公开(公告)号：US07356742B2

公开(公告)日：2008-04-08

申请号：US11107896

申请日：2005-04-18

申请人： Hideyuki Aoki ,  Takeshi Wada ,  Masaaki Namba ,  Noboru Uchida ,  Shigeki Katsumi ,  Yuji Wada ,  Masaaki Mochiduki

发明人： Hideyuki Aoki ,  Takeshi Wada ,  Masaaki Namba ,  Noboru Uchida ,  Shigeki Katsumi ,  Yuji Wada ,  Masaaki Mochiduki

IPC分类号： G11C29/00

CPC分类号： G11C29/56

摘要： A memory test system can screen objects of tests accurately at low cost in quasi-operating conditions by utilizing a personal computer (PC). The system utilizes a PC tester comprising a measurement PC unit that carries a memory module to be used as reference; a signal distribution unit for distributing the signal taken out form the measurement PC unit; a plurality of performance boards (PFBs) mounted with respective objected products to be observed simultaneously by using the signals distributed by the signal distribution unit; a display panel for displaying the current status of the test that is being conducted; a power source for producing the operating voltage of the system; and a control PC for controlling the selection of test parameters and various analytical operations. The PC tester is adapted to take out the signal from the chipset LSI (large scale integrated circuit) on the PC mother board in the measurement PC unit to the individual memories on the memory module or the memory module per se and test them in quasi-operating conditions.

摘要翻译： 记忆测试系统可以通过使用个人计算机（PC）在准操作条件下以低成本准确地屏蔽测试对象。 该系统利用包括测量PC单元的PC测试器，该单元携带用作参考的存储器模块; 信号分配单元，用于分配从测量PC单元取出的信号; 通过使用由信号分配单元分配的信号同时观察安装有相应对象产品的多个性能板（PFB）; 用于显示正在进行的测试的当前状态的显示面板; 用于产生系统的工作电压的电源; 以及用于控制测试参数和各种分析操作的选择的控制PC。 PC测试器适用于将测量PC单元中的PC母板上的芯片组LSI（大规模集成电路）的信号从存储器模块或存储器模块本身的各个存储器中取出， 运行条件。

公开(公告)号：US20050193274A1

公开(公告)日：2005-09-01

申请号：US11107896

申请日：2005-04-18

申请人： Hideyuki Aoki ,  Takeshi Wada ,  Masaaki Namba ,  Noboru Uchida ,  Shigeki Katsumi ,  Yuji Wada ,  Masaaki Mochiduki

发明人： Hideyuki Aoki ,  Takeshi Wada ,  Masaaki Namba ,  Noboru Uchida ,  Shigeki Katsumi ,  Yuji Wada ,  Masaaki Mochiduki

IPC分类号： G01R31/28 ,  G06F12/16 ,  G11C29/56 ,  G06F11/00

CPC分类号： G11C29/56

摘要： A memory test system can screen objects of tests accurately at low cost in quasi-operating conditions by utilizing a personal computer. The system utilizes a PC tester comprising a measurement PC unit that carries a memory module to be used as reference; a signal distribution unit for distributing the signal taken out from the measurement PC unit; a plurality of PFBs mounted with respective objected products to be observed simultaneously by using the signals distributed by the signal distribution unit; a display panel for displaying the current status of the test that is being conducted; a power source for producing the operating voltage of the system; and a control PC for controlling the selection of test parameters and various analytical operations. The PC tester is adapted to take out the signal from the chip set LSI on the PC mother board in the measurement PC unit to the individual memories on the memory module or the memory module per se and test them in quasi-operating conditions.

摘要翻译： 记忆测试系统可以通过使用个人计算机在准操作条件下以低成本准确地屏蔽测试对象。 该系统利用包括测量PC单元的PC测试器，该单元携带用作参考的存储器模块; 信号分配单元，用于分配从测量PC单元取出的信号; 通过使用由信号分配单元分配的信号同时观察安装有相应对象产品的多个PFB; 用于显示正在进行的测试的当前状态的显示面板; 用于产生系统的工作电压的电源; 以及用于控制测试参数和各种分析操作的选择的控制PC。 PC测试器适于将测量PC单元中的PC母板上的芯片组LSI的信号从存储器模块或存储器模块本身的各个存储器中取出，并在准工作条件下进行测试。