Abstract:
Switchable two-fiber systems to provide a backup fiber link to a signal detector where the backup signal is switched to the signal detector when the primary signal fails.
Abstract:
A system and method for optical alignment of a color imaging system includes illuminating a target plate with a laser beam. Photo-luminescent energy from the target plate is emitted in response to the laser beam. A color imaging system is aligned based on the photo-luminescent energy emitted at the target plate.
Abstract:
A process for the adaptive beam control of medium-energy laser weapons for fighting electro-optical sensors and windows, wherein the behavior of the laser power reflected from a bright spot of the target and measured by a thermal image apparatus during increasing irradiation intensity is analyzed during a phase of measurement. The laser power to be emitted that will lead to the desired laser beam diameter or to the highest possible laser intensity at the target during the subsequent phase of fighting is then derived by calculation from this as well as other parameters influencing the thermal beam expansion. It is thus made possible that the laser does not always have to be operated with the maximum power, but only with the currently needed power during the phase of fighting, so that a saving is achieved in the consumption of primary laser energy. One example is explained.
Abstract:
The preferred embodiments described herein provide an apparatus and method for intersecting a light beam and a focal point of a detector at an object of interest. In one preferred embodiment, an apparatus is provided comprising a first support element and a first member carrying a light source and a detector. The first member is pivotable between first and second positions, and when the first member is in the first position, a light beam generated by the light source and a focal point of the detector intersect at an object of interest carried by the first support element. When the first member is in the second position, the light beam and the focal point of the detector intersect at an object of interest carried by a second support element disposed on the first support element.
Abstract:
An inner control loop controls the relative position of a surface to be scanned with respect to a focal plane. An outer control loop responds to the location of the surface to be scanned with respect to a focal plane of the scan lens to generate a setpoint for the inner control loop. A sample-and-hold element disposed between the inner and outer control loops is switched by an edge or defect detector. It is preferred that the outer control loop has a time constant in the range of three to ten times longer than that of the inner control loop. The sample-and-hold element provides a gradual state transition upon the occurrence of an edge or a surface defect.
Abstract:
A radiation detector, particularly for a computed tomography apparatus, has a scintillator as well as a photodiode array allocated thereto, these being connected to measuring electronics via an electrical connection. A transparent film with interconnects is arranged between the scintillator and the photodiode array.
Abstract:
The invention is directed to an arrangement for autofocusing onto a measuring location on an object moving in a direction which is at least approximately vertical to the optical axis of the imaging optics. According to the invention, a diaphragm device is to be provided the diaphragm opening of which extends in a direction aligned with the direction of movement of the measuring location; a receiving device for the measuring light has receiving areas arranged in a row beside each other and is inclined relative to the optical axis so that the image from the diaphragm device is incident on the receiving areas at an inclination of an angle &agr;; wherein the receiving device and the diaphragm opening are positioned relative to each other in such a way that characteristic measuring values are measured on the receiving areas when the measuring location is in or near the focus position. An evaluating device compares the measured values read sequentially from the receiving areas with stored desired values and from them generates signals, for example, for a microscope arrangement and/or—if deviations have been determined—for correcting signals for a relocation device by means of which the relocation of the direction of movement into the focal plane of the imaging optics is effected.
Abstract:
An adaptive dynamic wavefront sensor and corresponding method comprising a spatial light modulator and a lenslet array. A subarray of pixels of the spatial light modulator controls illumination of a lenslet of the lenslet array. The sub-array can operate as a shutter for the corresponding lenslet or to control intensity of a focus of the lenslet.
Abstract:
A method and system of detecting whether the intensity of light incident a spatial light modulator varies periodically. One embodiment provides a method of operating a spatial light modulator, the method comprising: determining a peak level of light incident the modulator over a period of time; setting a threshold level equal to a fraction of the peak level; monitoring a current level of light incident the modulator; comparing the current level of light and the threshold level; and disabling the modulator based on the comparison. Another embodiment provides a modulator array. The modulator comprises: a photosensitive circuit for outputting a light intensity signal representative of a level of light incident the photosensitive circuit; a threshold detection circuit 400 receiving the light intensity signal 402 and outputting an under threshold signal 408 indicative of whether the intensity signal is less than a threshold level; and a duty cycle detection circuit 410 for monitoring the under threshold signal 408 and outputting a disable signal 418 indicative of the duty cycle of the under threshold signal 408. The preceding abstract is submitted with the understanding that it only will be used to assist in determining, from a cursory inspection, the nature and gist of the technical disclosure as described in 37 C.F.R. §1.72(b). In no case should this abstract be used for interpreting the scope of any patent claims.
Abstract:
A virtual gauging system for use in a lithographic process is described that includes means for gauging a region at a surface of a wafer when the region is located away from an axis of illumination producing wafer surface data, while other portions of the wafer are being illuminated. The system also includes means for converting the wafer surface data into wafer correction data and means for adjusting a separation distance between an exposure lens and the region at the surface of the wafer based on the correction data when the region is located at the axis of illumination. The means for gauging includes at least two wafer surface gauges located on opposite sides of an illumination slot. The means for converting the wafer surface data into wafer correction data includes means for determining a direction of travel of the wafer, and the wafer correction data is based on data produced by one of the two wafer surface gauges located on the side of the illumination slot that corresponds to the direction of travel of the wafer. The means for converting the wafer surface data into wafer correction data includes a finite-impulse-response filter, and the finite-impulse-response filter is triggered by a spatial interrupt and has a width that can be modified in response to the velocity of travel of the wafer.