Self test method and apparatus for identifying partially defective memory
    1.
    发明申请
    Self test method and apparatus for identifying partially defective memory 失效
    用于识别部分缺陷记忆的自检方法和装置

    公开(公告)号:US20060156130A1

    公开(公告)日:2006-07-13

    申请号:US11008371

    申请日:2004-12-09

    IPC分类号: G01R31/28

    摘要: A computing system is provided which includes a processor having a cache memory. The cache memory includes a plurality of independently configurable subdivisions, each subdivision including a memory array. A service element (SE) of the computing system is operable to cause a built-in-self-test (BIST) to be executed to test the cache memory, the BIST being operable to determine whether any of the subdivisions is defective. When it is determined that one of the subdivisions of the cache memory determined defective by the BIST is non-repairable, the SE logically deletes the defective subdivision from the system configuration, and the SE is operable to permit the processor to operate without the logically deleted subdivision. The SE is further operable to determine that the processor is defective when a number of the defective subdivisions exceeds a threshold.

    摘要翻译: 提供了一种包括具有高速缓存存储器的处理器的计算系统。 高速缓冲存储器包括多个可独立配置的子部分,每个细分包括存储器阵列。 计算系统的服务元素(SE)可操作以执行内置自检(BIST)以测试高速缓冲存储器,BIST可操作以确定任何子细分是否有缺陷。 当确定由BIST确定为有缺陷的高速缓冲存储器的一个细分是不可修复时,SE从系统配置逻辑地删除缺陷细分,并且SE可操作以允许处理器在没有逻辑删除的情况下操作 细分。 当有多个缺陷细分超过阈值时,SE还可操作以确定处理器有缺陷。