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    Time-based attenuation compensation
    7.
    发明授权
    Time-based attenuation compensation 失效
    基于时间的衰减补偿

    公开(公告)号：US5400384A

    公开(公告)日：1995-03-21

    申请号：US187106

    申请日：1994-01-25

    申请人： Mark Fernandes ,  Chris R. Soderstrom ,  Donley L. Bush ,  DeeAnn Dorman

    发明人： Mark Fernandes ,  Chris R. Soderstrom ,  Donley L. Bush ,  DeeAnn Dorman

    IPC分类号： G21K5/00 ,  H05G1/26 ,  H05G1/46 ,  H05G1/44

    CPC分类号： G21K5/00 ,  H05G1/26 ,  H05G1/46

    摘要： A method and apparatus employed in an X-ray apparatus for compensating for attenuation caused by a subject to perform an improved X-ray exposure. A table is created comprising entries accessible via power and attenuation values. Each of the entries includes a first value T representing a time for radiation in the system to reach a base ion count, and a second value C representing an offset ion count from the base ion count. A first set of entries in the table are referenced using a first power setting, and a first base ion count is determined based upon the first power setting, and a maximum radiation exposure is determined for the first power setting and a subject's mass. Then, an X-ray emitter is activated until a current ion count from a radiation sampling means has exceeded the base ion count or total radiation emitted has exceeded the maximum radiation allowed for the given mass of a subject. If the current radiation has exceeded the maximum radiation, then the X-ray emitter is deactivated and the process terminates. If the current ion count from the radiation sampling means has exceeded the base ion count, then it is determined whether the base ion count has been offset. If so, then the X-ray emitter is deactivated and the process terminates. If the base ion count has not been offset, then a matching entry is determined from the first set of entries which has the first value T less than or equal to the current exposure. Then, the second value C of the matching entry is added to the base ion count, and the process is repeated until the above conditions are matched.

    摘要翻译： 一种在X射线设备中采用的方法和装置，用于补偿由被摄体引起的衰减以进行改进的X射线曝光。 创建一个表，其中包含可通过功率和衰减值访问的条目。 每个条目包括表示系统中达到基本离子计数的辐射时间的第一值T和表示基础离子计数的偏移离子计数的第二值C. 使用第一功率设置来参考表中的第一组条目，并且基于第一功率设置来确定第一基本离子计数，并且确定用于第一功率设置和被摄体质量的最大辐射曝光。 然后，X射线发射器被激活，直到来自辐射采样装置的当前离子计数超过基本离子计数，或者发射的总辐射已经超过给定质量的受试者允许的最大辐射。 如果当前辐射已经超过最大辐射，则X射线发射器被去激活，并且该过程终止。 如果来自辐射采样装置的当前离子计数超过基本离子计数，则确定基础离子计数是否已被抵消。 如果是这样，则X射线发射器被去激活，并且该过程终止。 如果基本离子计数尚未被偏移，则从具有小于或等于当前曝光的第一值T的第一组条目确定匹配条目。 然后，将匹配条目的第二值C加到基本离子计数中，并重复该处理直到上述条件匹配。

    Time-based attenuation compensation
    8.
    发明授权
    Time-based attenuation compensation 失效
    基于时间的衰减补偿

    公开(公告)号：US5333168A

    公开(公告)日：1994-07-26

    申请号：US11255

    申请日：1993-01-29

    申请人： Mark Fernandes ,  Chris R. Soderstrom ,  Donley L. Bush ,  DeeAnn Dorman

    发明人： Mark Fernandes ,  Chris R. Soderstrom ,  Donley L. Bush ,  DeeAnn Dorman

    IPC分类号： G21K5/00 ,  H05G1/26 ,  H05G1/46 ,  H05G1/44

    CPC分类号： G21K5/00 ,  H05G1/26 ,  H05G1/46

    摘要： A method and apparatus employed in an X-ray apparatus for compensating for attenuation caused by a subject to perform an improved X-ray exposure. A table is created comprising entries accessible via power and attenuation values. Each of the entries includes a first value T representing a time for radiation in the system to reach a base ion count, and a second value C representing an offset ion count from the base ion count. A first set of entries in the table are referenced using a first power setting, and a first base ion count is determined based upon the first power setting, and a maximum radiation exposure is determined for the first power setting and a subject's mass. Then, an X-ray emitter is activated until a current ion count from a radiation sampling means has exceeded the base ion count or total radiation emitted has exceeded the maximum radiation allowed for the given mass of a subject. If the current radiation has exceeded the maximum radiation, then the X-ray emitter is deactivated and the process terminates. If the current ion count from the radiation sampling means has exceeded the base ion count, then it is determined whether the base ion count has been offset. If so, then the X-ray emitter is deactivated and the process terminates. If the base ion count has not been offset, then a matching entry is determined from the first set of entries which has the first value T less than or equal to the current exposure. Then, the second value C of the matching entry is added to the base ion count, and the process is repeated until the above conditions are matched.

    摘要翻译： 一种在X射线设备中采用的方法和装置，用于补偿由被摄体引起的衰减以进行改进的X射线曝光。 创建一个表，其中包含可通过功率和衰减值访问的条目。 每个条目包括表示系统中达到基本离子计数的辐射时间的第一值T和表示基础离子计数的偏移离子计数的第二值C. 使用第一功率设置来参考表中的第一组条目，并且基于第一功率设置来确定第一基本离子计数，并且确定用于第一功率设置和被摄体质量的最大辐射曝光。 然后，X射线发射器被激活，直到来自辐射采样装置的当前离子计数超过基本离子计数，或者发射的总辐射已经超过给定质量的受试者允许的最大辐射。 如果当前辐射已经超过最大辐射，则X射线发射器被去激活，并且该过程终止。 如果来自辐射采样装置的当前离子计数超过基本离子计数，则确定基础离子计数是否已被抵消。 如果是这样，则X射线发射器被去激活，并且该过程终止。 如果基本离子计数尚未被偏移，则从具有小于或等于当前曝光的第一值T的第一组条目确定匹配条目。 然后，将匹配条目的第二值C加到基本离子计数中，并重复该处理直到上述条件匹配。