Semiconductor memory device
    1.
    发明授权
    Semiconductor memory device 失效
    半导体存储器件

    公开(公告)号:US5424989A

    公开(公告)日:1995-06-13

    申请号:US109488

    申请日:1993-08-20

    CPC分类号: G11C29/24

    摘要: A semiconductor memory device having information data storing cells and error correction data storing memory cells. When information data is inputted, error correction data related to the information data is formed. In a usual use, the information data and the error correction data are stored in the corresponding memory cells. An external test signal, inputted as the information data, can be stored in the error correction data storing memory cells by a write control signal. In a usual use, the information data stored in the information data storing cells are outputted, as they are or corrected if erroneous. The test signal stored in the error correction data storing memory can be outputted by an output control signal.

    摘要翻译: 具有存储单元的信息数据和存储单元的误差校正数据的半导体存储器件。 当输入信息数据时,形成与信息数据相关的纠错数据。 在通常的使用中,信息数据和纠错数据被存储在相应的存储单元中。 作为信息数据输入的外部测试信号可以通过写控制信号存储在纠错数据存储存储单元中。 在通常的使用中,存储在信息数据存储单元中的信息数据被原样输出或者如果错误地被校正。 可以通过输出控制信号输出存储在纠错数据存储存储器中的测试信号。

    Current mirror circuit
    2.
    发明授权
    Current mirror circuit 失效
    电流镜电路

    公开(公告)号:US08456227B2

    公开(公告)日:2013-06-04

    申请号:US13046953

    申请日:2011-03-14

    IPC分类号: G05F1/10

    CPC分类号: G05F3/262

    摘要: In one embodiment, a current mirror circuit includes first to fourth insulated gate field effect transistors (FETs), and a bias circuit. The gate electrodes of the first and second FETs are connected to each other. The source electrode of the third FET is connected to the drain electrode of the first FET, and the drain electrode of the third FET is connected to the gate electrodes of the first and second FETs and a current input terminal. The gate electrode of the fourth FET is connected to the gate electrode of the third FET, the source electrode of the fourth FET is connected to the drain electrode of the second FET, and the drain electrode of the fourth FET becomes a current output terminal. The bias circuit is configured to provide a bias voltage to the gate electrodes of the third and fourth FETs.

    摘要翻译: 在一个实施例中,电流镜电路包括第一至第四绝缘栅场效应晶体管(FET)和偏置电路。 第一和第二FET的栅电极彼此连接。 第三FET的源电极连接到第一FET的漏电极,第三FET的漏电极连接到第一和第二FET的栅电极以及电流输入端。 第四FET的栅电极与第三FET的栅电极连接,第四FET的源电极与第二FET的漏极连接,第四FET的漏极成为电流输出端。 偏置电路被配置为向第三和第四FET的栅电极提供偏置电压。

    CURRENT MIRROR CIRCUIT
    3.
    发明申请
    CURRENT MIRROR CIRCUIT 失效
    当前镜像电路

    公开(公告)号:US20110304387A1

    公开(公告)日:2011-12-15

    申请号:US13046953

    申请日:2011-03-14

    IPC分类号: G05F1/10

    CPC分类号: G05F3/262

    摘要: In one embodiment, a current mirror circuit includes first to fourth insulated gate field effect transistors (FETs), and a bias circuit. The gate electrodes of the first and second FETs are connected to each other. The source electrode of the third FET is connected to the drain electrode of the first FET, and the drain electrode of the third FET is connected to the gate electrodes of the first and second FETs and a current input terminal. The gate electrode of the fourth FET is connected to the gate electrode of the third FET, the source electrode of the fourth FET is connected to the drain electrode of the second FET, and the drain electrode of the fourth FET becomes a current output terminal. The bias circuit is configured to provide a bias voltage to the gate electrodes of the third and fourth FETs.

    摘要翻译: 在一个实施例中,电流镜电路包括第一至第四绝缘栅场效应晶体管(FET)和偏置电路。 第一和第二FET的栅电极彼此连接。 第三FET的源电极连接到第一FET的漏电极,第三FET的漏电极连接到第一和第二FET的栅电极以及电流输入端。 第四FET的栅电极与第三FET的栅电极连接,第四FET的源电极与第二FET的漏极连接,第四FET的漏极成为电流输出端。 偏置电路被配置为向第三和第四FET的栅电极提供偏置电压。