公开(公告)号：US20150168482A1

公开(公告)日：2015-06-18

申请号：US14104602

申请日：2013-12-12

申请人： Todd M. Flynn ,  Christopher W. Argento ,  Steven A. Faillaci ,  Thomas H. Lee

发明人： Todd M. Flynn ,  Christopher W. Argento ,  Steven A. Faillaci ,  Thomas H. Lee

IPC分类号： G01R31/26 ,  G01R1/067 ,  G01R1/04 ,  G01R31/28

CPC分类号： G01R31/2889 ,  G01R31/2834

摘要： An electronic component test device capable of testing electronic components in a plurality of test configurations. The device includes a probe head for providing a plurality of probe contact structures to an electronic component to be tested. The device includes an interconnect board coupled to the probe head. The interconnect board includes a plurality of conductive terminals, each of a first subset of the plurality of conductive terminals is coupled to one of a group of electrical signal lines for coupling to different types of external signals. The interconnect board includes a plurality of conductive lines. Each conductive line is coupled between a corresponding one of a plurality of conductive terminals in a second subset of the plurality of conductive terminals and a terminal for coupling to one of the plurality of probe contact structures. Each conductive terminal of the second subset is couplable by an interconnector of a plurality of interconnectors to a conductive terminal of multiple conductive terminals of the first subset based on a test configuration of the device.

摘要翻译： 一种能够测试多个测试配置中的电子部件的电子部件测试装置。 该装置包括用于向待测试的电子部件提供多个探针接触结构的探针头。 该装置包括耦合到探针头的互连板。 互连板包括多个导电端子，多个导电端子的第一子集中的每一个耦合到一组电信号线中的一个，用于耦合到不同类型的外部信号。 互连板包括多条导线。 每个导电线耦合在多个导电端子的第二子集中的多个导电端子中的相应一个导体端子和用于耦合到多个探针接触结构中的一个的端子。 基于设备的测试配置，第二子集的每个导电端子由多个互连器的互连器耦合到第一子集的多个导电端子的导电端子。