公开(公告)号：US07368930B2

公开(公告)日：2008-05-06

申请号：US11464593

申请日：2006-08-15

申请人： Eric D. Hobbs ,  Christopher D. McCoy ,  James M. Porter, Jr. ,  Alexander H. Slocum

发明人： Eric D. Hobbs ,  Christopher D. McCoy ,  James M. Porter, Jr. ,  Alexander H. Slocum

IPC分类号： G01R31/02

CPC分类号： G01R31/2891 ,  G01R31/31905

摘要： A probe card assembly can comprise a support structure to which a plurality of probes can be directly or indirectly attached. The probes can be disposed to contact an electronic device to be tested. The probe card assembly can further comprise actuators, which can be configured to change selectively an attitude of the support structure with respect to a reference structure. The probe card assembly can also comprise a plurality of lockable compliant structures. While unlocked, the lockable compliant structures can allow the support structure to move with respect to the reference structure. While locked, however, the compliant structures can provide mechanical resistance to movement of the support structure with respect to the reference structure.

摘要翻译： 探针卡组件可以包括支撑结构，多个探针可以直接或间接附接到支撑结构。 可以将探针设置成接触要测试的电子设备。 探针卡组件还可以包括致动器，其可以被配置为相对于参考结构选择性地改变支撑结构的姿态。 探针卡组件还可以包括多个可锁定的柔顺结构。 当解锁时，可锁定的柔性结构可以允许支撑结构相对于参考结构移动。 然而，当锁定时，柔性结构可以提供对支撑结构相对于参考结构的移动的机械阻力。

公开(公告)号：US20100039133A1

公开(公告)日：2010-02-18

申请号：US12191083

申请日：2008-08-13

申请人： Andrew Weston McFarland ,  Brandon Liew ,  James M. Porter, JR. ,  Kevin Youl Yasumura

发明人： Andrew Weston McFarland ,  Brandon Liew ,  James M. Porter, JR. ,  Kevin Youl Yasumura

IPC分类号： G01R1/073

CPC分类号： G01R31/2891 ,  G01R1/07342

摘要： A probe card assembly includes a first probe head having contact elements disposed on a respective surface for forming electrical contacts with corresponding terminals of corresponding electronic devices, a second probe head having contact elements disposed on a respective surface for forming electrical contacts with corresponding terminals of corresponding electronic devices, and a controlling mechanism coupled to the first and second probe heads for controlling movement of the first and second probe heads in a first direction substantially parallel to the respective surfaces more than in a second direction substantially normal to the respective surfaces.

摘要翻译： 探针卡组件包括第一探针头，其具有设置在相应表面上的接触元件，用于与对应的电子器件的相应端子形成电触点;第二探针头，其具有设置在相应表面上的接触元件，用于与对应的端子相应的端子形成电触头 电子设备和耦合到第一和第二探针头的控制机构，用于控制第一和第二探头在基本上平行于相应表面的第一方向上比基本上垂直于各个表面的第二方向更大的运动。