MICROWAVE READOUT FOR FLUX-BIASED QUBITS
    1.
    发明申请
    MICROWAVE READOUT FOR FLUX-BIASED QUBITS 有权
    微处理器为微处理器提供微波读取

    公开(公告)号:US20090289638A1

    公开(公告)日:2009-11-26

    申请号:US12126015

    申请日:2008-05-23

    CPC classification number: G06N99/002 B82Y10/00

    Abstract: A method for determining whether a quantum system comprising a superconducting qubit is occupying a first basis state or a second basis state once a measurement is performed is provided. The method, comprising: applying a signal having a frequency through a transmission line coupled to the superconducting qubit characterized by two distinct, separate, and stable states of differing resonance frequencies each corresponding to the occupation of the first or second basis state prior to measurement; and measuring at least one of an output power or phase at an output port of the transmission line, wherein the measured output power or phase is indicative of whether the superconducting qubit is occupying the first basis state or the second basis state.

    Abstract translation: 提供了一旦确定包括超导量子位的量子系统是否在执行测量时占据第一基础状态或第二基础状态的方法。 该方法包括:通过耦合到超导量子位的传输线施加具有频率的信号,其特征在于两个不同的,独立的和稳定的不同共振频率的状态,每个共振频率对应于在测量之前占用第一或第二基准状态; 并且测量所述传输线的输出端口处的输出功率或相位中的至少一个,其中所述测量的输出功率或相位指示所述超导量子位是否占据所述第一基准状态或所述第二基准状态。

    Microwave readout for flux-biased qubits
    2.
    发明授权
    Microwave readout for flux-biased qubits 有权
    用于磁通偏置量子位的微波读数

    公开(公告)号:US07932514B2

    公开(公告)日:2011-04-26

    申请号:US12126015

    申请日:2008-05-23

    CPC classification number: G06N99/002 B82Y10/00

    Abstract: A method for determining whether a quantum system comprising a superconducting qubit is occupying a first basis state or a second basis state once a measurement is performed is provided. The method, comprising: applying a signal having a frequency through a transmission line coupled to the superconducting qubit characterized by two distinct, separate, and stable states of differing resonance frequencies each corresponding to the occupation of the first or second basis state prior to measurement; and measuring at least one of an output power or phase at an output port of the transmission line, wherein the measured output power or phase is indicative of whether the superconducting qubit is occupying the first basis state or the second basis state.

    Abstract translation: 提供了一旦确定包括超导量子位的量子系统是否在执行测量时占据第一基础状态或第二基础状态的方法。 该方法包括:通过耦合到超导量子位的传输线施加具有频率的信号,其特征在于两个不同的,独立的和稳定的不同共振频率的状态,每个共振频率对应于在测量之前占用第一或第二基准状态; 并且测量所述传输线的输出端口处的输出功率或相位中的至少一个,其中所述测量的输出功率或相位指示所述超导量子位是否占据所述第一基准状态或所述第二基准状态。

    Measuring quantum states of superconducting resonators
    3.
    发明授权
    Measuring quantum states of superconducting resonators 有权
    测量超导谐振器的量子态

    公开(公告)号:US08117000B2

    公开(公告)日:2012-02-14

    申请号:US12507977

    申请日:2009-07-23

    CPC classification number: G06N99/002 B82Y10/00

    Abstract: A method for measuring the quantum state of a resonator includes, exciting an input port of a circuit with signal, measuring a phase shift of the signal at an output port of the circuit, wherein the resonator is coupled to the input and the output ports, and calculating a quantum state of the resonator as a function of the measured phase shift of the signal.

    Abstract translation: 用于测量谐振器的量子态的方法包括:用信号激励电路的输入端口,测量电路的输出端口处的信号的相移,其中谐振器耦合到输入端口和输出端口, 并且根据所测量的信号相移计算谐振器的量子态。

    Measuring Quantum States of Superconducting Resonators
    4.
    发明申请
    Measuring Quantum States of Superconducting Resonators 有权
    测量超导谐振器的量子态

    公开(公告)号:US20110022340A1

    公开(公告)日:2011-01-27

    申请号:US12507977

    申请日:2009-07-23

    CPC classification number: G06N99/002 B82Y10/00

    Abstract: A method for measuring the quantum state of a resonator includes, exciting an input port of a circuit with signal, measuring a phase shift of the signal at an output port of the circuit, wherein the resonator is coupled to the input and the output ports, and calculating a quantum state of the resonator as a function of the measured phase shift of the signal.

    Abstract translation: 用于测量谐振器的量子态的方法包括:用信号激励电路的输入端口,测量电路的输出端口处的信号的相移,其中谐振器耦合到输入端口和输出端口, 并且根据所测量的信号相移计算谐振器的量子态。

    Microwave readout for flux-biased qubits
    6.
    发明授权
    Microwave readout for flux-biased qubits 有权
    用于磁通偏置量子位的微波读数

    公开(公告)号:US08294138B2

    公开(公告)日:2012-10-23

    申请号:US13026339

    申请日:2011-02-14

    CPC classification number: G06N99/002 B82Y10/00

    Abstract: A method for determining whether a quantum system comprising a superconducting qubit is occupying a first basis state or a second basis state once a measurement is performed is provided. The method, comprising: applying a signal having a frequency through a transmission line coupled to the superconducting qubit characterized by two distinct, separate, and stable states of differing resonance frequencies each corresponding to the occupation of the first or second basis state prior to measurement; and measuring at least one of an output power or phase at an output port of the transmission line, wherein the measured output power or phase is indicative of whether the superconducting qubit is occupying the first basis state or the second basis state.

    Abstract translation: 提供了一旦确定包括超导量子位的量子系统是否在执行测量时占据第一基础状态或第二基础状态的方法。 该方法包括:通过耦合到超导量子位的传输线施加具有频率的信号,其特征在于两个不同的,独立的和稳定的不同共振频率的状态,每个共振频率对应于在测量之前占用第一或第二基准状态; 并且测量所述传输线的输出端口处的输出功率或相位中的至少一个,其中所述测量的输出功率或相位指示所述超导量子位是否占据所述第一基准状态或所述第二基准状态。

    INPUT DEVICE WITH INTEGRATED DEFORMABLE ELECTRODE STRUCTURE FOR FORCE SENSING
    10.
    发明申请
    INPUT DEVICE WITH INTEGRATED DEFORMABLE ELECTRODE STRUCTURE FOR FORCE SENSING 有权
    具有集成可变电极结构的输入装置,用于感测

    公开(公告)号:US20130068038A1

    公开(公告)日:2013-03-21

    申请号:US13238783

    申请日:2011-09-21

    Abstract: Devices and methods are provided that facilitate improved input device performance. The devices and methods utilize a first electrode and a second electrode disposed on a first substrate and a deformable electrode structure. The deformable electrode structure overlaps the first electrode and the second electrode to define a variable capacitance between the first electrode and the second electrode that changes with the deformation of the deformable electrode structure. The deformable electrode structure comprises a spacing component configured to provide spacing between the deformable electrode structure and the first electrode and the second electrode. Finally, a transmission component is configured such that biasing the transmission component causes the deformable electrode structure to deform and change the variable capacitance. A measurement of the variable capacitance can be used to determine force information regarding the force biasing the transmission component.

    Abstract translation: 提供了便于改进输入设备性能的设备和方法。 所述装置和方法利用设置在第一基板和可变形电极结构上的第一电极和第二电极。 可变形电极结构与第一电极和第二电极重叠,以限定随着可变形电极结构的变形而变化的第一电极和第二电极之间的可变电容。 可变形电极结构包括间隔部件,其配置成提供可变形电极结构与第一电极和第二电极之间的间隔。 最后,传动部件被配置成使得偏置传动部件使可变形电极结构变形并改变可变电容。 可以使用可变电容的测量来确定关于偏置传输部件的力的力信息。

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