Ion barrier cap
    1.
    发明申请
    Ion barrier cap 失效
    离子屏障盖

    公开(公告)号:US20110149636A1

    公开(公告)日:2011-06-23

    申请号:US12803810

    申请日:2010-07-06

    IPC分类号: G11C11/00 H01L45/00

    摘要: An ion barrier layer made from a dielectric material in contact with an electronically insulating layer is operative to prevent mobile ions transported into the electronically insulating layer from passing through the ion barrier layer and into adjacent layers during data operations on a non-volatile memory cell. A conductive oxide layer in contact with the electronically insulating layer is the source of the mobile ions. A programming data operation is operative to transport a portion of the mobile ions into the electronically insulating layer and an erase data operation is operative to transport the mobile ions back into the conductive oxide layer. When the portion is positioned in the electronically insulating layer the memory cell stores data as a programmed conductivity profile and when a substantial majority of the mobile ions are positioned in the conductive oxide layer the memory cell stores data as an erased conductivity profile.

    摘要翻译: 由与电绝缘层接触的介电材料制成的离子阻挡层可操作以防止在对非易失性存储单元的数据操作期间传输到电绝缘层中的移动离子通过离子阻挡层并进入相邻层。 与电绝缘层接触的导电氧化物层是可移动离子的源。 编程数据操作用于将一部分移动离子传输到电绝缘层中,并且擦除数据操作可操作以将移动离子传输回到导电氧化物层中。 当该部分位于电绝缘层中时,存储单元将数据存储为编程电导率分布,并且当大部分移动离子位于导电氧化物层中时,存储单元将数据存储为擦除的电导率分布。