Optical device with superimposed photonic circuits for coupling to one or more optical waveguides
    1.
    发明授权
    Optical device with superimposed photonic circuits for coupling to one or more optical waveguides 有权
    具有用于耦合到一个或多个光波导的叠加光子电路的光学装置

    公开(公告)号:US08493562B2

    公开(公告)日:2013-07-23

    申请号:US12679546

    申请日:2008-10-01

    Abstract: Optical device with superimposed photonic circuits, for coupling to an optical waveguide.Said device comprises a substrate (44) and, on said substrate, an integrated photonic circuit (46) adapted to be coupled to at least one optical waveguide (48) which transmits a light signal (50) and for processing said signal. According to the invention, the circuit comprises two superimposed elementary integrated photonic circuits (52, 54), each of which is adapted to be coupled to a given polarization state of the signal and to process this state. The invention applies particularly to optical telecommunications.

    Abstract translation: 具有叠加光子电路的光学器件,用于耦合到光波导。 所述器件包括衬底(44),并且在所述衬底上,适于耦合到透射光信号(50)并用于处理所述信号的至少一个光波导(48)的集成光子电路(46)。 根据本发明,电路包括两个叠加的基本集成光子电路(52,54),每个电路适于耦合到信号的给定偏振状态并处理该状态。 本发明特别适用于光通信。

    Method of producing a photonic device and corresponding photonic device
    2.
    发明授权
    Method of producing a photonic device and corresponding photonic device 有权
    制造光子器件和相应的光子器件的方法

    公开(公告)号:US08676002B2

    公开(公告)日:2014-03-18

    申请号:US13147015

    申请日:2010-02-01

    CPC classification number: G02B6/43 G02B6/13 G02B6/136

    Abstract: Method of producing a photonic device including at least one light source and at least one photodetector on a structure including a waveguide layer, this method comprising the following steps: a) growing successively on a substrate (10), a photodetection structure (11) and a light source structure (12), the photodetection structure and the light source structure being made of a stack of layers, the light source layers being stacked on top of the photodetector layers and both structures sharing one of these layers. b) bonding the structure obtained by step a) to the said waveguide structure (2), the light source structure being in contact with the said waveguide structure (2), c) removing the substrate (10) from the structure obtained by step b), d) etching the structure (3) obtained by step c) to define the at least one photodetector (4), e) etching the structure obtained by step d) to define the at least one light source (5), f) forming electrodes (44, 43; 54, 53) on the least one photodetector (4) and on the least one light source (5).

    Abstract translation: 一种在包括波导层的结构上制造包括至少一个光源和至少一个光电检测器的光子器件的方法,该方法包括以下步骤:a)在基片(10),光电检测结构(11)和 光源结构(12),所述光电检测结构和所述光源结构由层叠构成,所述光源层堆叠在所述光电检测器层的顶部上,并且两个结构共享这些层之一。 b)将由步骤a)获得的结构连接到所述波导结构(2),所述光源结构与所述波导结构(2)接触,c)从由步骤b获得的结构中去除所述基板(10) ),d)蚀刻由步骤c)获得的结构(3)以限定所述至少一个光电检测器(4),e)蚀刻由步骤d)获得的结构以限定所述至少一个光源(f),f) 在所述至少一个光电检测器(4)上和所述至少一个光源(5)上形成电极(44,43; 54,53)。

    METHOD OF PRODUCING A PHOTONIC DEVICE AND CORRESPONDING PHOTONIC DEVICE
    3.
    发明申请
    METHOD OF PRODUCING A PHOTONIC DEVICE AND CORRESPONDING PHOTONIC DEVICE 有权
    制造光电器件和相关光电器件的方法

    公开(公告)号:US20120063717A1

    公开(公告)日:2012-03-15

    申请号:US13147015

    申请日:2010-02-01

    CPC classification number: G02B6/43 G02B6/13 G02B6/136

    Abstract: Method of producing a photonic device including at least one light source and at least one photodetector on a structure including a waveguide layer, this method comprising the following steps: a) growing successively on a substrate (10), a photodetection structure (11) and a light source structure (12), the photodetection structure and the light source structure being made of a stack of layers, the light source layers being stacked on top of the photodetector layers and both structures sharing one of these layers. b) bonding the structure obtained by step a) to the said waveguide structure (2), the light source structure being in contact with the said waveguide structure (2), c) removing the substrate (10) from the structure obtained by step b), d) etching the structure (3) obtained by step c) to define the at least one photodetector (4), e) etching the structure obtained by step d) to define the at least one light source (5), f) forming electrodes (44, 43; 54, 53) on the least one photodetector (4) and on the least one light source (5).

    Abstract translation: 一种在包括波导层的结构上制造包括至少一个光源和至少一个光电检测器的光子器件的方法,该方法包括以下步骤:a)在基片(10),光电检测结构(11)和 光源结构(12),所述光电检测结构和所述光源结构由层叠构成,所述光源层堆叠在所述光电检测器层的顶部上,并且两个结构共享这些层之一。 b)将由步骤a)获得的结构连接到所述波导结构(2),所述光源结构与所述波导结构(2)接触,c)从由步骤b获得的结构中去除所述基板(10) ),d)蚀刻由步骤c)获得的结构(3)以限定所述至少一个光电检测器(4),e)蚀刻由步骤d)获得的结构以限定所述至少一个光源(f),f) 在所述至少一个光电检测器(4)上和所述至少一个光源(5)上形成电极(44,43; 54,53)。

    Non-destructive testing of an integrated optical coupler in an integrated optical circuit
    4.
    发明授权
    Non-destructive testing of an integrated optical coupler in an integrated optical circuit 有权
    集成光耦合器在集成光电路中的非破坏性测试

    公开(公告)号:US07948615B2

    公开(公告)日:2011-05-24

    申请号:US12423175

    申请日:2009-04-14

    CPC classification number: G01M11/02 G01M11/35

    Abstract: A non-destructive method for characterizing a surface-illuminated integrated optical coupler associated with an optical waveguide, comprising the steps of measuring the reflection coefficient on a first region of the coupler at a distance from the optical waveguide and constructing a first curve, determining a first model of the reflection coefficient on the first region, performing a first parameter fitting between the first curve and the first model to determine first parameters, measuring the reflection coefficient on a second region of the coupler close to the guide, and constructing a second curve, determining a second model of the reflection coefficient on the second region, performing a second parameter fitting between the second curve and the second model to determine second parameters, and constructing the characteristic of the coupling efficiency of the coupler using the first and second parameters.

    Abstract translation: 一种用于表征与光波导相关联的表面照明集成光耦合器的非破坏性方法,包括以下步骤:在与光波导一定距离处测量耦合器的第一区域上的反射系数并构建第一曲线,确定 在第一区域上反射系数的第一模型,执行第一曲线与第一模型之间的第一参数拟合以确定第一参数,测量接近导向器的耦合器的第二区域上的反射系数,以及构造第二曲线 确定所述第二区域上的所述反射系数的第二模型,执行所述第二曲线与所述第二模型之间的第二参数拟合以确定第二参数,以及使用所述第一和第二参数构建所述耦合器的耦合效率的特性。

    NON-DESTRUCTIVE TESTING OF AN INTEGRATED OPTICAL COUPLER IN AN INTEGRATED OPTICAL CIRCUIT
    6.
    发明申请
    NON-DESTRUCTIVE TESTING OF AN INTEGRATED OPTICAL COUPLER IN AN INTEGRATED OPTICAL CIRCUIT 有权
    一体化光电耦合器的非破坏性测试

    公开(公告)号:US20090262336A1

    公开(公告)日:2009-10-22

    申请号:US12423175

    申请日:2009-04-14

    CPC classification number: G01M11/02 G01M11/35

    Abstract: A non-destructive method for characterizing a surface-illuminated integrated optical coupler associated with an optical waveguide, comprising the steps of measuring the reflection coefficient on a first region of the coupler at a distance from the optical waveguide and constructing a first curve, determining a first model of the reflection coefficient on the first region, performing a first parameter fitting between the first curve and the first model to determine first parameters, measuring the reflection coefficient on a second region of the coupler close to the guide, and constructing a second curve, determining a second model of the reflection coefficient on the second region, performing a second parameter fitting between the second curve and the second model to determine second parameters, and constructing the characteristic of the coupling efficiency of the coupler using the first and second parameters.

    Abstract translation: 一种用于表征与光波导相关联的表面照明集成光耦合器的非破坏性方法,包括以下步骤:在与光波导一定距离处测量耦合器的第一区域上的反射系数并构建第一曲线,确定 在第一区域上反射系数的第一模型,执行第一曲线与第一模型之间的第一参数拟合以确定第一参数,测量接近导向器的耦合器的第二区域上的反射系数,以及构造第二曲线 确定所述第二区域上的所述反射系数的第二模型,执行所述第二曲线与所述第二模型之间的第二参数拟合以确定第二参数,以及使用所述第一和第二参数构建所述耦合器的耦合效率的特性。

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