Field programmable gate array with program encryption
    1.
    发明授权
    Field programmable gate array with program encryption 失效
    具有程序加密的现场可编程门阵列

    公开(公告)号:US06351814B1

    公开(公告)日:2002-02-26

    申请号:US09358687

    申请日:1999-07-21

    IPC分类号: G06K1906

    摘要: A field programmable gate array (FPGA) and a decryption circuit are implemented within a common integrated circuit (IC) or within separate ICs enclosed within a common IC package. The decryption circuit decrypts an input FPGA program encrypted in accordance with a particular encryption key and then writes the decrypted FPGA program into the FPGA. Thus an FPGA program encrypted in accordance with a particular encryption key can be used to program only those FPGAs coupled with a decryption circuit capable of decoding the encrypted FPGA program in accordance with that particular encryption key. Since the decryption circuit and the FPGA are implemented in the same IC, or within the same IC package, the decrypted FPGA program the decryption circuit produces cannot be readily intercepted and copied.

    摘要翻译: 现场可编程门阵列(FPGA)和解密电路在公共集成电路(IC)内或在封装在公共IC封装内的单独的IC内实现。 解密电路解密根据特定加密密钥加密的输入FPGA程序,然后将解密的FPGA程序写入FPGA。 因此,可以使用根据特定加密密钥加密的FPGA程序来仅编程与根据该特定加密密钥解码加密的FPGA程序的解密电路耦合的那些FPGA。 由于解密电路和FPGA在相同的IC或相同的IC封装内实现,所以解密电路产生的解密的FPGA程序不容易被截取和复制。

    TIRE PRESSURE MONITORING SYSTEM HAVING A COLLAPSIBLE CASING
    2.
    发明申请
    TIRE PRESSURE MONITORING SYSTEM HAVING A COLLAPSIBLE CASING 有权
    轮胎压力监测系统具有可拆卸的外壳

    公开(公告)号:US20090079556A1

    公开(公告)日:2009-03-26

    申请号:US12135441

    申请日:2008-06-09

    IPC分类号: B60C23/00

    CPC分类号: B60C23/0425

    摘要: A tire pressure monitoring device and system includes a support or housing mounted to a rim of a wheel of a vehicle. A casing is movably secured to the support and a pair of spaced magnets are disposed within the casing. The casing is collapsible for varying the length of the casing in response to changes in the tire pressure to move the magnets relative to each other. A sensor is mounted a distance from the casing for sensing a presence of each of the magnets. A controller is in communication with the sensor to determine the length of the casing and the relative movement between the magnets to calculate any changes in tire pressure.

    摘要翻译: 轮胎压力监测装置和系统包括安装到车辆的车轮的轮辋上的支撑件或壳体。 壳体可移动地固定到支撑件上,并且一对间隔开的磁体设置在壳体内。 壳体可折叠以响应于轮胎压力的变化而改变壳体的长度以使磁体相对于彼此移动。 传感器与外壳安装一段距离,用于感测每个磁体的存在。 控制器与传感器通信以确定壳体的长度和磁体之间的相对运动,以计算轮胎压力的任何变化。

    Built-in spare row and column replacement analysis system for embedded memories
    3.
    发明授权
    Built-in spare row and column replacement analysis system for embedded memories 失效
    内置备用行和列替代分析系统,用于嵌入式存储器

    公开(公告)号:US06304989B1

    公开(公告)日:2001-10-16

    申请号:US09358689

    申请日:1999-07-21

    IPC分类号: G01R3128

    摘要: A built-in replacement analysis (BIRA) circuit allocates spare rows and columns of cells for replacing rows and columns of an array of memory cells in response to an input sequence of cell addresses, each identifying a row address and a column address of each defective cell of the cell array. The BIRA subsystem, including a row register corresponding each spare row and a column register corresponding to each spare column, responds to incoming cell addresses by writing their included row address into the row registers, by writing their column addresses into the column registers, and by writing link bits into the column registers. Each link bit links a row and a column register by storing row and column addresses of a defective cell. The BIRA subsystem also writes a “multiple cell” bit into each row register to indicate when the row address it stores includes more than one defective cell. The row and column addresses stored in these registers indicate the array rows and columns for which spare rows and columns are to be allocated. Each row and column register also includes a “permanent” bit the BIRA subsystem sets to indicate when the spare row or column allocation indicated by its stored row or column address is permanent. The BIRA subsystem efficiently allocates spare row and columns by manipulating the data stored in the row and column registers in response to a sequence of defective cell address.

    摘要翻译: 内置替换分析(BIRA)电路分配备用的行和列单元格,以响应于单元地址的输入序列替换存储器单元阵列的行和列,每个单元地址标识每个缺陷的行地址和列地址 单元格的单元格。 BIRA子系统包括对应于每个备用行的行寄存器和与每个备用列相对应的列寄存器,通过将其包含的行地址写入行寄存器,通过将其列地址写入列寄存器,并通过 将链接位写入列寄存器。 每个链接位通过存储有缺陷单元的行和列地址来链接行和列寄存器。 BIRA子系统还将“多单元”位写入每个行寄存器,以指示其存储的行地址何时包括多个有缺陷的单元。 存储在这些寄存器中的行和列地址指示要为其分配备用行和列的数组行和列。 每个行和列寄存器还包括BIRA子系统设置的“永久”位,以指示由其存储的行或列地址指示的备用行或列分配是永久的。 BIRA子系统通过响应于有缺陷的单元地址的顺序操纵存储在行和列寄存器中的数据来有效地分配备用行和列。

    Tire pressure monitoring system having a collapsible casing
    4.
    发明授权
    Tire pressure monitoring system having a collapsible casing 有权
    具有可折叠外壳的轮胎压力监测系统

    公开(公告)号:US07804396B2

    公开(公告)日:2010-09-28

    申请号:US12135441

    申请日:2008-06-09

    IPC分类号: B60C23/00

    CPC分类号: B60C23/0425

    摘要: A tire pressure monitoring device and system includes a support or housing mounted to a rim of a wheel of a vehicle. A casing is movably secured to the support and a pair of spaced magnets are disposed within the casing. The casing is collapsible for varying the length of the casing in response to changes in the tire pressure to move the magnets relative to each other. A sensor is mounted a distance from the casing for sensing a presence of each of the magnets. A controller is in communication with the sensor to determine the length of the casing and the relative movement between the magnets to calculate any changes in tire pressure.

    摘要翻译: 轮胎压力监测装置和系统包括安装到车辆的车轮的轮辋上的支撑件或壳体。 壳体可移动地固定到支撑件上,并且一对间隔开的磁体设置在壳体内。 壳体可折叠以响应于轮胎压力的变化而改变壳体的长度以使磁体相对于彼此移动。 传感器与外壳安装一段距离,用于感测每个磁体的存在。 控制器与传感器通信以确定壳体的长度和磁体之间的相对运动,以计算轮胎压力的任何变化。

    Partitionable embedded circuit test system for integrated circuit
    5.
    发明授权
    Partitionable embedded circuit test system for integrated circuit 失效
    集成电路分区嵌入式电路测试系统

    公开(公告)号:US06587979B1

    公开(公告)日:2003-07-01

    申请号:US09494824

    申请日:2000-01-31

    IPC分类号: G11C2900

    摘要: A flexible built-in self-test (BIST) circuit is incorporated into an integrated circuit (IC) for testing one or random access memories or other memories embedded in an integrated circuit regardless of the number, size or test requirements of the memories. Input data from a controller that may be conveniently partitioned among components internal and external to the IC, supplies data to the BIST circuit indicating the size of the embedded memories to be tested and selecting from among several modes of BIST operation.

    摘要翻译: 灵活的内置自检(BIST)电路被集成到集成电路(IC)中,用于测试嵌入在集成电路中的一个或随机存取存储器或其他存储器,而不管存储器的数量,尺寸或测试要求如何。 来自控制器的输入数据可以方便地在IC内部和外部的组件之间分配,向BIST电路提供数据,指示要测试的嵌入式存储器的大小,并从多种BIST操作模式中进行选择。