公开(公告)号：US20070154076A1

公开(公告)日：2007-07-05

申请号：US11714200

申请日：2007-03-06

Applicant: Shouhei Numata ,  Tarou Takagi

Inventor： Shouhei Numata ,  Tarou Takagi

IPC: G06K9/00

CPC classification number: G06T3/00 ,  G01N23/04 ,  G06F3/1415 ,  G06T15/00 ,  G09G5/39 ,  G09G2340/0407 ,  Y10S378/901

Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.

公开(公告)号：US20070124107A1

公开(公告)日：2007-05-31

申请号：US11699355

申请日：2007-01-30

Applicant: Shouhei Numata ,  Noriyuki Sadaoka ,  Tarou Takagi

Inventor： Shouhei Numata ,  Noriyuki Sadaoka ,  Tarou Takagi

IPC: G01B7/28

CPC classification number: G06T7/55 ,  G06T17/10 ,  G06T2207/10081 ,  G06T2207/30164

Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.

Abstract translation: 一种形状模型生成方法或系统，用于从诸如X射线CT数据的形状描述数据生成形状模型，所述形状描述数据包括通过虚拟探针测量单元的过程，使得被定义为虚拟空间中具有有限扩展的区域的虚拟探针 所述形状描述数据顺序地扫描由探测路径设置单元顺序设置的多个探测路径，测量形状描述数据，从而获取针对每个探测路径的虚拟探针的虚拟空间中的位置所特有的特征值，以及 所述探测路径设定单元使用为所述探测路径获得的特征值来生成新的探测路径，由此顺序地设定所述多个探测路径。

公开(公告)号：US07203352B2

公开(公告)日：2007-04-10

申请号：US11525843

申请日：2006-09-25

Applicant: Shouhei Numata ,  Tarou Takagi

Inventor： Shouhei Numata ,  Tarou Takagi

IPC: G06K9/00

CPC classification number: G06T3/00 ,  G01N23/04 ,  G06F3/1415 ,  G06T15/00 ,  G09G5/39 ,  G09G2340/0407 ,  Y10S378/901

Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.

Abstract translation: 一种数据处理装置，包括用于显示数据的显示装置; 用于记录大容量位图数据的第一记录装置; 所述第二记录装置记录形成为通过渲染大容量位图数据而获得的二维图像的索引数据; 所述第一数据处理装置用于从所述第一记录装置读取大容量位图数据，并将所述图像处理应用于所述大容量位图数据; 第二数据处理装置，用于从第一记录装置读取大容量位图数据，通过渲染大容量位图数据并将图像数据传送到显示装置，形成二维图像数据; 所述第三数据处理装置用于将所述索引数据发送到所述显示装置; 以及用于将指令发送到第一，第二和第三数据处理设备的输入设备。

公开(公告)号：US07113563B2

公开(公告)日：2006-09-26

申请号：US11250484

申请日：2005-10-17

Applicant: Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

Inventor： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC: A61B6/03

CPC classification number: H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.

Abstract translation: 一种X射线CT装置，其具有用于将X射线照射到待检查对象的X射线照射器，用于检测穿过被检查物体的X射线的X射线传感器，X射线传感器信号处理 用于处理来自X射线传感器的输出信号的电路，以及CT控制装置，用于根据通过X射线传感器信号处理处理的X射线传感器的输出信号重建被检查物体的图像 电路。 X射线传感器信号处理电路从X射线传感器的输出信号中除去DC分量，并对从其中除去直流分量的X射线传感器的输出信号进行积分。

公开(公告)号：US20060093082A1

公开(公告)日：2006-05-04

申请号：US11259251

申请日：2005-10-27

Applicant: Shouhei Numata ,  Tarou Takagi ,  Noriyuki Sadaoka

Inventor： Shouhei Numata ,  Tarou Takagi ,  Noriyuki Sadaoka

IPC: G01N23/00 ,  G06K9/00

CPC classification number: G06T7/0004 ,  G01N23/046 ,  G01N2223/419 ,  G06T7/66 ,  G06T2207/30164

Abstract: It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.

Abstract translation: 可以使用诸如X射线CT数据的空间离散数据进行内部缺陷检查，具有更高的精度。 一种用于通过使用空间元素来描述物体的空间形状和结构的空间离散数据来检查物体内部缺陷的内部缺陷检查方法包括以下步骤：通过使用内部空间从空间离散数据中提取内部缺陷 缺陷提取单元，通过使用相关的元素收集单元收集包含在邻近范围内的元素，其作为相关元素以围绕由内部缺陷提取单元提取的内部缺陷的预定分布设置; 并且通过使用特征量测量单元，基于由相关元件收集单元收集的相关元素来测量诸如内部缺陷的重心的大小和位置的特征量。

公开(公告)号：US20060069527A1

公开(公告)日：2006-03-30

申请号：US11206929

申请日：2005-08-19

Applicant: Shouhei Numata ,  Noriyuki Sadaoka ,  Tarou Takagi

Inventor： Shouhei Numata ,  Noriyuki Sadaoka ,  Tarou Takagi

IPC: G06F15/00

CPC classification number: G06T7/55 ,  G06T17/10 ,  G06T2207/10081 ,  G06T2207/30164

Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.

公开(公告)号：US06654441B2

公开(公告)日：2003-11-25

申请号：US10086714

申请日：2002-03-04

Applicant: Shouhei Numata ,  Tarou Takagi

Inventor： Shouhei Numata ,  Tarou Takagi

IPC: A61B603

CPC classification number: G06T3/00 ,  G01N23/04 ,  G06F3/1415 ,  G06T15/00 ,  G09G5/39 ,  G09G2340/0407 ,  Y10S378/901

Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.

公开(公告)号：US07640137B2

公开(公告)日：2009-12-29

申请号：US11699355

申请日：2007-01-30

Applicant: Shouhei Numata ,  Noriyuki Sadaoka ,  Tarou Takagi

Inventor： Shouhei Numata ,  Noriyuki Sadaoka ,  Tarou Takagi

IPC: G06F15/00

CPC classification number: G06T7/55 ,  G06T17/10 ,  G06T2207/10081 ,  G06T2207/30164

Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.

Abstract translation: 一种形状模型生成方法或系统，用于从诸如X射线CT数据的形状描述数据生成形状模型，所述形状描述数据包括通过虚拟探针测量单元的过程，使得被定义为虚拟空间中具有有限扩展的区域的虚拟探针 所述形状描述数据顺序地扫描由探测路径设置单元顺序设置的多个探测路径，测量形状描述数据，从而获取针对每个探测路径的虚拟探针的虚拟空间中的位置所特有的特征值，以及 所述探测路径设定单元使用为所述探测路径获得的特征值来生成新的探测路径，由此顺序地设定所述多个探测路径。

公开(公告)号：US07260176B2

公开(公告)日：2007-08-21

申请号：US11519876

申请日：2006-09-13

Applicant: Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

Inventor： Hiroshi Kamimura ,  Shigeru Izumi ,  Hiroshi Kitaguchi ,  Atsushi Yamagoshi ,  Katsutoshi Satoh ,  Noriyuki Sadaoka ,  Tarou Takagi ,  Kouji Kuwabara ,  Shouhei Numata

IPC: A61B6/03

CPC classification number: H04N5/32 ,  G01N23/046 ,  G01N2223/419 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H04N5/361 ,  Y10S378/901

Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.

Abstract translation: 一种用于处理半导体X射线传感器的输出信号的工业X射线CT装置的X射线传感器信号处理电路和方法，该半导体X射线传感器检测从加速器发出的脉冲X射线并通过待检查物体 。 该电路包括：第一电阻器，其一端连接到X射线传感器，另一端连接到地;第一电容器，其一端连接到X射线传感器和第一电阻的连接点，运算放大器 具有连接到第一电容器的另一端的反相输入端和具有并联连接到运算放大器的第二电阻器和第二电容器的积分器。 电路被配置为使得至少在X射线照射之后X射线传感器和第一电容器的偏置条件恢复到稳定状态。

公开(公告)号：US07031424B2

公开(公告)日：2006-04-18

申请号：US11152371

申请日：2005-06-15

Applicant: Tarou Takagi ,  Hiroshi Kamimura ,  Sadao Uchikawa

Inventor： Tarou Takagi ,  Hiroshi Kamimura ,  Sadao Uchikawa

IPC: G01N23/00

CPC classification number: G06K9/3216 ,  G01N23/046 ,  G01N2223/419 ,  G06K2009/3225 ,  G06K2209/05 ,  G06T7/73 ,  G06T2207/30004

Abstract: A CT imaging method and apparatus in which an object is to be imaged by the CT apparatus using an X-ray or radiation, and a tomographic image of the object is obtained, wherein the object includes a reference portion. The processing the tomographic image is processed and a relative positional relation between a reference coordinate system of the object and a coordinate system of the CT apparatus is obtained. The object is imaged by the CT apparatus, and based on the relative positional relation, a tomographic image of a desired position of the object is obtained.

Abstract translation: 一种CT成像方法和装置，其中通过CT装置使用X射线或辐射对物体进行成像，并获得该物体的断层图像，其中该物体包括一参考部分。 处理断层图像，并且获得对象的参考坐标系和CT装置的坐标系之间的相对位置关系。 该物体由CT装置成像，并且基于相对位置关系，获得物体的期望位置的断层图像。