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    Omnidirectional eddy current probe and inspection system
    2.
    发明授权
    Omnidirectional eddy current probe and inspection system 失效
    全向涡流探头和检测系统

    公开(公告)号：US07015690B2

    公开(公告)日：2006-03-21

    申请号：US10856381

    申请日：2004-05-27

    申请人： Changting Wang ,  Yuri Alexeyevich Plotnikov ,  Shridhar Champaknath Nath ,  William Stewart McKnight ,  Gigi Olive Gambrell

    发明人： Changting Wang ,  Yuri Alexeyevich Plotnikov ,  Shridhar Champaknath Nath ,  William Stewart McKnight ,  Gigi Olive Gambrell

    IPC分类号： G01N27/90 ,  G01N27/72

    CPC分类号： G01N27/902 ,  G01N27/9033 ,  G01N27/904

    摘要： An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.

    摘要翻译： 全向涡流（EC）探针包括至少一个具有第一和第二感测线圈的EC通道，该第一和第二感测线圈在第一（x）和第二（y）方向上偏移并且在至少一个方向（x， y）。 至少一个驱动线圈被配置为在感测线圈附近产生用于EC通道的探测场。 全方位的EC检测系统包括一个包括多个EC通道和驱动线圈的全向EC阵列探针（ECAP）。 每个EC通道包括具有相反极性的第一和第二感测线圈。 驱动线圈具有交替极性。 电气连接对相应的EC通道执行差分感测。 纠正驱动线圈设置在EC通道的相应末端并产生探测场。 涡流仪器连接到全向ECAP，并从EC通道接收差分感测信号。

    SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES
    3.
    发明申请
    SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES 有权
    用于检查具有复杂几何图形的部件的系统和方法

    公开(公告)号：US20100127699A1

    公开(公告)日：2010-05-27

    申请号：US12277942

    申请日：2008-11-25

    申请人： Changting Wang ,  Yury Alexeyevich Plotnikov ,  Ui Won Suh ,  William Stewart McKnight

    发明人： Changting Wang ,  Yury Alexeyevich Plotnikov ,  Ui Won Suh ,  William Stewart McKnight

    IPC分类号： G01N27/90

    CPC分类号： G01N27/82 ,  G01N27/9013

    摘要： An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.

    摘要翻译： 提供了检查零件的检查系统。 检查系统包括符合部件的三维形状轮廓的涡流传感器的多维阵列。 检查系统还包括耦合到多维阵列的控制器，其中控制器被配置为通过涡电流传感器的电连接将电子扫描到涡流仪器。 检查系统还包括耦合到涡流仪器的处理器，其中处理器被配置为分析来自涡流仪器和控制器的输出以完成对部件的检查。

    System and method for eddy current inspection of parts with complex geometries
    4.
    发明授权
    System and method for eddy current inspection of parts with complex geometries 有权
    对具有复杂几何形状的零件进行涡流检测的系统和方法

    公开(公告)号：US08269489B2

    公开(公告)日：2012-09-18

    申请号：US12277942

    申请日：2008-11-25

    申请人： Changting Wang ,  Yury Alexeyevich Plotnikov ,  Ui Won Suh ,  William Stewart McKnight

    发明人： Changting Wang ,  Yury Alexeyevich Plotnikov ,  Ui Won Suh ,  William Stewart McKnight

    IPC分类号： G01N27/82

    CPC分类号： G01N27/82 ,  G01N27/9013

    摘要： An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.

    摘要翻译： 提供了检查零件的检查系统。 检查系统包括符合部件的三维形状轮廓的涡流传感器的多维阵列。 检查系统还包括耦合到多维阵列的控制器，其中控制器被配置为通过涡电流传感器的电连接将电子扫描到涡流仪器。 检查系统还包括耦合到涡流仪器的处理器，其中处理器被配置为分析来自涡流仪器和控制器的输出以完成对部件的检查。

    Methods and apparatus for testing a component
    8.
    发明授权
    Methods and apparatus for testing a component 有权
    用于测试组件的方法和设备

    公开(公告)号：US08013599B2

    公开(公告)日：2011-09-06

    申请号：US10993467

    申请日：2004-11-19

    申请人： Ui Won Suh ,  Gigi Olive Gambrell ,  John William Ertel ,  William Stewart McKnight

    发明人： Ui Won Suh ,  Gigi Olive Gambrell ,  John William Ertel ,  William Stewart McKnight

    IPC分类号： G01N27/82

    CPC分类号： G01B7/28 ,  G01N27/902 ,  G01N27/9033

    摘要： A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication, and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.

    摘要翻译： 一种用于检查具有包括局部最小值和局部最大值的表面轮廓的部件的方法。 该方法包括将涡流探针定位在部件的表面附近以产生第一位置指示，将涡流探针定位在部件的表面附近以产生与第一位置指示不同的第二位置指示，以及 在第一和第二位置指示之间插值以确定部件表面的一部分的轮廓。

    Inspection method and system using multifrequency phase analysis
    9.
    发明授权
    Inspection method and system using multifrequency phase analysis 有权
    检验方法和系统采用多频相分析

    公开(公告)号：US07206706B2

    公开(公告)日：2007-04-17

    申请号：US11210119

    申请日：2005-08-22

    申请人： Changting Wang ,  William Stewart McKnight ,  Ui Suh ,  Serkan Ertekin

    发明人： Changting Wang ,  William Stewart McKnight ,  Ui Suh ,  Serkan Ertekin

    IPC分类号： G06F19/00

    CPC分类号： G01N27/9046 ,  G01N27/9086

    摘要： A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.

    摘要翻译： 提供了一种用于检查零件的方法。 该方法包括将多个多频激励信号应用于探针，以产生被检测部分的多个多频响应信号。 该方法还包括对多频响应信号执行多频相分析以检查该部分的地下。 提供了一种检查系统，并且包括涡流（EC）探针，其配置成在部件中感应涡流。 该系统还包括耦合到EC探头并被配置为向EC探头施加多频激励信号以产生多频响应信号的涡流仪器。 该系统还包括处理器，其被配置为通过执行多频相分析来分析来自EC仪器的多频响应信号，以检查该部件的地下。