Abstract:
An electronic device includes a housing, a chip card received in the housing, and a chip card protecting cover assembly. The chip card protecting cover assembly includes a housing, a first magnet and a second magnet. The magnetic force between the first magnet and the second magnet drives the protecting cover to rotate relative to the housing, thereby covering or exposing the chip card.
Abstract:
An electronic device includes a housing, a chip card received in the housing, and a chip card protecting cover assembly. The chip card protecting cover assembly includes a housing, a first magnet and a second magnet. The magnetic force between the first magnet and the second magnet drives the protecting cover to rotate relative to the housing, thereby covering or exposing the chip card.
Abstract:
The present invention discloses a universal grid composite circuit board testing tool having a probe station, a clamp base and a conducting wire base. The probe station and clamp base separately have a plurality of conducting probes and long needles. Both ends of the long needle are electrically contacted with the testing point and conducting probe of the testing printed circuit board. The conducting wire base includes a conducting wire contact point electrically connected to a plurality of conducting probes in the probe station at the same time, such that when a testing printed circuit board is tested, it is not necessary to prepare a new probe station and a new conducting wire base. The test simply requires users to change the installation positions of the long needles and run a comparison program according to the positions of the testing points of the testing printed circuit board.
Abstract:
The present invention discloses a universal grid composite circuit board testing tool having a probe station, a clamp base and a conducting wire base. The probe station and clamp base separately have a plurality of conducting probes and long needles. Both ends of the long needle are electrically contacted with the testing point and conducting probe of the testing printed circuit board. The conducting wire base includes a conducting wire contact point electrically connected to a plurality of conducting probes in the probe station at the same time, such that when a testing printed circuit board is tested, it is not necessary to prepare a new probe station and a new conducting wire base. The test simply requires users to change the installation positions of the long needles and run a comparison program according to the positions of the testing points of the testing printed circuit board.
Abstract:
A precision printed circuit board testing tool includes a testing tube, having a hollow chamber for installing a second resilient element, and the testing tube being electrically connected to a second testing line; a second testing element, installed in the hollow chamber, and having a second chamber and an opening, and the second testing element being pressed against by the second resilient element; a first testing element, having an internal bushing, a first resilient element and a probe, and including a first chamber for installing the first resilient element, and the probe being installed in the first chamber and pressed against by the first resilient element, and the first testing element being electrically connected to a first testing line. The testing tool is used for testing a PCB circuit with micro resistance to prevent defectives and damages of electronic components.
Abstract:
A precision printed circuit board testing tool includes a testing tube, having a hollow chamber for installing a second resilient element, and the testing tube being electrically connected to a second testing line; a second testing element, installed in the hollow chamber, and having a second chamber and an opening, and the second testing element being pressed against by the second resilient element; a first testing element, having an internal bushing, a first resilient element and a probe, and including a first chamber for installing the first resilient element, and the probe being installed in the first chamber and pressed against by the first resilient element, and the first testing element being electrically connected to a first testing line. The testing tool is used for testing a PCB circuit with micro resistance to prevent defectives and damages of electronic components.