公开(公告)号：US20100044577A1

公开(公告)日：2010-02-25

申请号：US12392064

申请日：2009-02-24

Applicant: Neal T. Sullivan ,  Anton Tremsin ,  Phiippe De Rouffignac ,  David Beaulieu ,  Kourosh Saadatmand ,  Steve Bachman ,  Ken Stenton

Inventor： Neal T. Sullivan ,  Anton Tremsin ,  Phiippe De Rouffignac ,  David Beaulieu ,  Kourosh Saadatmand ,  Steve Bachman ,  Ken Stenton

IPC: G01T3/00

CPC classification number: H01J43/246 ,  G01T3/08

Abstract: A microchannel plate for detecting neutrons includes a hydrogen-rich polymer substrate that defines a plurality of channels extending from a top surface of the substrate to a bottom surface of the substrate, where neutrons interact with the plurality of channels to generate at least one secondary electron. A top electrode is positioned on the top surface of the substrate and a bottom electrode is positioned on the bottom surface of the substrate. A resistive layer is formed over an outer surface of the plurality of channels that provides ohmic conduction with a resistivity that is substantially constant. An emissive layer is formed over the resistive layer. Neutron interaction products interact with the plurality of channels defined by the substrate and the emissive films to generate secondary electrons that cascade within the plurality of channels to provide an amplified signal related to the detection of neutrons.

Abstract translation: 用于检测中子的微通道板包括富氢聚合物基底，其限定从基底的顶表面延伸到基底的底表面的多个通道，其中中子与多个通道相互作用以产生至少一个二次电子 。 顶部电极位于衬底的顶表面上，底部电极位于衬底的底表面上。 电阻层形成在多个通道的外表面上，其提供基本恒定的电阻率的欧姆导电。 在电阻层上形成发光层。 中子相互作用产物与由衬底和发射膜限定的多个通道相互作用以产生在多个通道内级联的二次电子，以提供与中子检测有关的放大信号。

公开(公告)号：US06992287B2

公开(公告)日：2006-01-31

申请号：US10985144

申请日：2004-11-10

Applicant: Neal T. Sullivan

Inventor： Neal T. Sullivan

IPC: G21K7/00 ,  G21G5/00

CPC classification number: H01J37/28 ,  H01J2237/2817 ,  H01J2237/2826

Abstract: A system and method for identifying an optimal landing energy of a probe current in a scanning electron microscope system. A probe current having a known landing energy is directed at a sample for producing a signal electron beam. The current of the signal electron beam is measured by directing the beam to a current detector for calculating a current yield, which is the ratio of the signal current to the probe current. The landing energy can then be changed for subsequent measurements of the signal current to identify the landing energy which produces a desired current yield. Once identified, the landing energy value can be used to produce a signal electron beam directed towards an imaging detector to generate topographic images of samples.

Abstract translation: 用于在扫描电子显微镜系统中识别探针电流的最佳着陆能量的系统和方法。 具有已知着陆能量的探针电流被引导到用于产生信号电子束的样本。 通过将光束引导到电流检测器来计算电流产量，即信号电流与探针电流的比值来测量信号电子束的电流。 然后可以改变着陆能量以用于信号电流的随后测量，以识别产生期望电流产量的着陆能量。 一旦被识别，着陆能量值可用于产生指向成像检测器的信号电子束，以产生样本的地形图像。

公开(公告)号：US06593578B1

公开(公告)日：2003-07-15

申请号：US10010321

申请日：2001-11-08

Applicant: Paul J. Duval ,  Allan I. Rubin ,  Ira Rosenberg ,  Vladimir Vayner ,  Neal T. Sullivan

Inventor： Paul J. Duval ,  Allan I. Rubin ,  Ira Rosenberg ,  Vladimir Vayner ,  Neal T. Sullivan

IPC: H01F700

CPC classification number: H01J49/466 ,  H01J37/05 ,  H01J2237/057

Abstract: A charged particle filter such as a Wien filter in which components used as the pole pieces and electrodes are precisely and reliably secured to a supporting structure through which they extend and to which they are brazed. Electrical insulating gaps in the magnetic circuit are located very remotely from the pole faces of the pole pieces so as to minimize any adverse effect of the gaps on the produced magnetic field.

Abstract translation: 带电粒子滤波器如维恩滤波器，其中用作极片和电极的部件被精确可靠地固定到支撑结构，通过它们延伸并被钎焊到该支撑结构。 磁路中的电气绝缘间隙非常远离极片的极面，以最小化间隙对所产生的磁场的任何不利影响。

公开(公告)号：US08237129B2

公开(公告)日：2012-08-07

申请号：US12392064

申请日：2009-02-24

Applicant: Neal T. Sullivan ,  Anton Tremsin ,  Philippe de Rouffignac ,  David Beaulieu ,  Kourosh Saadatmand ,  Steve Bachman ,  Ken Stenton ,  Dmitry Gorelikov

Inventor： Neal T. Sullivan ,  Anton Tremsin ,  Philippe de Rouffignac ,  David Beaulieu ,  Kourosh Saadatmand ,  Steve Bachman ,  Ken Stenton ,  Dmitry Gorelikov

IPC: G01T3/00

CPC classification number: H01J43/246 ,  G01T3/08

Abstract: A microchannel plate for detecting neutrons includes a hydrogen-rich polymer substrate that defines a plurality of channels extending from a top surface of the substrate to a bottom surface of the substrate, where neutrons interact with the plurality of channels to generate at least one secondary electron. A top electrode is positioned on the top surface of the substrate and a bottom electrode is positioned on the bottom surface of the substrate. A resistive layer is formed over an outer surface of the plurality of channels that provides ohmic conduction with a resistivity that is substantially constant. An emissive layer is formed over the resistive layer. Neutron interaction products interact with the plurality of channels defined by the substrate and the emissive films to generate secondary electrons that cascade within the plurality of channels to provide an amplified signal related to the detection of neutrons.

Abstract translation: 用于检测中子的微通道板包括富氢聚合物基底，其限定从基底的顶表面延伸到基底的底表面的多个通道，其中中子与多个通道相互作用以产生至少一个二次电子 。 顶部电极位于衬底的顶表面上，底部电极位于衬底的底表面上。 电阻层形成在多个通道的外表面上，其提供基本恒定的电阻率的欧姆导电。 在电阻层上形成发光层。 中子相互作用产物与由衬底和发射膜限定的多个通道相互作用以产生在多个通道内级联的二次电子，以提供与中子检测有关的放大信号。

公开(公告)号：US20090315443A1

公开(公告)日：2009-12-24

申请号：US12143732

申请日：2008-06-20

Applicant: Neal T. Sullivan ,  Steve Bachman ,  Philippe de Rouffignac ,  Anton Tremsin ,  David Beaulieu

Inventor： Neal T. Sullivan ,  Steve Bachman ,  Philippe de Rouffignac ,  Anton Tremsin ,  David Beaulieu

IPC: H01J43/00

CPC classification number: H01J43/04 ,  H01J43/246

Abstract: A microchannel plate includes a substrate defining a plurality of channels extending from a top surface of the substrate to a bottom surface of the substrate. A resistive layer is formed over an outer surface of the plurality of channels that provides ohmic conduction with a predetermined resistivity that is substantially constant. An emissive layer is formed over the resistive layer. A top electrode is positioned on the top surface of the substrate. A bottom electrode positioned on the bottom surface of the substrate.

Abstract translation: 微通道板包括限定从衬底的顶表面延伸到衬底的底表面的多个通道的衬底。 电阻层形成在多个通道的外表面上，其提供基本上恒定的预定电阻率的欧姆导通。 在电阻层上形成发光层。 顶部电极位于衬底的顶表面上。 位于基板底面的底部电极。

公开(公告)号：US20090256063A1

公开(公告)日：2009-10-15

申请号：US12421603

申请日：2009-04-09

Applicant: Neal T. Sullivan ,  Anton Tremsin ,  Ken Stenton ,  Philippe De Rouffignac

Inventor： Neal T. Sullivan ,  Anton Tremsin ,  Ken Stenton ,  Philippe De Rouffignac

IPC: H01J43/00

CPC classification number: H01J31/507 ,  H01J43/246 ,  H01J2231/5016

Abstract: An image intensifying device includes a lens that is positioned at a light input that forms an image of a scene. The image intensifying device also includes an image intensifier tube that includes a photocathode that is positioned to receive the image formed by the lens. The photocathode generates photoelectrons in response to the light image of the scene. The image intensifier tube also includes a microchannel plate having an input surface comprising the photocathode. The microchannel plate receives the photoelectrons generated by the photocathode and generating secondary electrons. An electron detector receives the secondary electrons generated by the microchannel plate and generates an intensified image of the scene.

Abstract translation: 图像增强装置包括位于形成场景的图像的光输入处的透镜。 图像增强装置还包括图像增强管，其包括被定位成接收由透镜形成的图像的光电阴极。 光电阴极响应于场景的光图像而产生光电子。 图像增强管还包括具有包括光电阴极的输入表面的微通道板。 微通道板接收由光电阴极产生的光电子并产生二次电子。 电子检测器接收由微通道板产生的二次电子并产生场景的增强图像。

公开(公告)号：US20090212680A1

公开(公告)日：2009-08-27

申请号：US12038254

申请日：2008-02-27

Applicant: Anton Tremsin ,  Philippe de Rouffignac ,  Neal T. Sullivan ,  David Beaulieu ,  Michael D. Potter

Inventor： Anton Tremsin ,  Philippe de Rouffignac ,  Neal T. Sullivan ,  David Beaulieu ,  Michael D. Potter

IPC: H01J43/06

CPC classification number: H01J43/246

Abstract: A microchannel plate includes a substrate defining a plurality of pores extending from a top surface of the substrate to a bottom surface of the substrate. The plurality of pores includes a resistive material on an outer surface that forms a first emissive layer. A second emissive layer is formed over the first emissive layer. The second emissive layer is chosen to achieve at least one of an increase in secondary electron emission efficiency and a decrease in gain degradation as a function of time. A top electrode is positioned on the top surface of the substrate and a bottom electrode is positioned on the bottom surface of the substrate.

Abstract translation: 微通道板包括限定从衬底的顶表面延伸到衬底的底表面的多个孔的衬底。 多个孔包括形成第一发射层的外表面上的电阻材料。 在第一发射层上形成第二发射层。 选择第二发射层以实现二次电子发射效率的增加和随着时间的函数的增益降低的降低中的至少一个。 顶部电极位于衬底的顶表面上，底部电极位于衬底的底表面上。

公开(公告)号：US06825977B2

公开(公告)日：2004-11-30

申请号：US10163917

申请日：2002-06-06

Applicant: Neal T. Sullivan

Inventor： Neal T. Sullivan

IPC: G02B2100

CPC classification number: G02B21/24

Abstract: A fixture and method is provided for aligning optical elements in a microscope. The fixture attaches to an objective lens plane of the microscope and supports an alignment optical element. During optical component alignment, an alignment beam is directed along the illumination and imaging paths of the microscope through the objective lens port and into the fixture for reflection by the alignment optical element. The fixture allows an alignment optical element positioned in a single location to be used for aligning the microscope components and for adjusting the microscope objective lens.

Abstract translation: 提供了用于在显微镜中对准光学元件的固定装置和方法。 固定装置连接到显微镜的物镜平面，并支撑对准光学元件。 在光学部件对准期间，对准光束沿着显微镜的照明和成像路径被引导通过物镜端口并进入固定装置，用于由对准光学元件反射。 夹具允许位于单个位置的对准光学元件用于对准显微镜部件并调整显微镜物镜。

公开(公告)号：US06717141B1

公开(公告)日：2004-04-06

申请号：US09994563

申请日：2001-11-27

Applicant: John A. Rouse ,  Ira Rosenberg ,  Neal T. Sullivan

Inventor： John A. Rouse ,  Ira Rosenberg ,  Neal T. Sullivan

IPC: H01J4700

CPC classification number: H01J37/153 ,  H01J37/28 ,  H01J2237/057

Abstract: In order to improve the resolution of an electron beam in a scanning electron microscope or the like in which a Wien filter is employed for particle detection purposes, the beam is caused to have an envelope with a crossover point within, and preferably centrally located with respect to, the Wien filter.

Abstract translation: 为了提高扫描电子显微镜等中使用维恩滤波器用于粒子检测目的的电子束的分辨率，使得该束具有在其相对于中心位置具有交叉点的包络线 到，维恩过滤器。

公开(公告)号：US4851264A

公开(公告)日：1989-07-25

申请号：US939061

申请日：1986-12-08

Applicant: Subrata Banerjee ,  Neal T. Sullivan

Inventor： Subrata Banerjee ,  Neal T. Sullivan

IPC: C04B41/50 ,  C04B41/85

CPC classification number: C04B41/009 ,  C04B41/5001 ,  C04B41/85 ,  Y10T428/25 ,  Y10T428/30

Abstract: A process for reinforcing porous refractories with fillers, such as carbon particles, is provided. First, filler particles are mixed with a liquid resin to produce a liquid mixture. The mixture is allowed to seep into the pores of the refractory, preferably by immersing the refractory in said mixture in an evacuated tank. The refractory can be removed from the mixture and excess mixture can be allowed to drip from the refractory. The refractory is then cured, preferably by heating. The refractory is strengthened by the process to better withstand heat fluctuations encountered, for example, in the steel refining process.

Abstract translation: 提供了一种用填料例如碳颗粒增强多孔耐火材料的方法。 首先，将填料颗粒与液体树脂混合以产生液体混合物。 允许混合物渗透到耐火材料的孔中，优选通过将耐火材料浸入所述混合物中的真空罐中。 可以从混合物中除去耐火材料，并且允许过量的混合物从耐火材料滴落。 然后将耐火材料固化，优选通过加热固化。 耐火材料通过该工艺得到加强，以更好地承受例如在炼钢过程中遇到的热波动。