公开(公告)号：US20200284707A1

公开(公告)日：2020-09-10

申请号：US16763319

申请日：2018-11-13

申请人： Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Bartosz Nowawski ,  Douglas D. Stauffer

发明人： Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Bartosz Nowawski ,  Douglas D. Stauffer

IPC分类号： G01N3/06

摘要： Among other things, a heating jacket configured for heating a mechanical testing instrument having a probe is disclosed herein. The heating jacket includes a heating element including a jacket wall, and the jacket wall extends around a probe recess, the jacket wall is configured to receive a probe of a mechanical testing instrument within the probe recess, and the heating element is mechanically isolated from the probe with a probe gap. Additionally, a system to correct for thermomechanical drift in a mechanical testing assembly is disclosed herein. The system isolates the mechanical testing instrument from thermomechanical drift of a system frame using a determined difference between, for instance, a probe displacement and a sample displacement.

公开(公告)号：US09316569B2

公开(公告)日：2016-04-19

申请号：US13510825

申请日：2010-08-26

申请人： Yunje Oh ,  Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Oden Lee Warren

发明人： Yunje Oh ,  Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Oden Lee Warren

IPC分类号： G01N3/18 ,  G01N3/08 ,  H01J37/20 ,  G01N3/42

CPC分类号： G01N1/42 ,  G01N3/08 ,  G01N3/18 ,  G01N3/42 ,  G01N2203/0226 ,  G01N2203/0286 ,  G01N2203/04 ,  G01N2223/418 ,  H01J37/20 ,  H05B1/023 ,  H05B3/06 ,  H05B3/22

摘要： A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

摘要翻译： 一种亚微米级属性测试装置，包括测试对象支架和加热组件。 组件包括构造成与亚微米机械测试仪器和电 - 机械换能器组件联接的保持器基座。 组件还包括与保持器基座联接的测试对象级。 测试对象阶段与保持器基座热隔离。 测试对象阶段包括被配置为接收测试对象的舞台对象表面和支撑舞台对象表面的舞台。 舞台板在舞台主体表面下。 测试对象阶段还包括与舞台对象表面相邻的加热元件，加热元件构造成在舞台对象表面处产生热量。

公开(公告)号：US08844366B2

公开(公告)日：2014-09-30

申请号：US14004138

申请日：2012-03-09

申请人： Oden Lee Warren ,  Syed Amanulla Syed Asif ,  Yunje Oh ,  Yuxin Feng ,  Edward Cyrankowski ,  Ryan Major

发明人： Oden Lee Warren ,  Syed Amanulla Syed Asif ,  Yunje Oh ,  Yuxin Feng ,  Edward Cyrankowski ,  Ryan Major

IPC分类号： G01B7/16

CPC分类号： G01B7/16 ,  G01D5/2417 ,  G01L5/165 ,  G01N3/42 ,  G01N2203/0286 ,  G01Q60/366

摘要： A testing instrument for mechanical testing at nano or micron scale includes a transducer body, and a coupling shaft coupled with a probe tip. A transducer body houses a capacitor. The capacitor includes first and second counter electrodes and a center electrode assembly interposed therebetween. The center electrode assembly is movable with the coupling shaft relative to the first and second counter electrodes, for instance in one or more of dimensions including laterally and normally. The center electrode assembly includes a center plate coupled with the coupling shaft and one or more springs extending from the center plate. Upper and lower plates are coupled with the center plate and cover the center plate and the one or more springs. A shaft support assembly includes one or more support elements coupled along the coupling shaft. The shaft support assembly provides lateral support to the coupling shaft.

摘要翻译： 用于纳米或微米级的机械测试的测试仪器包括换能器主体和耦合轴与探针尖端耦合。 传感器体容纳电容器。 该电容器包括第一和第二对置电极和介于其间的中心电极组件。 中心电极组件可以通过联接轴相对于第一和第二对电极移动，例如在横向和正常的一个或多个维度中。 中心电极组件包括与联接轴联接的中心板和从中心板延伸的一个或多个弹簧。 上板和下板与中心板连接并覆盖中心板和一个或多个弹簧。 轴支撑组件包括沿联接轴联接的一个或多个支撑元件。 轴支撑组件为联接轴提供横向支撑。

公开(公告)号：US20140150562A1

公开(公告)日：2014-06-05

申请号：US14004138

申请日：2012-03-09

申请人： Oden Lee Warren ,  Syed Amanulla Syed Asif ,  Yunje Oh ,  Yuxin Feng ,  Edward Cyrankowski ,  Ryan Major

发明人： Oden Lee Warren ,  Syed Amanulla Syed Asif ,  Yunje Oh ,  Yuxin Feng ,  Edward Cyrankowski ,  Ryan Major

IPC分类号： G01B7/16

CPC分类号： G01B7/16 ,  G01D5/2417 ,  G01L5/165 ,  G01N3/42 ,  G01N2203/0286 ,  G01Q60/366

摘要： A testing instrument for mechanical testing at nano or micron scale includes a transducer body, and a coupling shaft coupled with a probe tip. A transducer body houses a capacitor. The capacitor includes first and second counter electrodes and a center electrode assembly interposed therebetween. The center electrode assembly is movable with the coupling shaft relative to the first and second counter electrodes, for instance in one or more of dimensions including laterally and normally. The center electrode assembly includes a center plate coupled with the coupling shaft and one or more springs extending from the center plate. Upper and lower plates are coupled with the center plate and cover the center plate and the one or more springs. A shaft support assembly includes one or more support elements coupled along the coupling shaft. The shaft support assembly provides lateral support to the coupling shaft.

摘要翻译： 用于纳米或微米级的机械测试的测试仪器包括换能器主体和耦合轴与探针尖端耦合。 传感器体容纳电容器。 该电容器包括第一和第二对置电极和介于其间的中心电极组件。 中心电极组件可以通过联接轴相对于第一和第二对电极移动，例如在横向和正常的一个或多个维度中。 中心电极组件包括与联接轴联接的中心板和从中心板延伸的一个或多个弹簧。 上板和下板与中心板连接并覆盖中心板和一个或多个弹簧。 轴支撑组件包括沿联接轴联接的一个或多个支撑元件。 轴支撑组件为联接轴提供横向支撑。

公开(公告)号：US20120292528A1

公开(公告)日：2012-11-22

申请号：US13510825

申请日：2010-08-26

申请人： Yunje Oh ,  Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Oden Lee Warren

发明人： Yunje Oh ,  Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Oden Lee Warren

IPC分类号： H01J37/20

CPC分类号： G01N1/42 ,  G01N3/08 ,  G01N3/18 ,  G01N3/42 ,  G01N2203/0226 ,  G01N2203/0286 ,  G01N2203/04 ,  G01N2223/418 ,  H01J37/20 ,  H05B1/023 ,  H05B3/06 ,  H05B3/22

摘要： A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

摘要翻译： 一种亚微米级属性测试装置，包括测试对象支架和加热组件。 组件包括构造成与亚微米机械测试仪器和电 - 机械换能器组件联接的保持器基座。 组件还包括与保持器基座联接的测试对象级。 测试对象阶段与保持器基座热隔离。 测试对象阶段包括被配置为接收测试对象的舞台对象表面和支撑舞台对象表面的舞台。 舞台板在舞台主体表面下。 测试对象阶段还包括与舞台对象表面相邻的加热元件，加热元件构造成在舞台对象表面处产生热量。