MULTI-LAYER SUBSTRATE STRUCTURE AND MANUFACTURING METHOD FOR THE SAME
    1.
    发明申请
    MULTI-LAYER SUBSTRATE STRUCTURE AND MANUFACTURING METHOD FOR THE SAME 审中-公开
    多层基板结构及其制造方法

    公开(公告)号:US20130147021A1

    公开(公告)日:2013-06-13

    申请号:US13806787

    申请日:2011-06-21

    IPC分类号: H01L21/02 H01L29/02

    摘要: A method for manufacturing a multi-layer substrate structure such as a CSOI wafer structure (cavity-SOI, silicon-on-insulator) comprising obtaining a first and second wafer, such as two silicon wafers, wherein at least one of the wafers may be optionally provided with a material layer such as an oxide layer (302, 404), forming a cavity on the bond side of the first wafer (306, 406), depositing, preferably by ALD (Atomic Layer Deposition), a material layer, such as thin alumina layer, on either wafer arranged so as to at least in places face the other wafer and cover at least portion of the cavity of the first wafer, such as bottom, wall and/or edge thereof, and enable stopping etching, such as dry etching, into the underlying material (308, 408), and bonding the wafers provided with at least the aforesaid ALD layer as an intermediate layer together to form the multi-layer semiconductor substrate structure (310, 312). A related multi-layer substrate structure is presented.

    摘要翻译: 一种用于制造诸如CSOI晶片结构(空腔SOI,绝缘体上硅)的多层衬底结构的方法,包括获得诸如两个硅晶片的第一和第二晶片,其中至少一个晶片可以是 可选地设置有诸如氧化物层(302,404)的材料层,在第一晶片(306,406)的接合侧上形成空腔,优选通过ALD(原子层沉积)沉积材料层,例如 作为薄氧化铝层,在任一晶片上布置成至少在面对另一晶片的位置并且覆盖第一晶片的空腔的至少一部分,例如底部,壁和/或边缘,并且能够停止蚀刻,例如 作为干蚀刻,进入下层材料(308,408),并且将设置有至少上述ALD层的晶片作为中间层结合在一起以形成多层半导体衬底结构(310,312)。 提出了相关的多层基板结构。

    ELECTRICALLY TUNABLE FABRY-PEROT INTERFEROMETER, AN INTERMEDIATE PRODUCT AN ELECTRODE ARRANGEMENT AND A METHOD FOR PRODUCING AN ELECTRICALLY TUNABLE FABRY-PEROT INTERFEROMETER
    2.
    发明申请
    ELECTRICALLY TUNABLE FABRY-PEROT INTERFEROMETER, AN INTERMEDIATE PRODUCT AN ELECTRODE ARRANGEMENT AND A METHOD FOR PRODUCING AN ELECTRICALLY TUNABLE FABRY-PEROT INTERFEROMETER 审中-公开
    电动式可编程封装式干涉仪,中间产品电极装置和一种生产电动TUNABLE FABRY-PEROT干燥仪的方法

    公开(公告)号:US20110279824A1

    公开(公告)日:2011-11-17

    申请号:US13146319

    申请日:2010-01-27

    CPC分类号: G02B26/001

    摘要: Electrically tunable Fabry-Perot interferometers which are produced with micromechanical (MEMS) technology. Producing interferometers with prior art processes includes costly and complicated production phases. Therefore, it has not been possible to apply interferometers in consumer mass products. According to the present solution, the Fabry-Perot cavity is made by removing a sacrificial layer (112) which has been polymer material. A mirror layer (113, 117-120) which is produced above the sacrificial layer can be made with atomic layer deposition technology, for example. According to a preferable embodiment, electrodes (106b, 115b) of the mirror structures are formed by using sputtering or evaporation. With the present solution it is possible to avoid the above mentioned problems related with prior art.

    摘要翻译: 使用微机械(MEMS)技术生产的电可调法布里 - 珀罗干涉仪。 用现有技术的工艺生产干涉仪包括昂贵且复杂的生产阶段。 因此,在消费者大众产品中不可能应用干涉仪。 根据本解决方案,通过去除已经是聚合物材料的牺牲层(112)来制造法布里 - 珀罗腔。 例如,可以用原子层沉积技术制造在牺牲层之上产生的镜面层(113,117-120)。 根据优选实施例,通过使用溅射或蒸发形成反射镜结构的电极(106b,115b)。 利用本解决方案,可以避免与现有技术相关的上述问题。