SCAN FLIP-FLOP AND SCAN TEST CIRCUIT INCLUDING THE SAME
    2.
    发明申请
    SCAN FLIP-FLOP AND SCAN TEST CIRCUIT INCLUDING THE SAME 有权
    扫描FLOP-FLOP和扫描测试电路,包括它们

    公开(公告)号:US20160097811A1

    公开(公告)日:2016-04-07

    申请号:US14873634

    申请日:2015-10-02

    CPC分类号: G01R31/318541 H03K3/35625

    摘要: A scan flip-flop includes an input unit and a flip-flop. The input unit is configured to select one signal from among a data input signal and a scan input signal to supply the selected one signal as an internal signal according to an operation mode. The flip-flop os configured to latch the internal signal according to a clock signal. The flip-flop includes a cross coupled structure that includes first and second tri-state inverters which share a first output node and face each other.

    摘要翻译: 扫描触发器包括输入单元和触发器。 输入单元被配置为从数据输入信号和扫描输入信号中选择一个信号,以根据操作模式将所选择的一个信号提供为内部信号。 触发器os被配置为根据时钟信号锁存内部信号。 触发器包括交叉耦合结构,其包括共享第一输出节点并彼此面对的第一和第二三态反相器。

    PROBE CARD AND MANUFACTURING METHOD THEREOF
    3.
    发明申请
    PROBE CARD AND MANUFACTURING METHOD THEREOF 审中-公开
    探针卡及其制造方法

    公开(公告)号:US20110221465A1

    公开(公告)日:2011-09-15

    申请号:US13128435

    申请日:2009-10-23

    申请人: Jae Ha Lee

    发明人: Jae Ha Lee

    摘要: A probe card and a manufacturing method thereof are provided. To manufacture the probe card, via holes for receiving probe pins are formed in a plate-shaped or block-shaped probe substrate, and the probe pins are simultaneously inserted into the via holes. Then the probe substrate is bonded onto a supportable board having a thermal expansion coefficient similar to that of a wafer, and the probe substrate is separated into individual parts each having a specific size that disallows a deviation in location of the probe pins from chip pads of the wafer in spite of thermal expansion of the probe substrate. Therefore, the probe card can be manufactured through a simpler and more cost-effective process while preventing a location deviation of the probe pins due to a difference in thermal expansion coefficient between the probe card and the wafer. The probe substrate and a main circuit board are electrically connected through connecting members passing through openings in the supportable board. The connecting members may be directly or indirectly connected to the main circuit board, and the probe substrate may be composed of first and second probe substrates.

    摘要翻译: 提供探针卡及其制造方法。 为了制造探针卡,在板状或块状探针基板上形成用于接收探针的通孔,同时将探针插入到通孔中。 然后将探针基板接合到具有与晶片的热膨胀系数相似的热膨胀系数的可支撑板上,并将探针基板分离成各自具有特定尺寸的单独部件,该尺寸不允许探针的位置偏离芯片焊盘 晶片尽管探针基板的热膨胀。 因此,可以通过更简单且更具成本效益的工艺来制造探针卡,同时防止由于探针卡和晶片之间的热膨胀系数的差异导致探针的位置偏差。 探针基板和主电路板通过穿过可支撑板中的开口的连接构件电连接。 连接构件可以直接或间接地连接到主电路板,并且探针衬底可以由第一和第二探针衬底构成。

    PROBE ASSEMBLY AND MANUFACTURING METHOD THEREOF
    4.
    发明申请
    PROBE ASSEMBLY AND MANUFACTURING METHOD THEREOF 失效
    探头组装及其制造方法

    公开(公告)号:US20100327896A1

    公开(公告)日:2010-12-30

    申请号:US12667128

    申请日:2008-04-21

    申请人: Jae Ha Lee

    发明人: Jae Ha Lee

    IPC分类号: G01R31/00

    摘要: A probe assembly has insertion holes formed in a base layer provided on a circuit board. Probe pins are inserted into the insertion holes and fixed by a conductive adhesive filled in the insertion holes. The probe pins can be arranged with small pitch without mechanically electrically interfering with neighboring pins using the insertion holes. Furthermore, the base layer is formed of a semiconductor material to prevent a problem caused by a difference in the coefficient of thermal expansion between the base layer and a wafer. Moreover, coplanarity and alignment accuracy of the probe pins can be improved using aligning mask layers or aligning mask in a process of manufacturing the probe assembly. In addition, probe assembly manufacturing time can be reduced by using a pin array frame into which a large number of probe pins are temporarily inserted.

    摘要翻译: 探针组件具有形成在设置在电路板上的基底层中的插入孔。 探针插入插入孔中,并通过填充在插入孔中的导电粘合剂固定。 探头引脚可以以小的间距布置,而不会使用插入孔与邻近的引脚进行机械电气干扰。 此外,基底层由半导体材料形成,以防止由基底层和晶片之间的热膨胀系数的差异引起的问题。 此外,可以在制造探针组件的过程中使用对准掩模层或对准掩模来改善探针的共面性和对准精度。 此外,可以通过使用临时插入大量探针的引脚阵列框架来减少探针组件制造时间。

    Electric outlet with rotatable receptacles
    5.
    发明授权
    Electric outlet with rotatable receptacles 失效
    带可旋转插座的电源插座

    公开(公告)号:US06750410B2

    公开(公告)日:2004-06-15

    申请号:US10189368

    申请日:2002-06-25

    申请人: Jae Ha Lee

    发明人: Jae Ha Lee

    IPC分类号: H01L2900

    摘要: An electric outlet with a plurality of individual switches and rotatable receptacles is provided for efficiently protecting against possible electric hazard and organizing electric extension cords. The electric outlet provides three kinds of rotatable receptacles rotating on a plan plane, vertical plane or both plan and vertical plane simultaneously. The electric outlet rotating simultaneously on a plan and vertical plane comprises a disk-type receptacle and a cylindrical-type receptacle. The disk-type receptacle comprises a top disk part, lower cylindrical body part and a pair of outer stoppers. The cylindrical type receptacle comprises a hollow part for inserting a disk type receptacle, an annular rim, a pair of inner stoppers and shafts. A protecting cover as a safety device installs on top of disk part for automatically blocking the slots. The assembled disk-type and cylindrical-type receptacle is installed to the rotatable electrical outlets. The various decorative electric outlets are also provided to apply thereof.

    摘要翻译: 提供具有多个单独的开关和可旋转的插座的电源插座,用于有效地防止可能的电气危险并组织电气延长线。 电源插座提供在平面,垂直平面或平面和垂直平面上同时旋转的三种可旋转插座。 在平面和垂直平面上同时旋转的电源插座包括盘形插座和圆柱形插座。 盘式容器包括顶盘部分,下圆柱形主体部分和一对外止动件。 圆筒形容器包括用于插入盘形容器,环形边缘,一对内部止动器和轴的中空部分。 作为安全装置的保护盖安装在磁盘部件的顶部,以自动阻塞插槽。 组装的盘形和圆柱形容器安装到可旋转的电源插座上。 还提供各种装饰电插座以应用它们。

    Power control apparatus
    6.
    发明授权
    Power control apparatus 失效
    电源控制装置

    公开(公告)号:US06329616B1

    公开(公告)日:2001-12-11

    申请号:US09655333

    申请日:2000-09-05

    申请人: Jae Ha Lee

    发明人: Jae Ha Lee

    IPC分类号: H01R2900

    摘要: A power control apparatus, for directing an electrical power from a power source to a selected electrical appliance, includes a switch box having a plurality of activating switches and a main switch for controlling the flow of power to the switches, a unit for supplying power connected directly to the switch box and to the main switch without any intervening electrical outlets, and a plurality of conductor lines, each connected individually within the switch box to a respective one of the plurality of the switches and extending from the switch box, the ends of the conductor lines having connecting holes for a direct connection to the electrical appliances without any intervening switches, the switches and conductor lines being integrally formed with the switch box.

    摘要翻译: 用于将来自电源的电力引导到所选择的电器的电力控制装置包括具有多个启动开关的开关盒和用于控制到开关的电力流的主开关,用于连接电力的单元 直接连接到开关盒和主开关而没有任何中间的电源插座,以及多个导体线,每个导体线分别在开关盒内分别连接到多个开关中的相应一个并且从开关盒延伸出来, 导体线具有用于直接连接到电器的连接孔,而没有任何中间开关,开关和导体线与开关盒一体形成。

    Bidirectional delay circuit and integrated circuit including the same
    7.
    发明授权
    Bidirectional delay circuit and integrated circuit including the same 有权
    双向延迟电路和集成电路包括相同

    公开(公告)号:US09571076B2

    公开(公告)日:2017-02-14

    申请号:US14877258

    申请日:2015-10-07

    摘要: A bidirectional delay circuit includes an input driving circuit and a delay switch circuit. The input driving circuit is connected between an input node and an intermediate node, and the input driving circuit amplifies an input signal received through the input node to generate an intermediate signal through the intermediate node. The delay switch circuit is connected between the intermediate node and a delay node, and the delay switch circuit delays both of rising edges and falling edges of the intermediate signal in response to a gate signal to generate a delay signal through the delay node. The gate signal may transition in response to the input signal.

    摘要翻译: 双向延迟电路包括输入驱动电路和延迟开关电路。 输入驱动电路连接在输入节点和中间节点之间,并且输入驱动电路放大通过输入节点接收的输入信号,以通过中间节点生成中间信号。 延迟开关电路连接在中间节点和延迟节点之间,并且延迟开关电路响应于门信号延迟中间信号的上升沿和下降沿,以通过延迟节点产生延迟信号。 门信号可以响应于输入信号而转变。

    BIDIRECTIONAL DELAY CIRCUIT AND INTEGRATED CIRCUIT INCLUDING THE SAME
    8.
    发明申请
    BIDIRECTIONAL DELAY CIRCUIT AND INTEGRATED CIRCUIT INCLUDING THE SAME 有权
    双向延迟电路和集成电路,包括它们

    公开(公告)号:US20160105166A1

    公开(公告)日:2016-04-14

    申请号:US14877258

    申请日:2015-10-07

    IPC分类号: H03K5/12 H03K17/687

    摘要: A bidirectional delay circuit includes an input driving circuit and a delay switch circuit. The input driving circuit is connected between an input node and an intermediate node, and the input driving circuit amplifies an input signal received through the input node to generate an intermediate signal through the intermediate node. The delay switch circuit is connected between the intermediate node and a delay node, and the delay switch circuit delays both of rising edges and falling edges of the intermediate signal in response to a gate signal to generate a delay signal through the delay node. The gate signal may transition in response to the input signal.

    摘要翻译: 双向延迟电路包括输入驱动电路和延迟开关电路。 输入驱动电路连接在输入节点和中间节点之间,并且输入驱动电路放大通过输入节点接收的输入信号,以通过中间节点生成中间信号。 延迟开关电路连接在中间节点和延迟节点之间,并且延迟开关电路响应于门信号延迟中间信号的上升沿和下降沿,以通过延迟节点产生延迟信号。 门信号可以响应于输入信号而转变。

    Probe assembly and manufacturing method thereof
    9.
    发明授权
    Probe assembly and manufacturing method thereof 失效
    探头组装及其制造方法

    公开(公告)号:US08330481B2

    公开(公告)日:2012-12-11

    申请号:US12667128

    申请日:2008-04-21

    申请人: Jae Ha Lee

    发明人: Jae Ha Lee

    IPC分类号: G01R31/00

    摘要: A probe assembly has insertion holes formed in a base layer provided on a circuit board. Probe pins are inserted into the insertion holes and fixed by a conductive adhesive filled in the insertion holes. The probe pins can be arranged with small pitch without mechanically electrically interfering with neighboring pins using the insertion holes. Furthermore, the base layer is formed of a semiconductor material to prevent a problem caused by a difference in the coefficient of thermal expansion between the base layer and a wafer. Moreover, coplanarity and alignment accuracy of the probe pins can be improved using aligning mask layers or aligning mask in a process of manufacturing the probe assembly. In addition, probe assembly manufacturing time can be reduced by using a pin array frame into which a large number of probe pins are temporarily inserted.

    摘要翻译: 探针组件具有形成在设置在电路板上的基底层中的插入孔。 探针插入插入孔中,并通过填充在插入孔中的导电粘合剂固定。 探头引脚可以以小的间距布置,而不会使用插入孔与邻近的引脚进行机械电气干扰。 此外,基底层由半导体材料形成,以防止由基底层和晶片之间的热膨胀系数的差异引起的问题。 此外,可以在制造探针组件的过程中使用对准掩模层或对准掩模来改善探针的共面性和对准精度。 此外,可以通过使用临时插入大量探针的引脚阵列框架来减少探针组件制造时间。