摘要:
In one embodiment of the invention, a semiconductor component includes a semiconductor substrate (110), a first dielectric layer (120) above the semiconductor substrate, a first ohmic contact region (410) and a second ohmic contact region (420) above the semiconductor substrate, a gate electrode (1120) above the semiconductor substrate and between the first ohmic contact region and the second ohmic contact region, a field plate (210) above the first dielectric layer and between the gate electrode and the second ohmic contact region, a second dielectric layer (310) above the field plate, the first dielectric layer, the first ohmic contact region, and the second ohmic contact region, and a third dielectric layer (910) between the gate electrode and the field plate and not located above the gate electrode or the field plate.
摘要:
A semiconductor structure includes a first semiconductor layer, a second semiconductor layer over the first semiconductor layer, a third semiconductor layer over the second semiconductor layer, and a fourth semiconductor layer over the third semiconductor layer. A first conductive portion is coupled to the first semiconductor layer, and a second conductive portion is formed over the first semiconductor layer.
摘要:
A semiconductor structure includes a first semiconductor layer, a second semiconductor layer over the first semiconductor layer, a third semiconductor layer over the second semiconductor layer, and a fourth semiconductor layer over the third semiconductor layer. A first conductive portion is coupled to the first semiconductor layer, and a second conductive portion is formed over the first semiconductor layer.
摘要:
A microwave field effect transistor (10) has a high conductivity gate (44) overlying a double heterojunction structure (14, 18, 22) that has an undoped channel layer (18). The heterojunction structure overlies a substrate (12). A recess layer that is a not intentionally doped (NID) layer (24) overlies the heterojunction structure and is formed with a predetermined thickness that minimizes impact ionization effects at an interface of a drain contact of source/drain ohmic contacts (30) and permits significantly higher voltage operation than previous step gate transistors. Another recess layer (26) is used to define a gate dimension. A Schottky gate opening (42) is formed within a step gate opening (40) to create a step gate structure. A channel layer (18) material of InxGa1−xAs is used to provide a region of electron confinement with improved transport characteristics that result in higher frequency of operation, higher power density and improved power-added efficiency.
摘要翻译:微波场效应晶体管(10)具有覆盖具有未掺杂沟道层(18)的双异质结结构(14,18,22)的高导电性栅极(44)。 异质结结构覆盖在基板(12)上。 作为非有意掺杂(NID)层(24)的凹陷层覆盖在异质结结构上并形成预定的厚度,使得在源极/漏极欧姆接触(30)的漏极接触的界面处的冲击电离效应最小化并允许 比上一级栅晶体管显着更高的电压操作。 另一个凹陷层(26)用于限定门尺寸。 肖特基门开口(42)形成在步进门开口(40)内以形成阶梯门结构。 使用In x Ga 1-x As的沟道层(18)材料来提供具有改善的传输特性的电子约束区域,这导致更高的操作频率,更高的功率密度和更好的功率附加效率。
摘要:
A bidirectional lateral insulated gate bipolar transistor (IGBT) includes two gate electrodes. The IGBT can conduct current in two directions. The IGBT relies on a double RESURF structure to provide high voltage blocking in both directions. The IGBT is symmetrical, having an N-type drift region in contact with an oxide layer. A P-type region is provided above the N-type drift region, having a portion more heavily doped with P-type dopants. The double RESURF structure can be provided by a buried oxide layer, a floating doped region, or a horizontal PN junction. The IGBT can be utilized in various power operations, including a matrix switch or a voltage source converter.