Test board circuit for detecting tester malfunction and protecting
devices under test
    1.
    发明授权
    Test board circuit for detecting tester malfunction and protecting devices under test 失效
    测试板电路用于检测测试仪故障并保护被测设备

    公开(公告)号:US6005385A

    公开(公告)日:1999-12-21

    申请号:US668709

    申请日:1996-06-24

    申请人: King-Ho Ping

    发明人: King-Ho Ping

    IPC分类号: G01R31/28 G01R31/02

    CPC分类号: G01R31/2849

    摘要: A test board circuit for testing integrated circuit modules under stress conditions, such as temperature, humidity, and bias. The integrated circuit module under test is plugged into a test socket which is part of the test board circuit. Without protection electrical shorting between test socket contacts, either from improper plugging of the module under test or from the formation of conductive deposits on the socket contacts, causes erroneous results and can damage devices in the integrated circuit module under test. The test board circuit protects the devices in the integrated circuit module under test from damage due to shorting between test socket contacts and provides a voltage signal which can be used to detect when a short has occurred.

    摘要翻译: 用于在温度,湿度和偏压等应力条件下测试集成电路模块的测试板电路。 被测试的集成电路模块插入测试插座,这是测试板电路的一部分。 无需保护测试插座触点之间的电气短路,无论是被测模块插头不正确或插座触点上导电沉积物的形成,都会导致错误的结果,并可能会损坏被测集成电路模块中的设备。 测试板电路保护测试中的集成电路模块中的器件免受测试插座触点之间短路造成的损坏,并提供可用于检测短路发生时的电压信号。

    Integrated circuit module fixing mechanism for temperature cycling test
    2.
    发明授权
    Integrated circuit module fixing mechanism for temperature cycling test 失效
    用于温度循环测试的集成电路模块固定机构

    公开(公告)号:US5752771A

    公开(公告)日:1998-05-19

    申请号:US761886

    申请日:1996-12-09

    摘要: An apparatus to retain integrated circuit modules during the preparation for a cycling of temperature, during the cycling of temperature, and during the post-handling after the cycling of temperature, is described. The apparatus has a specimen basket to contain the integrated circuit modules, a plurality of specimen retaining rods coupled to the specimen basket to prevent the integrated circuit modules from movement within the basket, a plurality of integrated circuit module retaining means coupled to the specimen retaining rods to secure each of the integrated circuit modules within the specimen basket, and a specimen securing rod retaining means to fasten each of the specimen retaining rods to the specimen basket.

    摘要翻译: 描述了在制备期间保持集成电路模块以在温度循环期间,在温度循环期间以及在温度循环之后的后处理期间保持集成电路模块的装置。 该装置具有容纳集成电路模块的标本篮,多个与样品篮结合的样本保持杆,以防止集成电路模块在篮内移动;多个集成电路模块保持装置,其连接到样本保持杆 将每个集成电路模块固定在试样篮内,以及试样固定杆保持装置,以将每个试样保持杆固定到试样篮上。

    ESD bypass and EMI shielding trace design in burn-in board
    3.
    发明授权
    ESD bypass and EMI shielding trace design in burn-in board 失效
    老化板中的ESD旁路和EMI屏蔽跟踪设计

    公开(公告)号:US5659245A

    公开(公告)日:1997-08-19

    申请号:US658524

    申请日:1996-06-03

    摘要: A burn-in board assembly for the protection of integrated circuit modules from Electrostatic discharge and the shielding of said integrated circuit modules from Electromagnetic Interference during said electrostatic discharge is described. The burn-in board assembly has a printed circuit board onto which the integrated circuits are mounted by soldering or plugging into sockets soldered to said burnin board assembly. Disposed upon the printed circuit board is a plurality of input stimuli, feedback sensing, and output response signal traces to connect the integrated circuit modules to a connector that is coupled to a input stimulus generator and feedback sensing and output response monitor. Also disposed upon the printed circuit board is a plurality of ground traces and voltage supply traces to connect the integrated circuit modules to the connector that is coupled to a voltage supply source and the system ground reference point. An electrostatic discharge bypass track is disposed peripherally upon the printed circuit board and is connected to the ground reference point through the connector to prevent damage to the printed circuit modules during an electrostatic discharge event. A first and a second electromagnetic interference shielding trace is disposed upon the printed circuit board. Each electromagnetic shielding trace is connected at opposite ends to the ground reference point through the connector to shield the printed circuit traces from the effects of the electromagnetic interference.

    摘要翻译: 描述了一种用于在静电放电期间保护集成电路模块免受静电放电和屏蔽所述集成电路模块与电磁干扰的老化板组件。 老化板组件具有印刷电路板,集成电路通过焊接或插入到焊接到所述燃烧板组件的插座中而安装在该印刷电路板上。 布置在印刷电路板上的是多个输入刺激,反馈感测和输出响应信号迹线,以将集成电路模块连接到耦合到输入激励发生器和反馈感测和输出响应监视器的连接器。 还布置在印刷电路板上的是多个接地迹线和电压提供迹线,用于将集成电路模块连接到耦合到电压源和系统接地参考点的连接器。 静电放电旁路轨道周边布置在印刷电路板上,并通过连接器连接到接地参考点,以防止在静电放电事件期间损坏印刷电路模块。 第一和第二电磁干扰屏蔽迹线设置在印刷电路板上。 每个电磁屏蔽迹线通过连接器在相对端连接到接地参考点,以屏蔽印刷电路迹线免受电磁干扰的影响。

    Integrated circuit module fixing method for temperature cycling test
    4.
    发明授权
    Integrated circuit module fixing method for temperature cycling test 失效
    用于温度循环测试的集成电路模块固定方法

    公开(公告)号:US5610081A

    公开(公告)日:1997-03-11

    申请号:US658525

    申请日:1996-06-03

    摘要: An apparatus to retain integrated circuit modules during the preparation for a cycling of temperature, during the cycling of temperature, and during the post-handling after the cycling of temperature, is described. The apparatus has a specimen basket to contain the integrated circuit modules, a plurality of specimen retaining rods coupled to the specimen basket to prevent the integrated circuit modules from movement within the basket, a plurality of integrated circuit module retaining means coupled to the specimen retaining rods to secure each of the integrated circuit modules within in the specimen basket, and a specimen securing rod retaining means to fasten each of the specimen retaining rods to the specimen basket.

    摘要翻译: 描述了在制备期间保持集成电路模块以在温度循环期间,在温度循环期间以及在温度循环之后的后处理期间保持集成电路模块的装置。 该装置具有容纳集成电路模块的标本篮,多个与样品篮结合的样本保持杆,以防止集成电路模块在篮内移动;多个集成电路模块保持装置,其连接到样本保持杆 将每个集成电路模块固定在样品篮内,以及样本固定杆保持装置,以将每个样本保持杆紧固到标本篮。