公开(公告)号：US20060091491A1

公开(公告)日：2006-05-04

申请号：US11273427

申请日：2005-11-14

Applicant: Gerd Muehlnikel ,  Klaus Hirche ,  Martin Warth

Inventor： Gerd Muehlnikel ,  Klaus Hirche ,  Martin Warth

IPC: H01L31/105 ,  H01L21/00

CPC classification number: H01L31/18 ,  H01L31/02162 ,  H01L31/1035

Abstract: An optical detector with an arrangement of several semiconductor layers has at least one zone absorbing in a predetermined wavelength region, at least one zone which is at least partially light-permeable in the predetermined wavelength region, one semiconductor layer which is absorbing in the predetermined wavelength region, a semiconductor layer which is located under the first mentioned semiconductor layer and is at least partially light-permeable in the predetermined wavelength region, the at least one light-permeable zone is formed as an interruption in the absorbing semiconductor layer, and a throughgoing doping provided on an upper surface of the absorbing semiconductor layer which surrounds the interruption and at least a part of an upper surface of the at least partially light-permeable semiconductor layer, wherein, the optical detector is produced by a new method and used for various applications.

Abstract translation: 具有多个半导体层的布置的光学检测器具有在预定波长区域中吸收的至少一个区域，在预定波长区域中至少部分透光的至少一个区域，以预定波长吸收的一个半导体层 区域，位于第一提到的半导体层下方并且在预定波长区域中至少部分透光的半导体层，所述至少一个透光区形成为吸收半导体层中的中断，并且通过 提供在吸收半导体层的围绕中断的上表面上的掺杂和至少部分透光的半导体层的上表面的至少一部分，其中，光学检测器通过新的方法制造并用于各种 应用程序。

公开(公告)号：US06297487B1

公开(公告)日：2001-10-02

申请号：US09425332

申请日：1999-10-22

Applicant: Albrecht Kuke ,  Eberhard Moess ,  Bernhard Schwaderer ,  Klaus Hirche ,  Werner Scholz ,  Martin Warth

Inventor： Albrecht Kuke ,  Eberhard Moess ,  Bernhard Schwaderer ,  Klaus Hirche ,  Werner Scholz ,  Martin Warth

IPC: G01J120

CPC classification number: H04B10/11

Abstract: The device for generating an electrical control according to a position of a light beam in relation to a separating line includes two photodetectors (14,24), one (14) of which is arranged for detecting light falling on one side of the separating line and another (24) of which is arranged for detecting light falling on another side of the separating line. The separating line is an edge (30) extending between two (1,1,1) crystallographic planes of a crystalline substrate and the (1,1,1) crystallographic planes reflect respective parts of the light beam to the respective photodetectors.

Abstract translation: 根据光束相对于分离线的位置产生电气控制的装置包括两个光电检测器（14,24），其中一个（14）被布置用于检测落在分离线一侧的光;以及 另一个（24）被布置成用于检测落在分离线的另一侧的光。 分离线是在晶体衬底的两（1,1,1）晶面之间延伸的边缘（30），（1,1,1）晶面将光束的各个部分反射到各个光电检测器。