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56 条记录 (耗时 0.038 秒)

    Probe needle protection method for high current probe testing of power devices
    3.
    发明授权
    Probe needle protection method for high current probe testing of power devices 有权
    用于电力设备大电流探头测试的探针针保护方法

    公开(公告)号：US07521947B2

    公开(公告)日：2009-04-21

    申请号：US11752526

    申请日：2007-05-23

    申请人： Gary Rogers ,  Steve Clauter ,  Rodney Schwartz ,  Taichi Ukai ,  Joe Lambright ,  Dave Lohr

    发明人： Gary Rogers ,  Steve Clauter ,  Rodney Schwartz ,  Taichi Ukai ,  Joe Lambright ,  Dave Lohr

    IPC分类号： G01R31/02 ,  G01R31/26 ,  G01R1/00

    CPC分类号： G01R1/36 ,  G01R1/06766 ,  G01R31/2886

    摘要： A test system, apparatus and method for applying high current test stimuli to a semiconductor device in wafer or chip form includes a plurality of probes for electrically coupling to respective contact points on the semiconductor device, a plurality of current limiters electrically coupled to respective ones of the plurality of probes, and a current sensor electrically coupled to the plurality of probes. The current limiters are operative to limit current flow passing through a respective probe, and the current sensor is operative to provide a signal when detected current in any contact of the plurality of probes exceeds a threshold level.

    摘要翻译： 用于以晶圆或芯片形式将高电流测试刺激应用于半导体器件的测试系统，设备和方法包括用于电耦合到半导体器件上的相应接触点的多个探针，多个限流器电耦合到 所述多个探针和电耦合到所述多个探针的电流传感器。 电流限制器用于限制通过相应探针的电流，并且当多个探针的任何接触中的检测电流超过阈值水平时，电流传感器可操作以提供信号。

    PROBE NEEDLE PROTECTION METHOD FOR HIGH CURRENT PROBE TESTING OF POWER DEVICES
    4.
    发明申请
    PROBE NEEDLE PROTECTION METHOD FOR HIGH CURRENT PROBE TESTING OF POWER DEVICES 有权
    用于电力设备高电流探测测试的探头针保护方法

    公开(公告)号：US20080290882A1

    公开(公告)日：2008-11-27

    申请号：US11752526

    申请日：2007-05-23

    申请人： Gary Rogers ,  Steve Clauter ,  Rodney Schwartz ,  Taichi Ukai ,  Joe Lambright ,  Dave Lohr

    发明人： Gary Rogers ,  Steve Clauter ,  Rodney Schwartz ,  Taichi Ukai ,  Joe Lambright ,  Dave Lohr

    IPC分类号： G01R31/02 ,  G01R1/067

    CPC分类号： G01R1/36 ,  G01R1/06766 ,  G01R31/2886

    摘要： A test system, apparatus and method for applying high current test stimuli to a semiconductor device in wafer or chip form includes a plurality of probes for electrically coupling to respective contact points on the semiconductor device, a plurality of current limiters electrically coupled to respective ones of the plurality of probes, and a current sensor electrically coupled to the plurality of probes. The current limiters are operative to limit current flow passing through a respective probe, and the current sensor is operative to provide a signal when detected current in any contact of the plurality of probes exceeds a threshold level.

    摘要翻译： 用于以晶圆或芯片形式将高电流测试刺激应用于半导体器件的测试系统，设备和方法包括用于电耦合到半导体器件上的相应接触点的多个探针，多个限流器电耦合到 所述多个探针和电耦合到所述多个探针的电流传感器。 电流限制器用于限制通过相应探针的电流，并且当多个探针的任何接触中的检测电流超过阈值水平时，电流传感器可操作以提供信号。

    High Current Kelvin Connections and Contact Resistance Verification Method
    5.
    发明申请
    High Current Kelvin Connections and Contact Resistance Verification Method 审中-公开
    高电流开尔文连接和接触电阻验证方法

    公开(公告)号：US20110309847A1

    公开(公告)日：2011-12-22

    申请号：US13090771

    申请日：2011-04-20

    申请人： Rodney Schwartz ,  Gary Rogers ,  Steve Clauter

    发明人： Rodney Schwartz ,  Gary Rogers ,  Steve Clauter

    IPC分类号： G01R27/08

    CPC分类号： G01R1/06794 ,  G01R27/205

    摘要： A method and circuit is provided for implementing high current capability Kelvin connections and measuring the resistance of the contacts and connections to verify that the conducting path is capable of carrying the high current without damage or degraded performance. Included as well is the means and circuit for efficiently dividing a high current test stimulus current into 2 or more paths with low losses and voltage drops.

    摘要翻译： 提供了一种用于实现高电流能力开尔文连接并测量触点和连接的电阻以验证导电路径能够承受高电流而不损坏或降低的性能的方法和电路。 还包括用于将高电流测试激励电流有效地分成具有低损耗和电压降的2个或更多个路径的装置和电路。