器中，例如确定样品中分析物的浓度。