公开(公告)号：US20130027067A1

公开(公告)日：2013-01-31

申请号：US13560233

申请日：2012-07-27

申请人： Rodney E. Schwartz ,  Steve Clauter ,  David Lohr ,  Gary Rogers ,  James Baggiore

发明人： Rodney E. Schwartz ,  Steve Clauter ,  David Lohr ,  Gary Rogers ,  James Baggiore

IPC分类号： G01R31/00

CPC分类号： G01R31/2621 ,  G01R31/025

摘要： A device and method for limiting damage to a semiconductor device under test when the semiconductor device fails during a high current, or high power test is provided. The occurrence of a failure of the device under test is detected, and power applied to the semiconductor device is diverted through a parallel path element upon detection of failure of the semiconductor device.

摘要翻译： 提供了在高电流或高功率测试期间当半导体器件故障时限制对被测半导体器件的损坏的装置和方法。 检测到被测器件发生故障，并且在检测到半导体器件的故障时，施加到半导体器件的功率被转移通过并行路径元件。

公开(公告)号：US09759763B2

公开(公告)日：2017-09-12

申请号：US13560233

申请日：2012-07-27

申请人： Rodney E. Schwartz ,  Steve Clauter ,  David Lohr ,  Gary Rogers ,  James Baggiore

发明人： Rodney E. Schwartz ,  Steve Clauter ,  David Lohr ,  Gary Rogers ,  James Baggiore

IPC分类号： G01R1/067 ,  G01R1/36 ,  G01R31/12 ,  G01R31/27 ,  G01R31/28 ,  G01R31/26 ,  G01R31/02

CPC分类号： G01R31/2621 ,  G01R31/025

摘要： A device and method for limiting damage to a semiconductor device under test when the semiconductor device fails during a high current, or high power test is provided. The occurrence of a failure of the device under test is detected, and power applied to the semiconductor device is diverted through a parallel path element upon detection of failure of the semiconductor device.