Sensor and methods for measuring select components in sheetmaking systems
    7.
    发明授权
    Sensor and methods for measuring select components in sheetmaking systems 有权
    用于测量制片系统中选择组件的传感器和方法

    公开(公告)号:US07321425B2

    公开(公告)日:2008-01-22

    申请号:US11018167

    申请日:2004-12-20

    申请人: Frank M. Haran

    发明人: Frank M. Haran

    IPC分类号: G01J3/28 G01J3/06 G01J5/02

    摘要: A sensor for measuring at least selected component in a composition can include: (a) a broadband light source, (b) an acousto-optic tunable filter (AOTF), (c) means for generating a beam of light from the light source and directing the beam of light at the AOTF wherein the AOTF is tuned to pass detection light having a desired wavelength range to detect the presence of the at least one component in the composition, (d) means for directing the detection light of known wavelength to the composition, (e) detection means for receiving light that emerges from the composition, and (f) a control signal generator configured to provide the AOTF with at least one desired wavelength range that is characteristic of the least one component in the composition. As an example, the sensor can be used to measure the thickness of optically transparent films.

    摘要翻译: 用于测量组合物中的至少所选组分的传感器可以包括:(a)宽带光源,(b)声光可调滤波器(AOTF),(c)用于产生来自光源的光束的装置, 在AOTF处引导光束,其中AOTF被调谐以通过具有期望波长范围的检测光,以检测组合物中至少一个成分的存在,(d)用于将已知波长的检测光引导到 组成,(e)用于接收从组合物出射的光的检测装置,以及(f)配置为向AOTF提供组合物中至少一个组分特征的至少一个所需波长范围的控制信号发生器。 作为示例,传感器可用于测量光学透明膜的厚度。

    PREPARATION METHOD FOR PREPARING SPECTROMETRIC DETERMINATIONS OF AT LEAST ONE MEASURAND IN A TARGET APPLICATION

    公开(公告)号:US20230194416A1

    公开(公告)日:2023-06-22

    申请号:US18069138

    申请日:2022-12-20

    IPC分类号: G01N21/31 G01N21/27

    摘要: A preparation method for preparing spectrometric determinations of a measurand in a target application using a spectrometer is provided. On the basis of reference data recorded in the target application, a normalized measurand master spectrum with a spectral distribution characteristic of the measurand is determined. On the basis of the measurand master spectrum, synthetic spectra are generated which cover a value range greater than or equal to a value range covered by the reference values. On the basis of the synthetic spectra, information for carrying out the spectrometric determinations, including information comprising a property, a wavelength range, and/or a path length range for an optical path length suitable for carrying out the spectrometric determinations, and/or comprising a calculation rule, with which, on the basis of measurement spectra in the target application, measured values of the measurand are determined.