-
公开(公告)号:US06198531B1
公开(公告)日:2001-03-06
申请号:US08891577
申请日:1997-07-11
IPC分类号: G01D300
CPC分类号: G01N21/274 , G01J3/28 , G01N21/31 , G01N2021/3196
摘要: An optical analysis system includes an optical filter mechanism disposed to receive light from a light source and configured to optically compress data carried by the light into at least one orthogonal component of the light. A detector mechanism in operative communication with the optical filter mechanism measures a property of the at least one orthogonal component to measure the data.
摘要翻译: 光学分析系统包括滤光器机构,其设置成接收来自光源的光,并被配置为将由光携带的数据光学地压缩成光的至少一个正交分量。 与光学滤波器机构可操作地通信的检测器机构测量至少一个正交分量的特性以测量数据。
-
公开(公告)号:US06980716B1
公开(公告)日:2005-12-27
申请号:US10112006
申请日:2002-03-29
申请人: Rodolfo E. Diaz , Ampere A. Tseng , Karl S. Booksh , Jose Menendez , Sethuraman Panchanathan , Michael Wagner
发明人: Rodolfo E. Diaz , Ampere A. Tseng , Karl S. Booksh , Jose Menendez , Sethuraman Panchanathan , Michael Wagner
IPC分类号: G01N21/45 , G01N21/956 , G02B6/122 , G02B6/42
CPC分类号: B82Y15/00 , B82Y20/00 , G01N21/453 , G01N21/956 , G02B6/1226
摘要: Methods and apparatus for gathering image information from nanostructures includes a composite waveguide of conductive nanoparticles in a dielectric medium. The waveguide is irradiated with preferably coherent blue light to form a slow surface wave. The evanescent wave that is the “tail” of the surface wave exists outside the waveguide contiguous to its surface. The nanostructures are located to encounter the evanescent wave. The slowing of the wave that occurs in the waveguide reduces the wave's speed and wavelength sufficiently such that nanostructures can be imaged. Upon encountering the evanescent wave, the nanostructures radiate. This radiation causes a backward scattering from the structures and a forward perturbation of the wavefront of the surface wave. From the scattering and perturbation information about the physical characteristics of the nanostructures sufficient to form an image is derived.
摘要翻译: 用于从纳米结构收集图像信息的方法和装置包括介电介质中的导电纳米颗粒的复合波导。 用优选的相干蓝光照射波导以形成缓慢的表面波。 作为表面波的“尾”的ev逝波存在于与其表面相邻的波导的外侧。 纳米结构位于遇到ev逝波。 在波导中发生的波的减慢使得波的速度和波长充分地降低,使得可以对纳米结构进行成像。 当遇到ev逝波时,纳米结构辐射。 这种辐射导致结构的反向散射和表面波的波前的向前扰动。 从散射和扰动信息得到关于形成图像的纳米结构的物理特征。
-
3.
公开(公告)号:US07281857B2
公开(公告)日:2007-10-16
申请号:US10558021
申请日:2004-05-28
CPC分类号: G02B6/3894 , G01N21/553 , G02B6/3816 , G02B6/3833 , G02B6/3861 , G02B6/4248
摘要: A device for connecting optical components of a fiber optic probe and a jumper in a Surface Plasmon Resonator (SPR) has two high-pressure-liquid-chromatography (HPLC) polyetheretherketone (PEEK) connectors, one containing the optical fibers from a probe and the other containing optical fibers which link to a detector and a light source. A method of joining a probe's distal end to a jumper, with at least two fibers or a multimode fiber connected to a light source and to a detection apparatus, has the steps of covering the distal end of the probe with a plastic sleeve, placing the sleeved distal end into a PEEK connector, trimming the distal end of the probe to be even with the edge of the PEEK connection, and connecting the PEEK connector with the jumper.
摘要翻译: 用于连接表面等离子体共振器(SPR)中的光纤探针和跳线的光学部件的装置具有两个高压液相色谱(HPLC)聚醚醚酮(PEEK)连接器,一个包含来自探针的光纤和 连接到检测器和光源的其它容纳光纤。 将探头的远端连接到跳线的方法,其中至少两根纤维或连接到光源和检测装置的多模光纤具有用塑料套覆盖探头的远端的步骤, 袖子末端插入PEEK连接器,用PEEK连接边缘修剪探头的远端,使PEEK连接器与跳线连接。
-
-