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公开(公告)号：US20140057389A1
公开(公告)日：2014-02-27
申请号：US14072237
申请日：2013-11-05
IPC分类号： H01L31/0224
CPC分类号： H01L31/022441 , C11D3/2075 , C11D3/30 , C11D7/265 , C11D7/3209 , C11D7/3218 , C11D11/0047 , H01L31/073 , H01L31/18 , H01L31/1828 , Y02E10/543 , Y02P70/521
摘要： A method to preparing Cadmium telluride surface before forming metal back contact is disclosed. The method can include removing carbon from Cadmium telluride surface.
摘要翻译： 公开了一种在形成金属背接触之前制备碲化镉表面的方法。 该方法可以包括从碲化镉表面除去碳。
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2.发明申请公开(公告)号：US20130076367A1
公开(公告)日：2013-03-28
申请号：US13612591
申请日：2012-09-12
IPC分类号： G01R31/302
CPC分类号： H02S50/10
摘要： Described herein is a method and system for determining a short-circuit current of a solar device before the solar device is tested in a solar simulator. A solar device includes a substrate layer, a front contact layer, a window/emitter layer, an absorber layer and a back contact. A thickness of the window/emitter layer and an absorption wavelength of the absorber layer are determined. The window/emitter layer thickness and absorber layer absorption wavelength are used with a fitting parameter that corresponds to transmission properties of the substrate and first contact layers in order to determine the solar device's short-circuit current.
摘要翻译： 这里描述了一种用于在太阳能模拟器中测试太阳能装置之前确定太阳能装置的短路电流的方法和系统。 太阳能装置包括基底层，前接触层，窗/发射层，吸收层和背接触。 确定窗/发射极层的厚度和吸收层的吸收波长。 使用窗口/发射极层厚度和吸收体层吸收波长，其中拟合参数对应于衬底和第一接触层的透射特性，以便确定太阳能装置的短路电流。
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3.发明授权System and method for estimating the short circuit current of a solar device 有权用于估计太阳能装置的短路电流的系统和方法公开(公告)号：US09246434B2
公开(公告)日：2016-01-26
申请号：US13612591
申请日：2012-09-12
CPC分类号： H02S50/10
摘要： Described herein is a method and system for determining a short-circuit current of a solar device before the solar device is tested in a solar simulator. A solar device includes a substrate layer, a front contact layer, a window/emitter layer, an absorber layer and a back contact. A thickness of the window/emitter layer and an absorption wavelength of the absorber layer are determined. The window/emitter layer thickness and absorber layer absorption wavelength are used with a fitting parameter that corresponds to transmission properties of the substrate and first contact layers in order to determine the solar device's short-circuit current.
摘要翻译： 这里描述了一种用于在太阳能模拟器中测试太阳能装置之前确定太阳能装置的短路电流的方法和系统。 太阳能装置包括基底层，前接触层，窗/发射层，吸收层和背接触。 确定窗/发射极层的厚度和吸收层的吸收波长。 使用窗口/发射极层厚度和吸收体层吸收波长，其中拟合参数对应于衬底和第一接触层的透射性质，以便确定太阳能装置的短路电流。
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公开(公告)号：US20130115720A1
公开(公告)日：2013-05-09
申请号：US13290673
申请日：2011-11-07
CPC分类号： H01L22/12
摘要： A method and apparatus for determining grain size of a surface. A light source is directed at the surface. Reflected light from the surface is detected. A peak surface grain wavelength is determined from the reflected light. The peak surface grain wavelength is converted to a grain size. Grain size of a semiconductor surface is used as a feedback input to control a manufacturing process.
摘要翻译： 一种用于确定表面的晶粒尺寸的方法和装置。 光源指向表面。 检测到来自表面的反射光。 从反射光确定峰面纹波长。 将峰面纹波长转换成晶粒尺寸。 使用半导体表面的晶粒尺寸作为反馈输入来控制制造工艺。
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公开(公告)号：US09252302B2
公开(公告)日：2016-02-02
申请号：US14072237
申请日：2013-11-05
IPC分类号： H01L31/0224 , C11D3/20 , C11D3/30 , C11D7/26 , C11D7/32 , C11D11/00 , H01L31/073 , H01L31/18
CPC分类号： H01L31/022441 , C11D3/2075 , C11D3/30 , C11D7/265 , C11D7/3209 , C11D7/3218 , C11D11/0047 , H01L31/073 , H01L31/18 , H01L31/1828 , Y02E10/543 , Y02P70/521
摘要： A method to preparing Cadmium telluride surface before forming metal back contact is disclosed. The method can include removing carbon from Cadmium telluride surface.
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