Method and apparatus for repairing a shorted tunnel device
    2.
    发明授权
    Method and apparatus for repairing a shorted tunnel device 失效
    修理短路隧道装置的方法和装置

    公开(公告)号:US07505337B2

    公开(公告)日:2009-03-17

    申请号:US11330493

    申请日:2006-01-12

    IPC分类号: G11C29/00

    CPC分类号: G11C11/16

    摘要: A method for repairing a shorted tunnel device includes the step of applying a stressing signal to the tunnel device. The stressing signal has an amplitude that is greater than an amplitude of a bias signal applied to the device during normal operation. One or more characteristics of the stressing signal are selected so as to substantially optimize a repair of the device. The amplitude and/or the duration of the stressing signal are preferably selected so as to remove a conductive filament shorting the device via a thermal mechanism (e.g., heating).

    摘要翻译: 用于修复短路隧道装置的方法包括将应力信号施加到隧道装置的步骤。 应力信号的幅度大于在正常操作期间施加到装置的偏置信号的幅度。 选择应力信号的一个或多个特征,以便基本上优化装置的修复。 优选地选择应力信号的振幅和/或持续时间,以便去除通过热机构(例如,加热)使器件短路的导电丝。

    Method and apparatus for increasing yield in a memory circuit
    5.
    发明授权
    Method and apparatus for increasing yield in a memory circuit 有权
    用于增加存储器电路中的产量的方法和装置

    公开(公告)号:US07352639B2

    公开(公告)日:2008-04-01

    申请号:US11741030

    申请日:2007-04-27

    IPC分类号: G11C29/00

    摘要: Apparatus for repairing one or more shorted memory cells in a memory circuit includes control circuitry. The control circuitry is operative in one of at least a first mode and a second mode. In the first mode, the control circuitry is operative to apply a first signal to a selected memory cell in the memory circuit for reading a logic state of the selected memory cell and to determine whether or not the selected memory cell is shorted. In the second mode, the control circuitry is operative to apply a second signal to a selected memory cell which has been determined to be shorted for initiating a repair of the selected memory cell, the second signal being greater in magnitude than the first signal.

    摘要翻译: 用于修复存储器电路中的一个或多个短路存储器单元的装置包括控制电路。 控制电路在至少第一模式和第二模式之一中操作。 在第一模式中,控制电路可操作以将第一信号施加到存储器电路中的选定存储单元,以读取所选存储单元的逻辑状态,并确定所选存储单元是否短路。 在第二模式中,控制电路可操作以将第二信号施加到所选择的存储器单元,所选择的存储单元已被确定为短路以用于启动所选存储单元的修复,第二信号的幅度大于第一信号。

    Method and apparatus for increasing yield in a memory circuit
    6.
    发明授权
    Method and apparatus for increasing yield in a memory circuit 有权
    用于增加存储器电路中的产量的方法和装置

    公开(公告)号:US07260004B2

    公开(公告)日:2007-08-21

    申请号:US11330492

    申请日:2006-01-12

    IPC分类号: G11C29/00

    摘要: Apparatus for repairing one or more shorted memory cells in a memory circuit includes control circuitry. The control circuitry is operative in one of at least a first mode and a second mode. In the first mode, the control circuitry is operative to apply a first signal to a selected memory cell in the memory circuit for reading a logic state of the selected memory cell and to determine whether or not the selected memory cell is shorted. In the second mode, the control circuitry is operative to apply a second signal to a selected memory cell which has been determined to be shorted for initiating a repair of the selected memory cell, the second signal being greater in magnitude than the first signal.

    摘要翻译: 用于修复存储器电路中的一个或多个短路存储器单元的装置包括控制电路。 控制电路在至少第一模式和第二模式之一中操作。 在第一模式中,控制电路可操作以将第一信号施加到存储器电路中的选定存储单元,以读取所选存储单元的逻辑状态,并确定所选存储单元是否短路。 在第二模式中,控制电路可操作以将第二信号施加到所选择的存储器单元,所选择的存储单元已被确定为短路以用于启动所选存储单元的修复,第二信号的幅度大于第一信号。