Jitter measurement algorithm using locally in-order strobes
    2.
    发明申请
    Jitter measurement algorithm using locally in-order strobes 有权
    使用本地按顺序选通的抖动测量算法

    公开(公告)号:US20070118315A1

    公开(公告)日:2007-05-24

    申请号:US11271507

    申请日:2005-11-10

    IPC分类号: G01R29/26

    CPC分类号: G01R31/31709

    摘要: A method of jitter measurement is provided and includes sampling a device-under-test (DUT) output signal, having a repeating pattern, using an asynchronous clock over a desired period of time and mapping the samples onto a single period of the repeating pattern. Each period of the repeating pattern is sampled at least twice. A sampling frequency of the asynchronous clock is based on user inputs. Sampling the DUT signal comprises capturing logical state information representing each edge of a single period of the DUT signal at least once. The method further includes, separating the samples into subsets and mapping the sample subsets onto a single period of the repeating pattern wherein the samples within a particular subset are mapped to a set of times which are in the same order as in which the samples were obtained, processing the samples within each subset independently of samples in other subsets, and combining results of the processed subsets and processing the combined results of the subsets.

    摘要翻译: 提供抖动测量的方法,并且包括在期望的时间段内使用异步时钟对具有重复模式的测试器件(DUT)输出信号进行采样,并将样本映射到重复模式的单个周期。 重复图案的每个周期至少采样两次。 异步时钟的采样频率基于用户输入。 对DUT信号进行采样包括至少一次捕获表示DUT信号的单个周期的每个边缘的逻辑状态信息。 该方法还包括:将样本分成子集并将样本子集映射到重复模式的单个周期,其中特定子集内的样本被映射到与获得样本的顺序相同的一组时间 ,独立于其他子集中的样本处理每个子集中的样本,以及组合经处理子集的结果并处理子集的组合结果。

    Apparatus and method for testing non-deterministic device data
    3.
    发明授权
    Apparatus and method for testing non-deterministic device data 有权
    用于测试非确定性设备数据的装置和方法

    公开(公告)号:US06990423B2

    公开(公告)日:2006-01-24

    申请号:US10606971

    申请日:2003-06-25

    IPC分类号: G02F3/00

    摘要: Automatic test equipment for testing non-deterministic packet data from a device-under-test is disclosed. The automatic test equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test. A data validation circuit is coupled to the receiver for validating non-deterministic packet data based on the expected packet data from the vector memory.

    摘要翻译: 公开了用于测试来自被测设备的非确定性分组数据的自动测试设备。 自动测试设备包括用于存储预期分组数据的存储器和用于从被测器件接收分组数据的接收器。 数据验证电路耦合到接收机,用于基于来自向量存储器的预期分组数据验证非确定性分组数据。

    Jitter measurement algorithm using locally in-order strobes
    4.
    发明授权
    Jitter measurement algorithm using locally in-order strobes 有权
    使用本地按顺序选通的抖动测量算法

    公开(公告)号:US07668235B2

    公开(公告)日:2010-02-23

    申请号:US11271507

    申请日:2005-11-10

    IPC分类号: H04B3/46 H04B17/00 H04Q1/20

    CPC分类号: G01R31/31709

    摘要: A method of jitter measurement is provided and includes sampling a device-under-test (DUT) output signal, having a repeating pattern, using an asynchronous clock over a desired period of time and mapping the samples onto a single period of the repeating pattern. Each period of the repeating pattern is sampled at least twice. A sampling frequency of the asynchronous clock is based on user inputs. Sampling the DUT signal comprises capturing logical state information representing each edge of a single period of the DUT signal at least once. The method further includes, separating the samples into subsets and mapping the sample subsets onto a single period of the repeating pattern wherein the samples within a particular subset are mapped to a set of times which are in the same order as in which the samples were obtained, processing the samples within each subset independently of samples in other subsets, and combining results of the processed subsets and processing the combined results of the subsets.

    摘要翻译: 提供抖动测量的方法,并且包括在期望的时间段内使用异步时钟对具有重复模式的测试器件(DUT)输出信号进行采样,并将样本映射到重复模式的单个周期。 重复图案的每个周期至少采样两次。 异步时钟的采样频率基于用户输入。 对DUT信号进行采样包括至少一次捕获表示DUT信号的单个周期的每个边缘的逻辑状态信息。 该方法还包括:将样本分成子集并将样本子集映射到重复模式的单个周期,其中特定子集内的样本被映射到与获得样本的顺序相同的一组时间 ,独立于其他子集中的样本处理每个子集中的样本,以及组合经处理子集的结果并处理子集的组合结果。