摘要:
A semiconductor device according to example embodiments that may include an on-die termination (ODT) control circuit having a pipe line structure which changes in response to a frequency of a clock signal and a termination resistance generator for generating termination resistance in response to a termination resistance control signal.
摘要:
A semiconductor device according to example embodiments that may include an on-die termination (ODT) control circuit having a pipe line structure which changes in response to a frequency of a clock signal and a termination resistance generator for generating termination resistance in response to a termination resistance control signal.
摘要:
An output impedance control circuit of a semiconductor device. A first transistor is connected to a pad and a level controller controls a gate voltage of the first transistor in response to a voltage of the pad and a reference voltage. A MOS array is connected between the pad and a power supply voltage and supplies current to the pad in response to an impedance control code. A first control circuit generates the impedance control code in response to whether a voltage of the pad is converging to the reference voltage. A second control circuit controls a pull-up impedance of the output buffer circuit in response to the first impedance control code when a voltage of the pad is converging to the reference voltage.
摘要:
Embodiments of the invention provide a column address strobe (CAS) latency circuit that generates a stable latency signal in a high-speed semiconductor memory device, and a semiconductor memory device including the CAS latency circuit. The CAS latency circuit may include an internal read command signal generator and a latency clock generator coupled to a latency signal generator. In an embodiment of the invention, the latency signal generator outputs a stable latency signal by shifting an internal read signal output from the internal read command signal generator based on latency control clocks output from the latency clock generator.
摘要:
Embodiments of the invention provide a column address strobe (CAS) latency circuit that generates a stable latency signal in a high-speed semiconductor memory device, and a semiconductor memory device including the CAS latency circuit. The CAS latency circuit may include an internal read command signal generator and a latency clock generator coupled to a latency signal generator. In an embodiment of the invention, the latency signal generator outputs a stable latency signal by shifting an internal read signal output from the internal read command signal generator based on latency control clocks output from the latency clock generator.