摘要:
A microscope including an imaging optical unit, a sample stage for supporting a sample to be examined, a movement unit, by which the distance between sample stage and imaging optical unit can be altered, a focus measuring unit, which measures the present focus position and outputs a focus measurement signal, a control unit for maintaining a predetermined focus position for examinations of the sample that are separated from one another in time. The control unit receives the focus measurement signal and derives a deviation of the present focus position from the predetermined focus position. Dependent on the deviation derived the movement unit, changes the distance between sample stage and imaging optical unit so that the predetermined focus position is maintained. The control unit drives the movement unit (9) for maintaining the predetermined focus position only before and/or after at least one of the examinations, but never during the examinations.
摘要:
A microscope including an imaging optical unit, a sample stage for supporting a sample to be examined, a movement unit, by which the distance between sample stage and imaging optical unit can be altered, a focus measuring unit, which measures the present focus position and outputs a focus measurement signal, a control unit for maintaining a predetermined focus position for examinations of the sample that are separated from one another in time. The control unit receives the focus measurement signal and derives a deviation of the present focus position from the predetermined focus position. Dependent on the deviation derived the movement unit, changes the distance between sample stage and imaging optical unit so that the predetermined focus position is maintained. The control unit drives the movement unit (9) for maintaining the predetermined focus position only before and/or after at least one of the examinations, but never during the examinations.
摘要:
The invention relates to a microscope having a stage for supporting a sample to be examined, a recording sensor, an imaging optic for imaging the sample onto the recording sensor, a moving unit by means of which the distance between the stage and the imaging optic can be changed, a control unit for controlling an image recording of the sample and a focus-holding unit for maintaining a prescribed focal position for image recording of the sample at temporal intervals, wherein the focus-holding device comprises at least one hardware element and one software module, wherein the focus-holding unit is fully integrated in the control unit, on both the hardware and software sides.
摘要:
The invention relates to a microscope having a stage for supporting a sample to be examined, a recording sensor, an imaging optic for imaging the sample onto the recording sensor, a moving unit by means of which the distance between the stage and the imaging optic can be changed, a control unit for controlling an image recording of the sample and a focus-holding unit for maintaining a prescribed focal position for image recording of the sample at temporal intervals, wherein the focus-holding device comprises at least one hardware element and one software module, wherein the focus-holding unit is fully integrated in the control unit, on both the hardware and software sides.
摘要:
In a method for determining configuration-dependent and state-dependent microscope parameters which are influenced by a plurality of microscope components that are arranged in the optical path of a microscope, it is the object of the invention to design the quantification method for the microscope parameters in a universally usable manner, i.e., so as to be applicable in an improved manner for microscopes of different constructions. After preparing a microscope-specific tree structure of the optical paths which proceeds from an object to be observed and extends from the start of the illumination beam paths to the end of the observation beam paths, the positions of the microscope components in the tree structure and components preceding and succeeding each of the microscope components are determined. Proceeding from a starting point in the tree structure, the degree of influence exerted on the microscope parameter to be determined is determined recursively along a chain of preceding components or succeeding components as a partial contribution for each microscope component exerting an influence in order to determine from the partial contributions the total influence exerted on the microscope parameter by the microscope components.